New Solution Center from Mitutoyo to Open in Alabama
May 2, 2012 by Test and Measurement Editor
Filed under Meters & Testers, New Articles, Sensing, Test Equipment
Mitutoyo America Corporation announces the opening of the first M3 Solution Center in the south central United States region, located in Birmingham, Alabama. This new, 4,800 sq. ft. showroom is conveniently located so customers can schedule appointments for product demonstrations and assistance with metrology solutions and application challenges.
“Our goal is to provide timely metrology solutions to our customers, in a region that is home to a booming automotive industry. The benefit of opening this new M3 Solution Center was the accessibility in offering an experienced metrology specialist to our customers that could provide up to date and knowledgeable metrology information for any situation they may encounter”, says Mike Dukehart, Regional Sales Manager, South Central region.
The grand opening celebration will be held on Tuesday, May 22 and Wednesday, May 23, 2012 at 2100 Riverchase Center, Suite 106, Birmingham, AL. The festivities for the two day event will include facility tours, refreshments, raffles and live demonstrations from 9:00 am – 4:00 pm. If interested in attending the event. RSVP to randy.stephenson@mitutoyo.com.
Mitutoyo Corporation
www.mitutoyo.com
Innovative Multisensor Vision Technology Features PC-DMIS CAD Software
April 30, 2012 by Natasha Townsend
Filed under New Articles, Optical, Sensing
The Optiv® Classic 321GL tp, is a benchtop vision measuring machine featuring 6.5x motorized CNC zoom optics that contribute to levels of accuracy approaching 2μ. Each unit is pre-configured to add a touch-probe for multi-sensor measurement. The Classic 321GL tp is ideal for the inspection of complex, densely populated features, such as medical, electronic or other precision parts including micro-hole dies, sieves, filters, fiber optics and inkjet nozzles. It is the smallest model in the Optiv product line.
Highlights of this innovative vision technology include calibrated lighting, a high resolution color CCD camera, a laser locator and an 8 segment LED dual angle ring light to create better contrast for edge detection. The system also delivers software controls for RGB (Red/Green/Blue) sensitivity allowing for adjustment over contrast, improving overall consistency and precision for colored parts where edges can be difficult to capture with only grayscale or lighting modifications.
The Classic 321GL tp comes standard with PC-DMIS® Vision image processing software and full online 3D CAD capabilities for live programming of the machine to compare measured values to nominals. The software includes the groundbreaking MultiCapture feature that finds all 2D characteristics in the field of view, regardless of their type, and measures them simultaneously. MultiCapture then moves the camera to the next cluster of features and measures them. This sequence continues until the inspection program is complete, and is automatically optimized by creating the most efficient path with the fewest number of stage movements. Inspection speeds increase by 50% or more, depending on feature size and density, which can significantly raise throughput.
Hexagon Metrology
New Line of Balluff’s Control and Sensor Products
April 17, 2012 by Natasha Townsend
Filed under Controls, Sensing
GlobalPower, an expansion of Global line of products, adds another piece to Balluff’s control and sensors products. GlobalProx (inductive sensors), Global.CProx (capacitive sensors), GlobalEye (photoelectric sensors) and GlobalCables (common M8 & M12 sensor cables). The product line includes 24 VDC power supplies offering an economically priced general-purpose sensors and accessories for industrial automation.
The supplies are specifically designed to meet the needs of automation control suites that industrial systems use. The eleven-model line includes a wide range of 24 V dc models with single and three phase inputs. With efficiencies up to 92%, and output current ranges from 0.75 A (18 W) to 40 A (960 W), there is a GlobalPower supply for most applications. Offering reliable power – power that is clean, spike-free, and controlled to provide the amount of voltage and amperage required by the system, mean time between failure for all units is over 210,000 hrs/24 yrs while operating at published specifications.
Features of the supplies are: Built-in advanced overload and over-voltage protection; load regulation to +/- 1%; ripple/noise less than 50 mV; adjustable voltage outputs; and, all models are din rail mountable.
