The Agilent Power of X application note “Solutions for GNSS Receiver Testing” 5991-1742EN, provides insight into solving tough measurement problems in a unique way for both the design and manufacturing environments. The materials offers information into using simulated satellite signals to quickly and accurately verifies GNSS receiver operation.

Available Power of X Application Notes, Now Include:

Solutions Application Notes

• Solutions for GNSS Receiver Testing – Using Simulated Satellite Signals to Quickly and Accurately Verify GNSS Receiver Operation
• Solutions for Transforming Cellular Device Manufacturing Test – Using Non-Signaling Test with Multiport Capability to Reduce Test Time and Cost
• Solutions for Battery Drain Measurement – Enabling Fast, Accurate and Efficient Measurement and Analysis of Battery Current Drain in Modern Cellular Devices
• Solutions for Design and Test of 802.11ac MIMO – Combining Simulation with Test Solutions to Realize High-Performance 802.11ac MIMO Designs
• Solutions for Enabling Fast, Accurate and Efficient Testing of Voice Quality in LTE User Equipment

Solutions for Cellular (LTE, LTE-A, MIPI-DigRF, HSPA, W-CDMA, etc.)

• Solutions for Testing Multi-Standard Radio Base Stations
• Solutions for Testing DigRF Interfaces – Enabling Developers to Quickly and Efficiently Characterize Their Digital Wireless Devices
• Solutions for LTE-Advanced Physical Layer Design and Test – Using Signal Generation and Analysis to Overcome Challenges Associated with Carrier Aggregation
• Solutions for Emerging 4G Communications Systems – Making Digital Pre-Distortion Fast and Practical for all Engineers
• Solutions for Verifying LTE Signals – Quickly and Accurately Decode LTE Downlink Signal Data
• Solutions for Validating Receiver Performance – Accurately and Cost-Effectively Testing Cellular Receivers Under Real-World Conditions Requiring Real-Time Fading
• Solutions for Testing LTE FDD and TDD Performance – Ensuring Simpler, More Cost-Effective Conformance Testing of LTE Base Stations
• Solutions for Testing the DigRF Interface – Performing RF Tests on Handset Designs When Test Points Have Gone “Digital”
• Solutions for Femtocell Manufacturing Test – Accelerating Delivery of Quality, Low-cost Femtocells to Market
• Solutions for Amplifier Test – Ensuring Quick, Accurate ACPR Measurements of LTE Power Amplifiers

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Agilent Technologies
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