Spectro Releases Handheld EDXRF Spectrometer xSORT

SPECTRO Analytical Instruments, a leading supplier of analytical instruments for optical emission and XRF spectrometry, has introduced the next-generation SPECTRO xSORT handheld energy dispersive X-ray fluorescence (EDXRF) spectrometer. The new instrument comes in a smaller, lightweight package that offers better analytical performance, and incorporates many exclusive new features.

The new xSORT is designed for high-throughput elemental testing and spectrochemical analysis of a wide range of metals and other materials in the field. Its speed, accuracy and ease of use set new benchmarks for handheld spectrometric performance. SPECTRO xSORT is ideal for applications, including positive material identification (PMI) and environmental screening, recycling of alloys, precious metals, and aluminum, plus mining and compliance screening.

“Users were requesting more speed, higher accuracy and greater operating simplicity in the field,” notes Dirk Wissmann, Senior Product Manager. “For many jobs, such as material verification, our new instrument delivers highly reliable analyses in two seconds! And, for more complex matrices such as in environmental screening, xSORT achieves very low detection limits without the need for complex sample preparation.”

The new xSORT also is available with time and cost-saving features, such as an integrated video camera for precise spot testing and visual memory storage. Also available is an integrated global positioning system (GPS) that allows users to quickly return to previously checked locations without time-wasting resurveys.

Two-second Analysis
For metals and most alloys, xSORT delivers grade identification and material verification within two seconds of clicking its trigger. Pre-installed grade libraries cover common alloys used in industry and its exclusive high-resolution SDD detector provides signal throughput up to 10 times faster than other handheld spectrometers. Even light-metal alloys require only 12 seconds to process.

“High-volume users, such as service companies doing PMI, may use SPECTRO xSORT to complete hundreds of inspections per shift with greatly enhanced productivity and profitability,” adds Wissmann.

Exceptionally Low Detection Limits
The xSORT offers exceptionally low detection limits – down to the parts-per-million (ppm) range – for analyses of heavy metals. This allows the instrument to deliver accuracy that rivals laboratory analysis results. In addition, the system includes an optional docking unit for stationary operation, adding stability for very small samples along with extended analysis with ultra-low detection limits.

Lightweight, Compact Design
With SPECTRO xSORT, operators don’t need to switch methods between metals or use complicated flushes or vacuum systems. The instrument’s light weight (1.64 kg or 3.62 lb)  and compact, one-piece design make it optimal for easy use in the field, even in areas that are less accessible.

The instrument incorporates an exclusive SPECTRO ICAL system for convenient one-sample, one-time calibration. Its simplified software features an intuitive touchscreen interface with two menu levels.

 

SPECTRO Analytical Instruments, GmbH
www.spectro.com/xsort

Mitutoyo releases affordable 1.7 µm class CNC CMM

Mitutoyo America Corporation (www.mitutoyo.com) brings new levels of performance and economy to the 1.7 μm class of CNC Coordinate Measuring Machines (CMM) with the new CRYSTA-Apex®S CMM.

With a maximum error of MPEE = (1.7+3L/1000) μm, the new CMM more than doubles the effective measuring range at a given measurement tolerance as compared to typical CMMs in its class. Additionally, the CRYSTA-Apex®S drive features high-speed (max 519 mm/s) and high acceleration (max 2,309 mm/s2). These advances result in higher throughput for greater productivity and lower total owning and operating costs.

The CRYSTA-Apex®S uses the new UC-400® controller to manage digital servo system control loops for position, speed, and current. This makes it easy to implement various types of control algorithms. Additionally, the digital servo system has a wide dynamic range and is highly resistant to drift over time.

Extreme rigidity helps the CMM maintain accuracy. The Y-axis guide rail is integrated into one side of the granite surface plate. Precision air bearings located on the bottom, front, rear and upper surfaces of the X-axis slider minimize vibration and ensure stability even during high-speed, high-acceleration operation.

Accuracy is further enhanced by an advanced Temperature Compensation System. The System consists of a thermometer unit that measures the temperatures from thermal sensors located on the scale units of the CMM main unit and from a set of workpiece thermal sensors. The temperature data is transferred to the UC-400® machine controller for thermal compensation. For proper workpiece compensation, the thermal expansion coefficient of the workpiece material is entered by the user; since the material of scale units of the CMM is constant, this expansion coefficient is permanently stored in the temperature unit.