Balluff
Latest Generation of Spectrotest Metal Analyzers Introduced
March 22, 2012 by Test and Measurement Editor
Filed under New Articles, Sensing, Spectroscopy
SPECTRO Analytical Instruments has introduced the latest generation of SPECTROTEST mobile metal analyzers. In addition to the instrument’s excellent analytical performance, the SPECTROTEST offers an ergonomic design and user friendly operation. In addition, the latest generation is equipped with an efficient plasma generator and a newly designed UV probe, and its field-proven ICAL (Intelligent Calibration Logic) logic system monitors the correct state of the measuring system independently from external influences, eliminating the need for time-consuming recalibration of the spectrometer. Instead, a single control sample is measured.
Suited to Spark and Arc Operation
In addition to improvements to the plasma generator, SPECTRO’s engineers have designed a new pluggable probe with integrated UV optic for special measurement applications. For the first time this probe can be used for both spark and arc excitation. Changing of the probes is no longer necessary.
By incorporating a lightweight and robust transport trolley, SPECTRO’s design engineers were able to cut the instrument’s weight in half. The instrument’s new design affords the operator a more fatigue-free and comfortable on site experience. This latest generation metal analyzer additionally features a large 15-inch display that allows measurement results to be easily read, even from relatively long distances.
Ease of use is further supported by new instrument software that even inexperienced users can quickly grasp. The software only shows the user the context-dependent functions required for the current operation. A factory-installed materials library can be optionally extended with the SPECTRO Metal Database, in which nearly all standardized grades of metal in the world have been compiled.
Material Identification as a Standard Application
Among its many applications, the SPECTROTEST metals analyzer is especially suited for the identification of low-alloy steels using the carbon content in the rapid arc excitation mode. Possible applications in the spark excitation mode include the analysis of carbon, phosphorous, and sulfur as well as the identification of duplex steels using the nitrogen content.
The identification of metal materials is a standard component of quality control in the metal producing, processing, and recycling industries. Whether its onsite for incoming materials or used during production or transport, a mobile metal analyzer helps prevent material mix ups from occurring and proves valuable during the sorting and classifying of recycling of metals.
Spectro Analytical Instruments
www.spectro.com
Expanded Bandwidth Options on Arbitrary Waveform Generator
February 27, 2012 by Test and Measurement Editor
Filed under Instrumentation, New Articles
Agilent Technologies Inc. (NYSE: A) announced enhancements to its industry-leading, high-resolution, wide-bandwidth M8190A arbitrary waveform generator. The enhancements allow engineers to create signal scenarios using the 5- to 7-GHz spectrum.
The Agilent M8190A is a source of high fidelity because it simultaneously delivers wide bandwidth and high resolution with up to 80 dBc of spurious-free dynamic range. This unique combination lets engineers create signal scenarios that push their designs to the limit and bring new insights to their analyses.
An AWG is the most versatile signal scenario generator possible. Capabilities such as easy switching between 14-bit output at 8 GSa/s and 12-bit output at 12 GSa/s help engineers handle multiple applications and measurement requirements.
The device contains three amplifiers that are optimized for different applications. The latest enhancements take the instrument’s versatility one step further with support for various output formats, including NRZ (no return to zero), DNRZ (double no return to zero), RZ (return to zero) and doublet mode.
Engineers working on applications that require the highest spurious-free dynamic range can use the DNRZ format. For time-domain applications requiring the best pulse performance, engineers can use the NRZ format. If they need a higher frequency spectrum, they can switch into doublet mode, which allows them to use the 5- to 7-GHz spectrum. Engineers working on RF applications can select between the desired frequency spectrums.
Agilent Technologies Inc.
www.agilent.com
Saelig Debuts Unique Circuit Track Current Probe
February 27, 2012 by Test and Measurement Editor
Filed under Instrumentation, New Articles, Sensing
Saelig Company, Inc. announces the Aim-TTi I-Prober 520, a unique, compact hand-held current probe for use with any oscilloscope, unlike any other current measurement device available. The current flowing in a pcb track can be observed and measured, allowing measurements by merely placing the insulated tip of the probe on to the track.
Calibrated measurement of current flow normally requires current to be passed through a closed magnetic loop using some form of split clamp device. While this is suitable for individual wires, it is of no use for measuring current in pcb tracks. Conventionally, current can only be measured by either breaking the circuit to insert a shunt resistor. However, breaking the circuit is impractical in many circumstances, and, in the case of pcb tracks, may be impractical.
