Saving time with oscilloscopes

Whether in manufacturing, education and R&D, the oscilloscope is the preferred tool for troubleshooting and debugging.

In R&D, oscilloscopes are used to troubleshoot, debug and characterize designs from prototype via the initial production run. Aside from accurate waveform capture, designers at R&D also need advanced analysis features to quickly determine the root cause of problems and reduce time to market.

Meanwhile, oscilloscopes provide technicians and production engineers in the manufacturing sector with repeatable pass/fail debug and measurements of products that do not pass. They also require fast test and easy operation as well as waveform analysis to identify problems.

Educators, on the other hand, utilize oscilloscopes to teach scientific measurements and basic electronic principles, while students need a device that are easy to use.

With this in mind, oscilloscope manufacturers have continuously worked to provide users with various features that can help them save time.

As an example, most oscilloscopes nowadays come with an integrated function generator. Combining these two important instruments in a single device effectively saves users with precious bench space, especially when they are working in an environment where space is a premium.

Another time saving feature is the segmented memory. This feature allows users to digitize only information of interest, effectively using less memory while capturing at a higher sample rate and longer period of time. Segmented memory is ideally suited for capturing signals with periods of burst data in between long spans of idle time, such as serial packets/frames and radar bursts.

Mask testing is one of the valuable applications integrated to an oscilloscope in addition to its traditional functions. Enabling users to easily capture a “golden” waveform, mask testing defines tolerance limits to form a test envelope. With incoming signals compared to the allowable tolerance limit and flagged as either pass or fail, users can then choose the preferred action that the oscilloscope will perform once it identifies a violation of the mask.

In addition, the oscilloscope’s Fast Fourier Transform (FFT) function allows users to easily view the frequency content of the signal under test. Aside from saving time, this function is also very useful in determining the main cause of noise within a waveform, like harmonic distortion or fine-tuning a filter.

Aware of the changing needs of the project, today’s designers usually prefers an oscilloscope that can easily be upgraded. This enables them to save not only time but costs as well.

Other time saving features of oscilloscopes include high-resolution mode and averaging mode, noise reject mode and high-frequency mode.

High-resolution mode and averaging mode allows users to effectively raise the resolution of oscilloscopes by up to 12 bits, reducing noise while producing a smoother image on the screen. Adding hysteresis to the trigger circuit, noise reject makes the trigger circuit less sensitive to noise although it may need more amplitude waveform to properly trigger. High-frequency reject, on the other hand, provides the trigger path with a 50 kHz low-pass filter to remove unwanted noise like FM or AM broadcast signals.

Instrument Measures Device Characteristics to 1500 A/10 kV

The B1505A Power Device Analyzer/Curve Tracer significantly increases its voltage and current range to cover all devices in today’s fast-growing power-device market. These enhancements make it an evaluation solution to accurately and efficiently measure a device’s characteristics from sub-pA up to 10 kV/1500 A, with a fast pulse down to 10 microseconds. The B1505AP, a preconfigured version of the B1505A includes all modules, cables and accessories necessary to ensure a quick startup.

Both models are well suited for power-device researchers and manufacturers performing power-device characterization and failure analysis. Power-device users in equipment/automotive companies can also use these solutions for incoming device inspections and failure analysis.

Enhancements to the B1505A include the following:

Capabilities for improving the quality and performance of design and research: These include a wide I/V range with precision (up to 1500 A/10 kV), a medium current measurement with high voltage bias (500 mA at 1200 V, for example), a µΩ-class resistance measurement capability, and a sub-pA level current measurement, all of which are traceable to international standards. High peak powers (22.5 kW for high current and 900 W for high voltage) ensure complete characterization of most power semiconductor devices.

Extensive device evaluation capabilities: These include high-power pulsed measurement down to 10 µs, a temperature measurement capability and a GaN current collapse effect measurement. Both help speed the research and development cycle.

Improved efficiency: A newer standard test fixture (N1265A) for safe packaged-device testing, secure on-wafer testing over 200 A or up to 10 kV, and an oscilloscope view that enables real-time verification of I/V waveforms on multiple device terminals. The oscilloscope view takes advantage of two independent analog-to-digital converters equipped in each measurement channel to accurately visualize fast pulse waveforms with pulse widths as small as 10 µs. It can be used to quickly and efficiently monitor timing-critical measurement conditions and device behavior.