It also supports a wide range of probes that offer increased capabilities including the MPP-310Q scanning probe that collects cloud point data at speeds of up to 120 mm/s. Other probes suited for screw depth measurement, ultra-small diameter measurement and non-contact measurement are also supported.

Available software options enable this CMM to tackle a wide variety of measurement applications. Software packages include GEOPAK®, a high-functionality general-purpose measurement program which is at the heart of MCOSMOS® (Mitutoyo Controlled Open System for Modular Operation Support) software. MCOSMOS® supports virtually every CAD format while providing routines for in-line measurement, data feedback, and process management. Additional software supported includes: CAT1000S® for freeform surface evaluation; CAT1000P®, an offline teaching program; SCANPAK®, for contour measurement; and a range of programs supporting laser and vision probes.

CRYSTA-Apex®S provides USB communications for connectivity. Additionally, it supports MeasurLink STATMeasure Plus®, Mitutoyo’s proprietary statistical-processing and process-control program.

MeasurLink STATMeasure Plus® performs statistical analysis and provides real- time display of measurement results for SPC applications. The program can also be linked to a higher-level network environment for enterprise-wide functionality.

3-in-1 Sensor from OSRAM Combines IR LED to Detect Proximity and Ambient Light

The new “3 in 1” SFH 7773 digital sensor from OSRAM Opto Semiconductors makes it easier than ever to install both proximity and ambient light sensing in smart phones and similar devices by combining the functions of a digital ambient light sensor and a digital proximity sensor in a single compact unit. It also simplifies the elimination of crosstalk by combining the emitter and detector chips together – 3 devices in all – eliminating the design requirements that are usually necessary to suppress crosstalk. Now designers no longer have to install a separate IR emitter to enable the proximity sensor function.

The SFH 7773 detects objects up to a distance of 15 cm (5.9 in.) while simultaneously measuring the intensity of the ambient light. Its black package, measuring only 5.3 x 2.5 x 1.2 mm, is barely noticeable behind the transparent covers of smart phones. Thanks to highly efficient OSRAM chip technologies, its power consumption is low – a maximum of 5 μA flows in stand-by mode, 300 μA in operational mode – making it ideally suited for portable devices.

 

Anti-Reflective Design

Proximity sensors detect objects by receiving the reflection of an emitted light signal. But the cover of a smart phone, e.g., also reflects light back to the sensor. This so-called crosstalk is usually intercepted by installing an optical barrier or placing the emitter at a sufficient distance from the cover to prevent the cover reflections from reaching the detector. However, both methods are rather complex and cumbersome. With the SFH 7773, designers do not have to worry about crosstalk because, inside the device, the emitter and the detector chip are located sufficiently far apart from each other and apertures are integrated into the package to prevent crosstalk or, at minimum, significantly reduce it.

User-definable sensitivity

Now, to a large extent, designers are free to select the integration time of the detector and, thus, the detection range of the proximity sensor via the I²C interface. That way, they can also adjust the ambient light sensor to the transparency of the smart phone cover. A variety of sensitivity levels is available, ranging from 3 to approximately 65.500 lux and 0.03 to 655 lux.

“This means that now, for the first time, our customers can optimize the device for their respective application – from the operating distance to the sensitivity of the ambient light sensor,” noted Bianka Schnabel, Product Marketing Manager for the SFH 7773 sensor. “Due to this considerably simplified design and flexibility of use, combined ambient light and proximity functions become more attractive for the mid-price segment of smart phones and other portable devices.”

For more information on the use of SFH 7773 and the topic of crosstalk, check out the application note.

OSRAM Opto Semiconductors GmbH
www.osram-os.com

3D Phase Measurement Eliminates Need To Change Tip

The 3D Phase Measurement is a measurement technique that provides 3 dimensional imaging to increase accuracy and productivity in aerospace and rotating equipment applications. Paired with the XLG3 Video Borescope, this technology provides accurate 3 dimensional surface scans using a single probe tip. In effect, the 3D Phase Measurement provides accurate measurement “on-demand” by eliminating the need to change the probe tip to capture the measurement, streamlining the inspection process.

Prior to 3D Phase Measurement, videoprobe measurement was based on stereo or shadow techniques, which are complex techniques, and the tip of the probe had to be changed from a viewing tip to a measurement tip, adding time to the inspection process. 3D Phase Measurement offers Profile Views, a cross section view of a portion of the surface. With Profile View, the inspector can rotate and zoom to get a more accurate view of the defect. The ability to better visualize the shape and characteristics of an indication allows for well-informed decision of serviceability of the asset.

