In its seventh year, Design World’s LEAP Awards showcase the best engineering innovations across several design categories. This wouldn’t be possible without the commitment and support of the engineering community. The editorial team assembles OEM design engineers and academics each year to create an independent judging panel. Below is their selection for this year’s LEAP […]
EE Training Day Q&A discussion: network & fiber optics measurement solutions
It’s not always easy for an engineer to determine the best networking and fiber optic measurement solution to address their measurement needs. To help with that, this webinar discusses: The what, why, and how of available options like optical spectrum analyzers, optical wavelength meters, optical power meters, variable attenuators, fixed and tunable laser sources, and […]
Upcoming EE Training Day: tips to getting better measurements when characterizing electrical device samples
This webinar will be held on October 17th, 2024. The presentation will cover various steps that go into accurately characterizing new devices, especially when measuring electrical signals, voltage, and current. It will also discuss what’s necessary to ensure high-quality measurements, such as performing low-level resistance measurements on superconductive samples and new all-in-one solutions for AC […]
EE Training Day: worried about IoT design challenges? Modern test techniques for moving from first design to final product
IoT and Embedded Design needs to emphasize speed to market without losing sight of functionality, efficiency, and reliability. This webinar discusses integrating testing into the design process and how it helps engineering teams meet their goals. It additionally touches on instrumentation and tips and tricks that provide the flexibility and capability needed to address critical […]
Moku product line enhanced with added instrument
Today, Liquid Instruments announced major updates for its flexible, FPGA-based Moku test and measurement products. The latest software release delivers numerous enhancements across the company’s three hardware products — from the flagship Moku:Pro to the workhorse Moku:Lab, and the portable Moku: Go — demonstrating the advantages of software-defined test equipment, which enables devices to get […]
UWB automated tester receives FiRa certification
NI announces validation by the FiRa Consortium of its UWB PHY test solution. Device manufacturers can now use NI’s solution and chip designers to test the conformance of their ultra-wideband (UWB) automatically enabled products against version 1.3 of FiRa’s PHY specifications. UWB is useful for devices requiring low power, operating over a short range that can coexist with […]