An upgradeable and scalable hardware architecture: A wide selection of measurement modules and support devices with up to 6 pins allow the B1505A to meet users test needs today and in the future.

The significantly enhanced Agilent B1505A is based on the Microsoft Windows 7 operating system and has a variety of selectable measurement modules that includes a high-current SMU (20A/20V), high-voltage SMU (8 mA/3000 V), medium-power SMU (1 A/200 V), multi-frequency capacitance measurement unit, ultra-high current unit (1500 A/60 V), ultra-high voltage unit (20 mA/10 kV), and high-voltage medium current unit (2.5 A/1500 V and 1.1 A/2200 V).

Superior capabilities already available in the B1505A can be used for the enhanced modules. With its scalable architecture, next-generation curve tracer, and automated test-and-analysis capabilities, the B1505A provides unparalleled performance and ease of use for power-device characterization.

Agilent Technologies

www.agilent.com

New Solution Center from Mitutoyo to Open in Alabama

Mitutoyo America Corporation announces the opening of the first M³ Solution Center in the south central United States region, located in Birmingham, Alabama. This new, 4,800 sq. ft. showroom is conveniently located so customers can schedule appointments for product demonstrations and assistance with metrology solutions and application challenges.

“Our goal is to provide timely metrology solutions to our customers, in a region that is home to a booming automotive industry. The benefit of opening this new M³ Solution Center was the accessibility in offering an experienced metrology specialist to our customers that could provide up to date and knowledgeable metrology information for any situation they may encounter”, says Mike Dukehart, Regional Sales Manager, South Central region.

The grand opening celebration will be held on Tuesday, May 22 and Wednesday, May 23, 2012 at 2100 Riverchase Center, Suite 106, Birmingham, AL. The festivities for the two day event will include facility tours, refreshments, raffles and live demonstrations from 9:00 am – 4:00 pm. If interested in attending the event. RSVP to randy.stephenson@mitutoyo.com.

Mitutoyo Corporation
www.mitutoyo.com

Tektronix boosts DSA8300 Digital Sampling Oscilloscope

Tektronix, Inc. (www.tek.com) enhances its DSA8300 Digital Sampling Oscilloscope with the OM4000 Series Optical Modulation Analyzer, which enables the device to perform analysis on PM-QPSK, QAM as well as other complex-modulation signals, with higher vertical resolution of 16 bits.

As a result of this enhancement, the oscilloscope will cater flexibility to optical networking manufacturers and designers in selecting between real-time and equivalent-time acquisition systems that will address their measurement needs.

Tektronix prides as the first optical modulation systems to offer a single modulation analyzer capable of working with both equivalent-time and real-time oscilloscopes.

The DSA8300 oscilloscope, enhanced by the OM4000 analyzer, is designed for network equipment manufacturers and designers who are in need of lower costs and higher vertical resolution.

Aside from 16-bit vertical resolution and 450uV RMS noise floor at 60 GHz, the DSA8300 oscilloscope, in this application, also features extra dynamic range and accuracy and up to 60 GHz bandwidth on four channels. Timing jitter is cut to as low as 450fs RMS, allowing visibility into real signal performance.

“As the worldwide demand for bandwidth continues to grow at a rapid pace, our customers are being asked to find ways to increase the efficiency, data rates and reliability of optical network equipment while at the same time reducing cost,” said Brian Reich, General Manager, Performance Oscilloscopes at Tektronix.

He added that along with the new enhancement, the OM4000 Series will be able to meet the needs for “cost-saving flexibility, higher vertical resolution and future-proof levels of measurement bandwidth.”

Meanwhile, the Tektronix OM4000 Series Optical Modulation Analyzer Solutions is capable of accurate characterization of serial communications in fiber starting from 100 Gb/s and beyond.

NXP’s 5-MHz UFm Bus Controllers Optimized for Complex Data Transfers

NXP Semiconductors has created the industry’s first high-performance I2C-bus controllers capable of handling both Fast-mode Plus (Fm+) and the new Ultra Fast-mode (UFm) specification, which has transmit-only data transfer rates up to 5 Mbit/s. By providing one very large 4.25-kB data buffer per channel and significantly reducing interrupts to the host processor, the PCx966x product family has been optimized for efficient I2C designs in repetitive data-intensive LED controller and stepper motor applications, such as those found in the gaming industry.