Scanner System Integrates Multiple Point Measurement Data

BinMaster® Level Controls introduced the MVL multiple scanner system that integrates multiple point measurement data from two 3DLevelScanners to cover a very wide surface area and provide better inventory accuracy for large vessels than any other level measurement device. Designed specifically for the challenges of very large bins, the BinMaster MVL system displays a visual representation of the material surface that shows high and low points in the bin such as cone up, cone down, sidewall buildup or bridging. Reports generated by the 3D software provide data such as volume as a percentage, in bushels, or cubic feet or meters; maximum, minimum and average levels or distances to product; weight in US tons, pounds or metric tons; and historical logs of bin measurements.

An MVL system consists of two model MVL 3DLevelScanners, a controller that aggregates the data, 3D Vision software to be loaded onto a PC, and a 3DLinkPro modem for remote access to the scanners. The BinMaster MVL system works by integrating the measurement data from two scanners mounted on the top of the vessel in locations optimized to most effectively cover the entire surface area of the material. Generally, one scanner is mounted near the center and the other eight to ten feet from the outer perimeter. The scanners take multiple measurements of the material surface using dust-penetrating, acoustic-based technology. A controller then combines the data from the two scanners and generates a single merged visual representation of the topography of the material and displays the image on a PC loaded with the 3D Vision software that can be viewed as real-time 3D images or historic 3D image movies.

www.binmaster.com

Wireless Air Quality Measurement Tool Uses Infrared For Accuracy

The Eltek GD47 is a self contained transmitter for air quality measurements. It collects temperature, humidity and CO2 measurements and sends them wirelessly to a receiver for storage, display and alarming. The GD47 has an LCD to provide local real-time display of measured values. It uses a self calibration NDIR (infrared) sensor for accurate CO2 measurements in the range of 0-5000 ppm. The GD47 is powered by an external 12V supply with an internal NiMH back-up battery that can provide up to 100 hours of operation. The GD47 is one of more than two dozen models of transmitters with versions for temperature, humidity, voltage, current, state/pulse, light and air pressure.

Measured data is transmitted via a proprietary wireless link to one of several receivers:

o RX250AL – Wireless receiver with local storage for up to 250,000 readings and alarm output

o RC250 – Wireless receiver with serial data output for connection to a computer

o WSR – Wireless receiver with analog output

Depending on the transmitter frequency and environment, the typical wireless range can be several hundred feet to almost a mile. Repeaters are available to extend the range.

www.dataloggerinc.com

Surface Topography Sensor Ideal for Paper & Board Grades

Honeywell introduced Precision FotoSurf, the newest member of the Honeywell scanning camera measurement family for paper making. Launched at the PulPaper 2010 exhibition, Precision FotoSurf is a surface topography sensor that helps paper and board makers improve product quality while reducing waste and lowering production costs. The sensor is ideal for manufacturing all printing paper and board grades, where product surface characteristics are important, minimizing the need for manual monitoring by mill personnel. Precision FotoSurf’s camera and powerful illumination technology automatically adjusts to varying machine speeds and sheet surface characteristics to capture high-quality sheet surface images.

This automated approach helps reduce variations in web smoothness/roughness profiles which can cause a range of imperfections in paper and board products – and in turn cause printability problems. The sensor allows mill personnel to electronically monitor web surface characteristics throughout the entire production process, facilitating immediate corrective action if a product deviates from standards. This increases the yield as less paper/board is rejected, and it also increases paper makers’ customer satisfaction as they experience fewer problems with printability.

Precision FotoSurf saves paper and board makers time and money, and boosts their competitiveness. The solution maximizes productivity by reducing the need for laboratory analysis of smoothness/roughness profiles, minimizes time needed for corrective action when flaws are detected, and ultimately results in higher-quality products with less waste.

Supporting speeds up to 2,000 m/min., Precision FotoSurf uses a built-in image control unit to manage both camera and illumination parameters. In addition to providing numeric values for surface smoothness and roughness, the sensor displays images of the product surface to determine the root cause of the problem so that corrective action can be taken.

