QUADRA-CHEK Metrology Software for 3D profiling

HEIDENHAIN announced the latest version of their PC-based QUADRA-CHEK Metrology software for inspection measurement machines.  This software makes it possible to conveniently perform 2-D and 3-D measuring tasks in the field of metrology when standard DRO products will not suffice.  Labeled the IK5000 version 2.96, this inspection package builds upon the original Metronics QUADRA-CHECK QC5000 software by introducing 3D Profiling capabilities that can provide measurement and graphic evaluation of 3-D contours using multi-sensor and tactile measuring machines.  This new option, used for profile measurements, is able to import a 3D CAD file (either STEP or IGES) and compare it with the actual measured part.

Part Programming improvements were added to support compensation for the thermal behavior of products that experience shrinkage or growth of material during the manufacturing process. This will allow users to write a single inspection program for measuring parts with materials having a known growth or shrink rate throughout the manufacturing process.

Improvements were also added to currently existing Radial and Palletize methods of automatic part programming routines.  These methods help users when there are common features or parts that repeat angularly, around a datum, or based on a palletized grid layout. On Video-based Inspection machines, these improvements will retain specific video tool sizes and the positions needed for these measurements, and then repeat them based on the angle they are located around the datum or in reference to a linear layout.  The new Palletize grid functions allow the user to graphically select which parts in the grid are required for measurement, and only run the program in those locations.

The IK5000 version 2.96.0 will now also offer compatibility for PCs using Windows 7 (32bit) operating systems as well as Windows XP and Vista.

HEIDENHAIN
www.heidenhain.us

OSRAM releases multi-junction LED for 80% more optical output

The IR Power Topled with lens (SFH 4258S/4259S) from OSRAM Opto Semiconductors has 80 percent higher optical output than the standard version of the infrared LED while retaining the same surface area and drive current. This increase in performance comes from a special thin-film chip which, as a result of Nanostack technology, has not one but two p-n junctions that are grown one on top of the other, similar to multi-junction photovoltaic solar cells. The resulting increased range will be of particular benefit to applications in the security segment and for gesture recognition.

More light from the same surface area will always be needed if space is tight, if a greater range is required or if light has to be distributed evenly over a greater area. This can often be achieved more flexibly with a large number of small LEDs than with a small number of large LEDs, and price also plays an important role here. The new IR Power Topled has the same package dimensions (footprint) as the standard version and can be used as a drop-in replacement so existing designs can continue to be used. Because of the series circuit, the voltage is higher by approximately a factor of 2.

The IR Power Topled produces an optical output power of 80 mW from an operating current of 70 mA – approximately 80 percent higher than the standard model using the same current. The new LED emits at a wavelength of 850 nm and is therefore a good compromise between maximum spectral sensitivity for CCD and CMOS cameras and suppressed visibility for the human eye. It is available with beam angles of +/-15° (SFH 4258S) and +/-25° (SFH 4259S) from two different lens types.

The new LED is particularly useful for infrared illumination, especially in security systems. In CCTV applications, the range can be increased significantly with the same number of LEDs. The main area of application in the consumer segment is camera-based gaming, as this is where high optical output has the greatest benefit.

According to Dr. Jörg Heerlein, Senior Marketing Manager for the industrial sector, “This powerful infrared Power To

pled is an excellent addition to the OSRAM portfolio of LEDs with nanostack technology chips. These high-output IR LEDs provide greater flexibility in designing individual customer solutions.” With its new infrared Power Topled with lens, OSRAM Opto Semiconductors has strengthened its leading position in the mid-range illumination segment.

You can find more technical information about the new IR Power Topleds in these online product catalogs: SFH 4258S and SFH 4259S.

The new IR Power Topled LEDs with Nanostack chip technology provide high optical output and open up new design options – particularly in the security sector.

OSRAM Opto Semiconductors
http://www.osram-os.com/

10-DoF MEMS IMU With Tactical Grade Performance in Severe Environments

Today Analog Devices, Inc. (ADI) released their third generation iSensor^® MEMS IMU (inertial measurement unit), the ADIS16488. It is a tactical grade 10-degree-of-freedom (DoF) sensor and integrates a tri-axis gyroscope, tri-axis accelerometer, tri-axis magnetometer and a pressure sensor into a single package. This new MEMS IMU provides the most stable and complete integrated sensor suite available, supporting mission critical requirements in high-performance navigation and stabilization applications.