The I2C bus has changed chip-to-chip communications by replacing complex parallel interfaces with a straightforward serial structure using a simple two-wire format. The I2C bus continues to be used for system management and control in computing and enterprise equipment, and in portable and consumer applications, where it shrinks the IC footprint and leads to lower system costs. Operating at speeds of up to 5 MHz, the new Ultra Fast-mode (UFm) is a uni-directional push-pull serial bus suited for driving LED controllers and other devices that do not require feedback. With its newest UFm and Fm+ bus controllers, I2C performance enhances gaming systems, by improving management of large, complex data transfers, and enabling stronger resistance to electrical shock attacks.

NXP Semiconductors

www.nxp.com

Motion and Automation for Test, Measurement and Inspection Catalog from Aerotech

Aerotech motion systems’ newest catalog, Motion and Automation for Test, Measurement and Inspection, presents our motion capabilities in applications as diverse as sensor testing, surface profiling, nondestructive test and semiconductor inspection and metrology. Our expertise includes systems for factory floor, R&D, vacuum and cleanroom environments.

Aerotech’s ability to provide custom-engineered products and systems to end users, integrators and high-volume OEMs is unmatched, and our products deliver quality, performance, flexibility and the highest return on investment. The 72-page, illustrated catalog includes examples of real-life motion control challenges and successful solutions for each.

Applications discussed include single- and multi-axis rate tables/motion simulators, motion simulator software and the advanced controls employed in various sensor testing and calibration activities. The catalog features a section on surface measurement and profiling platforms with particular emphasis on our new SMP system and the challenges of sensor integration, process development and data acquisition. Nondestructive test is covered including X-ray inspection, ultrasonic testing and the associated components necessary for a multi-axis solution. The semiconductor inspection and metrology section focuses on ellipsometry, scanning white light interferometry, thin-film measurement, wafer inspection, atomic force microscope positioning, defect detection and particle scanning, reticle inspection and more. The cleanroom and high vacuum systems section discusses our vast experience in this realm. And finally, we provide an in-depth look at the various integrated automation and data acquisition systems and components available to create a seamless, highly accurate and cost-effective motion system.

Aerotech
www.aerotech.com

Tektronix TPS2012B digital oscilloscope comes with easy-to-use controls

Tektronix (www.tek.com) has unveiled a 100 MHz oscilloscope that allows users to safely make differential or floating measurements in various challenging environments. Delivering a maximum real-time sampling rate of one GS/s, the TPS2012B oscilloscope offers a distinctive range of capabilities with familiar and easy-to-use controls and menus.

With IsolatedChannel technology, users need not worry of damaging circuitry as it provides isolation from ground as well as isolation between channels.

The TPS2012B digital oscilloscope allows users to simultaneously characterize a vast array of signal types with its Digital Real-Time (DRT) sampling technology. This technology provides users with an accurate view of the signals while enabling the oscilloscope to capture high-frequency events, such as edge anomalies and glitches that commonly elude other comparable oscilloscope.

Users can also use the OpenChoice PC software to easily capture, save and analyze results on the PC. For basic data logging, instrument control and analysis, the oscilloscope comes with a complimentary copy of the Tektronix Edition of National Instrument’s LabVIEW SignalExpress software.

The highly portable TPS2012B digital oscilloscope allows users to easily correlate measurements between lab, field and bench. Its analog-style knobs and backlit menu buttons enables users to work even in challenging environments.

Featuring a familiar front-panel layout, the oscilloscope offers a dedicated set of position controls and scale. Aside from the automatic measurements, users can also reduce measurement time with using other features of the oscilloscope, such as autorange, autoset, context-sensitive help and probe check wizard.

HEIDENHAIN Metrology DROs Shine with LED Screens

HEIDENHAIN’s line of metrology digital readouts (DROs) has now received an upgrade. LED screens are now being released on QUADRA-CHEKs (models ND 1100 and ND 1200) and the GAGE-CHEK model ND 2100, previously all with LCD screens. LED screens have been shown to be longer lasting and provide greater brightness, both great benefits to the user.

These metrology DROs offer numerous functions for measured data acquisition and statistical evaluation of measured values. These QUADRA-CHEKs with LED screens support up to four axes, and are useful for simple metrological positioning tasks and for 2-D geometries. The GAGE-CHEK is designed for multipoint inspection apparatuses.

