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Rick Nelson

How to choose analog-signal-chain components: part 4

August 13, 2025 By Rick Nelson Leave a Comment

Op amps find use in second-order filters and instrumentation amplifiers. In part 3 of this series, we described using the op amp to build some single-pole filters. Q: How do we build higher-order filters? A: Figure 1 shows one approach to a low-pass filter using the Sallen-Key topology. With two capacitors, it’s a second-order filter. […]

Filed Under: data acquisition, FAQ, Featured Tagged With: FAQ

How to choose analog-signal-chain components: part 3

August 6, 2025 By Rick Nelson Leave a Comment

Use op amps, resistors, and capacitors to build high-pass, low-pass, and bandpass filters. In part 1 of this series, we looked at a noisy signal and discussed why it might be better to use an analog filter instead of a digital filter. Then, in part 2, we looked at the operational amplifier (op amp) and […]

Filed Under: data acquisition, FAQ, Featured Tagged With: FAQ

How to choose analog-signal-chain components: part 2

July 9, 2025 By Rick Nelson Leave a Comment

Signal conditioning can prepare a sensor’s output for digitization. In part 1 of this series, we looked at a typical analog signal chain that you can use in conjunction with analog-to-digital converters (ADCs) or digital-to-analog converters (DACs). A key building block of the analog signal chain is the operational amplifier (op amp), shown in its […]

Filed Under: FAQ, Featured Tagged With: FAQ

How to choose analog-signal-chain components: part 1

June 25, 2025 By Rick Nelson Leave a Comment

Signal conditioning can prepare a sensor’s output for digitization. In a previous series, we looked at the analog-to-digital converter (ADCs) and sources of error that occur within the device. Of course, errors can creep in upstream of the ADC along the analog signal chain as the signal to be digitized is acquired and conditioned. Q: […]

Filed Under: data acquisition, FAQ, Featured Tagged With: FAQ

Understanding ADC specs and architectures: part 5

June 16, 2025 By Rick Nelson Leave a Comment

ENOB describes an analog-to-digital converter’s performance with respect to total noise and distortion. In the earlier parts of this series on analog-to-digital converters (ADCs), we looked at the basics (part 1); gain error, offset error, and differential nonlinearity (part 2); and integral nonlinearity (part 3); and then we looked at some ADC topologies and introduced […]

Filed Under: Digital Oscilloscope, FAQ, Featured, Meters & Testers Tagged With: FAQ

Understanding ADC specs and architectures: part 4

May 28, 2025 By Rick Nelson Leave a Comment

The AC performance of an analog-to-digital converter depends on its architecture. In part 3 of this series, we discussed the integral nonlinearity (INL) error of an analog-to-digital converter (ADC), noting that gain, offset, and INL error all contribute to the total unadjusted error. This metric provides an overall view of an ADC’s DC performance. Q: What about the AC […]

Filed Under: data acquisition, data recorders, FAQ, Featured Tagged With: FAQ

Understanding ADC specs and architectures: part 3

May 21, 2025 By Rick Nelson Leave a Comment

Integral nonlinearity tracks the cumulative effects of an ADC’s differential nonlinearity. In part 2 of this series, we discussed several sources of error in an analog-to-digital converter (ADC), including gain, offset, missing-code error, and differential nonlinearity (DNL). We concluded with an illustration of a waveform with varying levels of DNL superimposed on the staircase representing […]

Filed Under: data recorders, FAQ, Featured Tagged With: FAQ

Understanding ADC specs and architectures: part 2

May 7, 2025 By Rick Nelson Leave a Comment

Specifications such as gain error, offset error, and differential nonlinearity help define an analog-to-digital converter’s performance. In part 1 of this series, we discussed an ideal analog-to-digital converter (ADC), noting that it would have infinite resolution and bandwidth. Then we looked at the real world of practical inverters and how their resolution, expressed in a […]

Filed Under: FAQ, Featured Tagged With: FAQ

Understanding ADC specs and architectures: part 1

April 30, 2025 By Rick Nelson Leave a Comment

Analog-to-digital converters are the heart of most test equipment, setting the stage for the digital processing of analog signals. Several posts over the past year or so have involved digital signal processing. For example, we have covered the fast Fourier transform (FFT), the inverse FFT, and discrete convolution. To perform these operations on real-world signals, […]

Filed Under: FAQ, Featured Tagged With: FAQ

How to use convolution to implement filters: part 4

March 19, 2025 By Rick Nelson Leave a Comment

A windowed sinc function can implement a low-pass filter, and a two-dimensional convolutional filter can blur or sharpen images. In part 3 of this series, we introduced a low-pass filter based on the Sinc function and described the need for windowing to compensate for sampling and truncation. Q: How can we apply this filter? A: […]

Filed Under: FAQ, Featured Tagged With: FAQ

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