I-prober 520 can uniquely observe and measure currents flowing in pcb tracks and other conductors where conventional current probes cannot be used; this includes captive wires, components, integrated circuit pins, and pcb ground planes. It does not require breaking or surrounding the conductor, and is even usable on high voltage conductors and in high temperature areas.
The device is a high-accuracy general purpose H-field probe based on the well-established fluxgate magnetometer principle, and, for the first time, allows track currents to be measured over a wide dynamic range: from 10mA to 20A (pk-pk), with a bandwidth of d.c. to 5MHz. I-Prober 520 contains a special, custom-made miniaturized precision sensor to form a practical current measurement probe. The high-excitation-frequency sensor within the probe provides levels of positional accuracy, sensitivity, bandwidth, and dynamic range previously unavailable. To achieve a calibrated measurement, the field sensor maintains a precise distance from the track; to achieve good sensitivity, this distance is very small, since field strength reduces with the square of distance. I-Prober 520 has a low noise equivalent of <6mA rms at full bandwidth, and presents minimal disturbance to circuit conditions due to its very low insertion impedance and stray capacitance.
Saelig Company, Inc.
www.saelig.com
Leak Detector Designed for Optimum Flexibilty
February 8, 2012 by Test and Measurement Editor
Filed under Machine Vision/Inspection, Sensing, Test Equipment
Design engineers seeking leak detection equipment that can be custom configured to their unique test application requirements without added costs can now obtain a competitively priced and first-of-a-kind leak and flow tester from Uson — Uson Optima vT Leak and Flow Tester. Optima vT includes one or two test channels with four sensors each, customizable pneumatics, multiple built-in automated calculators, and myriad data handling and storage options.
R&D for the multi-function tester began in 2009 and incorporates Uson’s vast knowledgebase of the wide ranging requirements for leak detection and flow testing in medical, automotive, and other industrial parts testing.
Key features of the Optima vT Leak and Flow Tester include:
- Capabilities for vacuum decay tests, pressure decay leak testing, differential pressure decay leak tests, mass flow leak detection (including back pressure and differential), upstream and downstream cracking pressure, pressure rise tests, burst tests, laminar flow tests, force decay testing, and occlusion testing
- 2 channels with up to 4 sensors/channel, totaling up to 8 sensor inputs
- Simultaneous testing on all sensor inputs
- Built-in automated calculators to speed testing and data handling
- Fully customizable pneumatic controls
- Large easy-to-read full color touch screen display with intuitive user interface
Uson
www.uson.com

Brinell Optical Scanners offer USB Connectivity
February 8, 2012 by Test and Measurement Editor
Filed under Machine Vision/Inspection, Optical, Sensing
All B.O.S.S.® (Brinell Optical Scanning System) units from Newage Testing Instruments now feature USB connectivity as standard. This addition allows the field-proven B.O.S.S. to be used with any PC at zero-cost to system accuracy or durability.
The B.O.S.S. represents the most significant technological improvement to Brinell testing since the test was first introduced. The system measures Brinell impressions in seconds and yields a measurement resolution of 0.01mm. The system even takes into account such anomalies as impression roundness and overall surface finish.
Among the standard features of the B.O.S.S. system is a high-resolution video scanning head with video imaging software that operates in a Windows® environment. The software and scanning head can be added to an existing computer or provided as a complete “turn-key” system using a computer with optional printer and mobile protective cabinet.
The powerful PC-based B.O.S.S. features Windows®-based software, statistical and reporting functions, data storage and transfer, and an assortment of advanced options. These options include real-time advanced SPC, the ability to save a viewed image, and a manual measurement function that allows the B.O.S.S. to be used to measure other visually discernable aspects such as etched case depth layers.
The new OS-100X-HD option for the B.O.S.S. adds the ability to accurately measure light-load Brinell impressions made with test loads ranging from 62.5 Kgf to 187.5 Kgf and tungsten carbide ball indenters from 2.5mm and 5.0mm in diameter. Both the standard and HD versions include an impression measurement scan head with built-in light source, imaging microchip and a reduced footprint with free stand adapter (where applicable).