Features & Benefits

The sensor measures the following paper surface characteristics:

• PPS Smoothness
• Bendtsen Roughness
• Sensor optics and illumination automatically adjust to different machine speeds for the best image quality.
• Standard inboard sensor design allows installation in any free slot inside the sensor carriage.
• There are no moving parts in the sensor, which minimizes maintenance needs and ensures a long lifetime.
• Trending and profiling capability is available for all measured variables.
• The latest captured images are available for operator observation.
• Up to four images per scan can be transferred to Da Vinci from predefined profile locations for operator observation.
• Image Gallery display shows 8 images each representing reel average surface characteristic. These are displayed around grade dependent reference image.
• In single point operation, images are transferred periodically at a fixed rate for operator observation.
• Sample feature allows the measurement of sheet samples. This information can be used for analysis of returned product, process diagnostics, etc.

Honeywell
www.honeywell.com

Distinct, New Laser Alignment Kit for Industry

Pinpoint Laser Systems^Ò is introducing the Pinpoint Proline Alignment Kit, – a visual laser system for checking and measuring straightness, flatness, squareness, parallelism, leveling and others.  This kit combines the features of a transit, an infinitely long straightedge and laser alignment system all in a compact, portable, versatile product.

The Proline Laser produces a collimated laser reference beam that forms a bulls-eye pattern for visual alignment and measuring.  This innovative laser is enclosed within a precision machined housing, ensuring that the laser reference beam is parallel to the side and base surfaces within 0.003 degree, or <0.030 inch at 50 feet.  This level of accuracy is for setting straight machinery runs, aligning production equipment, transferring mechanical points, locating shafts, bearing mounts, aligning belts and pulleys and other industrial tasks.

A finely ruled target and magnetic base are easily moved around for checking alignments, allowing one person to perform the work of several.  The kit includes a leveling base so the laser can measure flat planes and machined surfaces.  A 90 degree laser prism is for squaring machinery and checking the parallelism of rails, tracks and guides.

The Proline Laser and all its accessories are machined from solid aluminum with stainless steel parts and protected by a hard anodized coating for years.

Z-Laser Announces Advanced Lasers For Vision & Measurment

Lasers are used as structured light source in lots of imaging systems. This form of light source 3-dimensional contours of moving and static objects can be recorded. Depending on the object under test, micro and macro lines or various patterns (multi lines, dot matrices, crosses, circles, etc.) are used.

At VISION 2009, Z-Laser presented the new ZM18 product family – Advanced lasers for the vision, measurement, scientific, medical, and alignment industries.

The lasers are available with wavelengths of red, green, blue, and IR with output powers up to 200 mW.

With these new lasers, the user no longer has to settle for a particular operating voltage as they feature 5-30 VDC operation, with voltage, spike, and reverse polarity protection. At any voltage within this range, the lasers can be modulated both analog and digitally simultaneously, at frequencies of up to 20 MHz. This allows the laser intensity to be varied while also enabling the laser to be synchronized with a camera or other equipment. Furthermore, the sophisticated electronics feature a built-in micro controller and serial interface facilitating the logging of temperature, operating hours, etc.

The laser provides with a simple, external hand focusing mechanism and the thread-mounted barrel enables an easy and versatile mounting. Furthermore, the laser provides an LED laser operation and pre-failure indicator ensuring you are aware the laser is in operation and replacement lasers can be installed prior to the machinery equipment failing. Rated at IP67, the laser is fully waterproof.

www.z-laser.com

Optical PV Cell Testing System Provides Non-Destructive Analysis

CRAIC Technologies released the 20/20(TM) UV-visible-NIR microspectrophotometer.  20/20(TM) microspectrophotometer is designed to non-destructively analyze many types of microscopic samples from the deep ultraviolet to the near infrared. Analysis of samples can be done by absorbance, reflectance, luminescence and fluorescence with unparalleled speed and accuracy. The system can also be configured to image microscopic samples in the UV and NIR regions in addition to color imaging.

Applications are numerous and include forensic analysis of trace evidence, vitrinite reflectance of coal and spectral analysis of minerals, measurement of protein crystals, contamination analysis and thin film measurement of semiconductors, hard disks and flat panel displays.

The 20/20(TM) microspectrophotometer integrates an advanced spectrophotometer with a sophisticated UV-visible-NIR range microscope and powerful, easy-to-use software. This flexible instrument is designed to acquire data from microscopic samples by absorbance, reflectance or even luminescence spectroscopy. By including high-resolution digital imaging, the user is also able to use the instrument as a ultraviolet or infrared microscope. Touch screen controls, sophisticated software, calibrated variable apertures and other innovations all point to a new level of sophistication for microanalysis.

www.microspectra.com

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