HEIDENHAIN
www.heidenhain.us

Oscilloscope display quality affects ability to view signal details

The ability to effectively troubleshoot designs can be affected by the quality of the oscilloscope’s display. Users may not be able to view critical signal anomalies if they are using an oscilloscope with a low-quality display, while an oscilloscope that shows signal intensity gradations reveal vital waveform details, such as signal anomalies, in a vast variety of digital and analog signal applications.

Generally, engineers perceive DSOs (digital storage oscilloscopes) as two-dimensional device that display the graphical representation of voltage versus time. However, oscilloscopes actually have a third dimension, which is known as the z-axis. At a specific X-Y location, this dimension shows that constant waveform intensity gradation is a function of the signal’s frequency of occurrence. While intensity modulation, or the third dimension, is a natural phenomenon in analog oscilloscopes’ vector-type display, this is missing in digital oscilloscopes due to early limitations in digital display technology.

When searching for signal anomalies, display intensity gradation plays an important role specifically when viewing complex-modulated analog signals like read-write disk head signals, video and digitally controlled motor drive signals. In addition, intensity gradation is of much use also in various mixed-signal applications fitted in embedded microcontroller and microprocessor technologies common in industrial, automotive and consumer markets. Moreover, intensity gradation can also show statistical data about vertical noise, edge jitter as well as the relative occurrence of anomalies even when viewing purely digital waveforms.

When debugging digital circuitry, intensity gradation is very helpful in uncovering signal anomalies. It also helps users view waveforms containing noise, jitter and infrequent events.

In an effort to emulate the display quality of analog oscilloscopes, digital oscilloscope vendors have recently offered z-axis intensity gradation but with varying levels of success.

Complex-modulated signals require an oscilloscope with adequate display quality to allow users to view large pictures and then zoom in to view the small details.

Taking for instance the NSTC or PAL composite video signal, which is a complex-modulated analog signal, capturing one using an analog oscilloscope shows that although its display may flicker, important information are embedded in the displayed waveform envelope. On the other hand, a look at the display of an older digital oscilloscope, which represents some of the entry-level DSOs offered in the market today, reveals that the waveform detail of similar signal is visually lost. Thus, it comes as no surprise that today’s video labs are littered with analog oscilloscopes.

However, several digital oscilloscopes in the market today have finally matched the visual quality offered by analog oscilloscopes. This latest breed of digital oscilloscopes can display repetitive analog signal with the same quality as that of analog oscilloscopes. With the same visual resolution, the oscilloscopes can also capture, display as well as store complex single-shot signals — a capability that analog oscilloscopes fall short of, as it is limited to displaying repetitive signals only.

LeCroy WaveMaster oscilloscope 813Zi-A delivers 40 GS/s

To achieve unparalleled real-time oscilloscope performance LeCroy (www.lecroy.com) has employed sixth generation DBI (Digital Bandwidth Interleave), custom second generation ASIC designs and SiGe processes in its WaveMaster 813Zi-A oscilloscope.

This four channel oscilloscope delivers a real-time sampling rate of 40 GS/s while offering a buffer memory of up to 20 Mpts/ch. In addition, it features a large 15.3-inch WXGA Color Display and is pristine with exceptional electrical noise, rise time, total and random jitter noise floor and overshoot performance.

Its proprietary X-Stream II architecture makes long acquisition memory pain free to use as it supports zooming, capturing, analyzing and measuring of multiple waveforms. The architecture design is augmented with high-speed serial data buses, an Inter Core 2 Quad processor with 12 GHz effective clock rate, eight GB of RAM and Windows 7 64-bit OS. These features allow the oscilloscope to provide 10 to 100 times faster processing speed compared to other oscilloscopes within its class.

For the best possible jitter measurement, the oscilloscope incorporates an exceptionally stable and accurate time base with low jitter noise floor of 125 fsrms.

The WaveMaster 813Zi-A oscilloscope frees users from probing limitations as it connects to single ended active probes, high bandwidth differential probes of up to 25 GHz, high voltage, current probes and mixed signals, offering a total system view. The oscilloscope also eliminates the need for external power supplies or adapters as it comes with selectable 1 Mohm and 50 Ohm input capability, enabling it to be used with any active or passive LeCroy probe.

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