Beyond the important tactical grade (below 10^o/hr) bias stability, the ADIS16488 outperforms all other contemporary gyro/IMU offerings on the often more critical specifications of g-effect, temperature coefficient, and bandwidth by up to 100X. Further, the new iSensor MEMS IMU even outperforms legacy military grade IMUs on vibration rectification and linearity. Every device undergoes unique and extensive factory calibration, resulting in unparalleled precision in the toughest environments and and greatly reduces complexity, time, cost, and design risk relative to typical motion sensor development.

“For industrial, military, and medical equipment designers who require the most accurate detection and control of motion in order to stabilize or navigate their applications, the ADIS16488 tactical grade IMU offers performance levels previously only available to those with unlimited budgets,” said Bob Scannell, iSensor business development manager, MEMS/Sensors Technology Group, Analog Devices. “With equal or better performance to legacy high-end IMUs on key measures such as bias stability and angular random walk, the ADIS16488 provides better performance on the often more critical parameters of vibration-rectification, linearity, and bandwidth while consuming one-quarter the power, and at one-tenth the cost.”

More About the ADIS16488 iSensor 10-DoF MEMS IMU

The ADIS16488 iSensor 10-DoF MEMS IMU is a complete inertial measurement system that combines ADI’s high performance iMEMS^®technology and sensor-signal processing expertise to optimize the IMU’s 10-DoF dynamic performance. Operation is fully autonomous, including all embedded compensations, with valid data available from the SPI interface 500 ms after applying power. With all calibration done at the factory, and with an ADI Blackfin^® processor-powered configurable interface for tuning embedded filtering and other diagnostics, a major source of design integration time and risk is virtually eliminated.

ADIS16488 iSensor 10-DoF MEMS IMU Key Specifications

• Gyro bias in-run stability: 6^o/hr
• Gyro dynamic range: 450°/s
• Gyro angular random walk: 0.3 deg/rt-hr
• Gyro noise : 0.005 ^o/sec/√Hz rms
• Non-linearity: 0.01 %
• Bias temperature coefficient: 0.0025^o/s/^oC
• Sensitivity temperature coefficient: 35 ppm/^oC
• Accelerometer in-run stability:100 micro-g
• Accelerometer dynamic range: ±18g
• X/Y/Z alignment accuracy: 0.05^o
• Bandwidth: 330Hz
• Magnetometer dynamic range +/- 3.5 gauss
• Barometer dynamic range 10 to 1200 mbar

Analog Devices, Inc.
http://www.analog.com/ADIS16488

Spectro Releases Handheld EDXRF Spectrometer xSORT

Spectro's high throughput handheld xSORT spectrometer.

SPECTRO Analytical Instruments, a leading supplier of analytical instruments for optical emission and XRF spectrometry, has introduced the next-generation SPECTRO xSORT handheld energy dispersive X-ray fluorescence (EDXRF) spectrometer. The new instrument comes in a smaller, lightweight package that offers better analytical performance, and incorporates many exclusive new features.

The new xSORT is designed for high-throughput elemental testing and spectrochemical analysis of a wide range of metals and other materials in the field. Its speed, accuracy and ease of use set new benchmarks for handheld spectrometric performance. SPECTRO xSORT is ideal for applications, including positive material identification (PMI) and environmental screening, recycling of alloys, precious metals, and aluminum, plus mining and compliance screening.

“Users were requesting more speed, higher accuracy and greater operating simplicity in the field,” notes Dirk Wissmann, Senior Product Manager. “For many jobs, such as material verification, our new instrument delivers highly reliable analyses in two seconds! And, for more complex matrices such as in environmental screening, xSORT achieves very low detection limits without the need for complex sample preparation.”

The new xSORT also is available with time and cost-saving features, such as an integrated video camera for precise spot testing and visual memory storage. Also available is an integrated global positioning system (GPS) that allows users to quickly return to previously checked locations without time-wasting resurveys.