Newage Testing Instruments
www.hardnesstesters.com
QUADRA-CHEK Metrology Software for 3D profiling
January 10, 2012 by Test and Measurement Editor
Filed under Calibration, Coordinate Measuring Machine
HEIDENHAIN announced the latest version of their PC-based QUADRA-CHEK Metrology software for inspection measurement machines. This software makes it possible to conveniently perform 2-D and 3-D measuring tasks in the field of metrology when standard DRO products will not suffice. Labeled the IK5000 version 2.96, this inspection package builds upon the original Metronics QUADRA-CHECK QC5000 software by introducing 3D Profiling capabilities that can provide measurement and graphic evaluation of 3-D contours using multi-sensor and tactile measuring machines. This new option, used for profile measurements, is able to import a 3D CAD file (either STEP or IGES) and compare it with the actual measured part.
Part Programming improvements were added to support compensation for the thermal behavior of products that experience shrinkage or growth of material during the manufacturing process. This will allow users to write a single inspection program for measuring parts with materials having a known growth or shrink rate throughout the manufacturing process.
Improvements were also added to currently existing Radial and Palletize methods of automatic part programming routines. These methods help users when there are common features or parts that repeat angularly, around a datum, or based on a palletized grid layout. On Video-based Inspection machines, these improvements will retain specific video tool sizes and the positions needed for these measurements, and then repeat them based on the angle they are located around the datum or in reference to a linear layout. The new Palletize grid functions allow the user to graphically select which parts in the grid are required for measurement, and only run the program in those locations.
The IK5000 version 2.96.0 will now also offer compatibility for PCs using Windows 7 (32bit) operating systems as well as Windows XP and Vista.
HEIDENHAIN
www.heidenhain.us
OSRAM releases multi-junction LED for 80% more optical output
The IR Power Topled with lens (SFH 4258S/4259S) from OSRAM Opto Semiconductors has 80 percent higher optical output than the standard version of the infrared LED while retaining the same surface area and drive current. This increase in performance comes from a special thin-film chip which, as a result of Nanostack technology, has not one but two p-n junctions that are grown one on top of the other, similar to multi-junction photovoltaic solar cells. The resulting increased range will be of particular benefit to applications in the security segment and for gesture recognition.
More light from the same surface area will always be needed if space is tight, if a greater range is required or if light has to be distributed evenly over a greater area. This can often be achieved more flexibly with a large number of small LEDs than with a small number of large LEDs, and price also plays an important role here. The new IR Power Topled has the same package dimensions (footprint) as the standard version and can be used as a drop-in replacement so existing designs can continue to be used. Because of the series circuit, the voltage is higher by approximately a factor of 2.
The IR Power Topled produces an optical output power of 80 mW from an operating current of 70 mA – approximately 80 percent higher than the standard model using the same current. The new LED emits at a wavelength of 850 nm and is therefore a good compromise between maximum spectral sensitivity for CCD and CMOS cameras and suppressed visibility for the human eye. It is available with beam angles of +/-15° (SFH 4258S) and +/-25° (SFH 4259S) from two different lens types.
The new LED is particularly useful for infrared illumination, especially in security systems. In CCTV applications, the range can be increased significantly with the same number of LEDs. The main area of application in the consumer segment is camera-based gaming, as this is where high optical output has the greatest benefit.
According to Dr. Jörg Heerlein, Senior Marketing Manager for the industrial sector, “This powerful infrared Power To
pled is an excellent addition to the OSRAM portfolio of LEDs with nanostack technology chips. These high-output IR LEDs provide greater flexibility in designing individual customer solutions.” With its new infrared Power Topled with lens, OSRAM Opto Semiconductors has strengthened its leading position in the mid-range illumination segment.
You can find more technical information about the new IR Power Topleds in these online product catalogs: SFH 4258S and SFH 4259S.
The new IR Power Topled LEDs with Nanostack chip technology provide high optical output and open up new design options – particularly in the security sector.
OSRAM Opto Semiconductors
http://www.osram-os.com/


