The Agilent Power of X application note “Solutions for GNSS Receiver Testing” 5991-1742EN, provides insight into solving tough measurement problems in a unique way for both the design and manufacturing environments. The materials offers information into using simulated satellite signals to quickly and accurately verifies GNSS receiver operation.
Available Power of X Application Notes, Now Include:
Solutions Application Notes
- Solutions for GNSS Receiver Testing – Using Simulated Satellite Signals to Quickly and Accurately Verify GNSS Receiver Operation
- Solutions for Transforming Cellular Device Manufacturing Test – Using Non-Signaling Test with Multiport Capability to Reduce Test Time and Cost
- Solutions for Battery Drain Measurement – Enabling Fast, Accurate and Efficient Measurement and Analysis of Battery Current Drain in Modern Cellular Devices
- Solutions for Design and Test of 802.11ac MIMO – Combining Simulation with Test Solutions to Realize High-Performance 802.11ac MIMO Designs
- Solutions for Enabling Fast, Accurate and Efficient Testing of Voice Quality in LTE User Equipment
Solutions for Cellular (LTE, LTE-A, MIPI-DigRF, HSPA, W-CDMA, etc.)
- Solutions for Testing Multi-Standard Radio Base Stations
- Solutions for Testing DigRF Interfaces – Enabling Developers to Quickly and Efficiently Characterize Their Digital Wireless Devices
- Solutions for LTE-Advanced Physical Layer Design and Test – Using Signal Generation and Analysis to Overcome Challenges Associated with Carrier Aggregation
- Solutions for Emerging 4G Communications Systems – Making Digital Pre-Distortion Fast and Practical for all Engineers
- Solutions for Verifying LTE Signals – Quickly and Accurately Decode LTE Downlink Signal Data
- Solutions for Validating Receiver Performance – Accurately and Cost-Effectively Testing Cellular Receivers Under Real-World Conditions Requiring Real-Time Fading
- Solutions for Testing LTE FDD and TDD Performance – Ensuring Simpler, More Cost-Effective Conformance Testing of LTE Base Stations
- Solutions for Testing the DigRF Interface – Performing RF Tests on Handset Designs When Test Points Have Gone “Digital”
- Solutions for Femtocell Manufacturing Test – Accelerating Delivery of Quality, Low-cost Femtocells to Market
- Solutions for Amplifier Test – Ensuring Quick, Accurate ACPR Measurements of LTE Power Amplifiers
To view these and more, click here.
Agilent Technologies
www.agilent.com
Leave a Reply