Two-second Analysis
For metals and most alloys, xSORT delivers grade identification and material verification within two seconds of clicking its trigger. Pre-installed grade libraries cover common alloys used in industry and its exclusive high-resolution SDD detector provides signal throughput up to 10 times faster than other handheld spectrometers. Even light-metal alloys require only 12 seconds to process.

“High-volume users, such as service companies doing PMI, may use SPECTRO xSORT to complete hundreds of inspections per shift with greatly enhanced productivity and profitability,” adds Wissmann.

Exceptionally Low Detection Limits
The xSORT offers exceptionally low detection limits – down to the parts-per-million (ppm) range – for analyses of heavy metals. This allows the instrument to deliver accuracy that rivals laboratory analysis results. In addition, the system includes an optional docking unit for stationary operation, adding stability for very small samples along with extended analysis with ultra-low detection limits.

Lightweight, Compact Design
With SPECTRO xSORT, operators don’t need to switch methods between metals or use complicated flushes or vacuum systems. The instrument’s light weight (1.64 kg or 3.62 lb)  and compact, one-piece design make it optimal for easy use in the field, even in areas that are less accessible.

The instrument incorporates an exclusive SPECTRO ICAL system for convenient one-sample, one-time calibration. Its simplified software features an intuitive touchscreen interface with two menu levels.

SPECTRO Analytical Instruments, GmbH
www.spectro.com/xsort

Mitutoyo releases affordable 1.7 µm class CNC CMM

Mitutoyo America Corporation (www.mitutoyo.com) brings new levels of performance and economy to the 1.7 μm class of CNC Coordinate Measuring Machines (CMM) with the new CRYSTA-Apex®S CMM.

With a maximum error of MPEE = (1.7+3L/1000) μm, the new CMM more than doubles the effective measuring range at a given measurement tolerance as compared to typical CMMs in its class. Additionally, the CRYSTA-Apex®S drive features high-speed (max 519 mm/s) and high acceleration (max 2,309 mm/s2). These advances result in higher throughput for greater productivity and lower total owning and operating costs.

The CRYSTA-Apex®S uses the new UC-400® controller to manage digital servo system control loops for position, speed, and current. This makes it easy to implement various types of control algorithms. Additionally, the digital servo system has a wide dynamic range and is highly resistant to drift over time.

Extreme rigidity helps the CMM maintain accuracy. The Y-axis guide rail is integrated into one side of the granite surface plate. Precision air bearings located on the bottom, front, rear and upper surfaces of the X-axis slider minimize vibration and ensure stability even during high-speed, high-acceleration operation.

Accuracy is further enhanced by an advanced Temperature Compensation System. The System consists of a thermometer unit that measures the temperatures from thermal sensors located on the scale units of the CMM main unit and from a set of workpiece thermal sensors. The temperature data is transferred to the UC-400® machine controller for thermal compensation. For proper workpiece compensation, the thermal expansion coefficient of the workpiece material is entered by the user; since the material of scale units of the CMM is constant, this expansion coefficient is permanently stored in the temperature unit.

It also supports a wide range of probes that offer increased capabilities including the MPP-310Q scanning probe that collects cloud point data at speeds of up to 120 mm/s. Other probes suited for screw depth measurement, ultra-small diameter measurement and non-contact measurement are also supported.

Available software options enable this CMM to tackle a wide variety of measurement applications. Software packages include GEOPAK®, a high-functionality general-purpose measurement program which is at the heart of MCOSMOS® (Mitutoyo Controlled Open System for Modular Operation Support) software. MCOSMOS® supports virtually every CAD format while providing routines for in-line measurement, data feedback, and process management. Additional software supported includes: CAT1000S® for freeform surface evaluation; CAT1000P®, an offline teaching program; SCANPAK®, for contour measurement; and a range of programs supporting laser and vision probes.

CRYSTA-Apex®S provides USB communications for connectivity. Additionally, it supports MeasurLink STATMeasure Plus®, Mitutoyo’s proprietary statistical-processing and process-control program.

MeasurLink STATMeasure Plus® performs statistical analysis and provides real- time display of measurement results for SPC applications. The program can also be linked to a higher-level network environment for enterprise-wide functionality.

3-in-1 Sensor from OSRAM Combines IR LED to Detect Proximity and Ambient Light

SFH 7773 is a combined proximity and ambient light sensor with IR LED emitter in one package for unprecented design versatility and ease of use.

The new “3 in 1” SFH 7773 digital sensor from OSRAM Opto Semiconductors makes it easier than ever to install both proximity and ambient light sensing in smart phones and similar devices by combining the functions of a digital ambient light sensor and a digital proximity sensor in a single compact unit. It also simplifies the elimination of crosstalk by combining the emitter and detector chips together – 3 devices in all – eliminating the design requirements that are usually necessary to suppress crosstalk. Now designers no longer have to install a separate IR emitter to enable the proximity sensor function.

The SFH 7773 detects objects up to a distance of 15 cm (5.9 in.) while simultaneously measuring the intensity of the ambient light. Its black package, measuring only 5.3 x 2.5 x 1.2 mm, is barely noticeable behind the transparent covers of smart phones. Thanks to highly efficient OSRAM chip technologies, its power consumption is low – a maximum of 5 μA flows in stand-by mode, 300 μA in operational mode – making it ideally suited for portable devices.

For many designs, the SFH 7773’s combined proximity and ambient light sensor with IR LED emitter makes crosstalk suppression redundant.

Anti-Reflective Design

Proximity sensors detect objects by receiving the reflection of an emitted light signal. But the cover of a smart phone, e.g., also reflects light back to the sensor. This so-called crosstalk is usually intercepted by installing an optical barrier or placing the emitter at a sufficient distance from the cover to prevent the cover reflections from reaching the detector. However, both methods are rather complex and cumbersome. With the SFH 7773, designers do not have to worry about crosstalk because, inside the device, the emitter and the detector chip are located sufficiently far apart from each other and apertures are integrated into the package to prevent crosstalk or, at minimum, significantly reduce it.

User-definable sensitivity

Now, to a large extent, designers are free to select the integration time of the detector and, thus, the detection range of the proximity sensor via the I²C interface. That way, they can also adjust the ambient light sensor to the transparency of the smart phone cover. A variety of sensitivity levels is available, ranging from 3 to approximately 65.500 lux and 0.03 to 655 lux.

“This means that now, for the first time, our customers can optimize the device for their respective application – from the operating distance to the sensitivity of the ambient light sensor,” noted Bianka Schnabel, Product Marketing Manager for the SFH 7773 sensor. “Due to this considerably simplified design and flexibility of use, combined ambient light and proximity functions become more attractive for the mid-price segment of smart phones and other portable devices.”

For more information on the use of SFH 7773 and the topic of crosstalk, check out the application note.

OSRAM Opto Semiconductors GmbH
www.osram-os.com

Spectris to acquire Omega Engineering for $475 million

Spectris plc, the productivity-enhancing instrumentation and controls company, announces that it has signed an agreement to acquire the Omega Engineering business. Omega is a leading supplier of process measurement and control instrumentation across a broad range of categories, including automation, wireless, test and measurement, process control, power monitoring, environmental and lab equipment.

Founded in 1962, Omega has grown steadily and is now an established global leader in the technical marketplace. The company offers over 100,000 state-of-the-art solutions for measurement of temperature, pressure, flow, level, strain, humidity, pH and conductivity, as well as a comprehensive line of data acquisition, electric heating and custom engineered products.

“We are delighted to have reached agreement to acquire the Omega Engineering business, which will bring a significant strategic growth platform to Spectris,” said John O’Higgins, Chief Executive of Spectris. “Omega will continue to serve its customers with innovative products and outstanding service. With its focus on control of temperature, pressure, flow and other common industrial process measurements, Omega is a natural fit for our industrial controls segment and enables us to expand our product offering to customers globally.”

Spectris plc is a leading supplier of productivity-enhancing instrumentation and controls. The company’s products and technologies help customers to improve product quality and performance, improve core manufacturing processes, reduce downtime and wastage, and reduce time to market. Its global customer base spans a diverse range of end user markets.

Spectris operates across four business segments, which reflect the applications and industries it serves: Materials Analysis, Test and Measurement, In-line Instrumentation and Industrial Controls. Headquartered in Egham, Surrey, England, the company employs over 6,400 people, with offices in more than 30 countries.

Spectris plc.
www.spectris.com

Omega Engineering
www.omega.com

OMEGA Introduces Temperature Chart Recorder CT89

Omega CT89 Chart Recorder

Omega’s new series of Temperature Chart Recorders has an advanced microcontroller design that enables this instrument to accurately measure and record temperatures in air, gas, liquids, powders, solids and semi-solids using the stainless steel remote reading 102 mm (4″) probe with 4.6 m (15′) cable. The CT89 series features a large LED digital temperature display, 3 temperature ranges and 4 chart speeds, a battery back-up that assures normal operation during power interruptions, a durable polycarbonate case, cover and handle as well as the ability to be freestanding or wall mounted. Applications include food storage, HVAC, general laboratory and computer room monitoring.

Price starts at $345.

OMEGA Engineering, Inc.
www.omega.com

PCB Piezotronics Announces New Test and Measurement Catalog

High-Speed ‘Scope Measures Spin Torque in Memory Devices

Submitted by: Cornell University Press Office

Edited by: John R. Gyorki, Editor in Chief

Putting a spin on it: Physicists measure current-induced torque in nonvolatile magnetic memory devices.

Tomorrow’s nonvolatile computer memory devices that retain stored information even when not powered will profoundly change electronics. Cornell University researchers have discovered a new way of measuring and optimizing their performance.

Using a high-speed oscilloscope, researchers led by Dan Ralph, the Horace Wright Professor of Physics and Robert Buhrman, the J. E. Sweet Professor of Applied and Engineering Physics, have discovered a way to measure the magnitude of the current-induced torque that writes information in magnetic tunnel junction memories.

Magnetic tunnel junctions comprise a sandwich of two ferromagnets with an oxide insulator–measured in nanometers–between them. The electrical resistance for parallel orientations is different than that for random orientations of the magnetic electrodes. This allows the two states to create a nonvolatile memory that does not require electricity for storing information.

An example of nonvolatile memory is flash memory, but this type is a silicon device that can lose its capability to store information after repeated writing cycles. By comparison, magnetic memory does not have this limitation.

The geometry of a magnetic tunnel junction.

The intrinsic fact that magnetic fields are required to switch the magnetic states–that is, write the information–has hampered magnetic-memory development. The magnetic fields themselves limit the magnetic memory size and efficiency because the fields occupy some surrounding space and are relatively weak. By comparison to solid-state devices, magnetic devices need larger currents to generate sufficient field strength to switch the device.

The Cornell researchers are studying a new generation of magnetic devices that can write information without using magnetic fields. Instead, they use a mechanism called “spin torque,” which arises from the idea that electrons have a fundamental spin. When the electrons interact with the magnets in the tunnel junctions, they transfer some of their angular momentum. This can provide an extremely strong torque per unit of current and has been demonstrated to be at least 500 times more efficient than magnetic fields to write magnetic information.

To measure these spin torques, the researchers used an oscilloscope in a facility operated by Cornell’s Center for Nanoscale Systems. They applied torque to the magnetic tunnel junctions using an alternating current and measured the amplitude of the resulting oscillations that were generated by the varying resistance. Because the resistance depends on the relative orientation of the two magnets in the tunnel junction, the amplitude of the oscillations could be related directly to the amplitude of the magnetic motion, and hence, the magnitude of the torque.

The researchers hope such experiments will help industry make better nonvolatile memory devices by understanding exactly how to structure them, and select the best materials for the oxide insulators and the ferromagnets surrounding them.

The work was supported by the National Science Foundation, the Army Research Office, and the Office of Naval Research. It also included collaborators Chen Wang, graduate student and first author; graduate student Yong-Tao Cui; and Jordan A. Katine from Hitachi Global Storage Technologies.

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