• Skip to primary navigation
  • Skip to main content
  • Skip to primary sidebar
  • Skip to footer
  • Advertise
  • Subscribe

Test & Measurement Tips

Oscilloscopes, electronics engineering industry news, how-to EE articles and electronics resources

  • Oscilloscopes
    • Analog Oscilloscope
    • Digital Oscilloscope
    • Handheld Oscilloscope
    • Mixed-signal Oscilloscope
    • PC-based Oscilloscopes – PCO
  • Design
  • Calibration
  • Meters & Testers
  • Test Equipment
  • Learn
    • eBooks/Tech Tips
    • FAQs
    • EE Training Days
    • Learning Center
    • Tech Toolboxes
    • Webinars & Digital Events
  • Video
    • EE Videos
    • Teardown Videos
  • Resources
    • Design Guide Library
    • Digital Issues
    • Engineering Diversity & Inclusion
    • Leap Awards
    • White Papers
  • Subscribe

Rick Nelson

Understanding ADC specs and architectures: part 4

May 28, 2025 By Rick Nelson Leave a Comment

The AC performance of an analog-to-digital converter depends on its architecture. In part 3 of this series, we discussed the integral nonlinearity (INL) error of an analog-to-digital converter (ADC), noting that gain, offset, and INL error all contribute to the total unadjusted error. This metric provides an overall view of an ADC’s DC performance. Q: What about the AC […]

Filed Under: data acquisition, data recorders, FAQ, Featured Tagged With: FAQ

Understanding ADC specs and architectures: part 3

May 21, 2025 By Rick Nelson Leave a Comment

Integral nonlinearity tracks the cumulative effects of an ADC’s differential nonlinearity. In part 2 of this series, we discussed several sources of error in an analog-to-digital converter (ADC), including gain, offset, missing-code error, and differential nonlinearity (DNL). We concluded with an illustration of a waveform with varying levels of DNL superimposed on the staircase representing […]

Filed Under: data recorders, FAQ, Featured Tagged With: FAQ

Understanding ADC specs and architectures: part 2

May 7, 2025 By Rick Nelson Leave a Comment

Specifications such as gain error, offset error, and differential nonlinearity help define an analog-to-digital converter’s performance. In part 1 of this series, we discussed an ideal analog-to-digital converter (ADC), noting that it would have infinite resolution and bandwidth. Then we looked at the real world of practical inverters and how their resolution, expressed in a […]

Filed Under: FAQ, Featured Tagged With: FAQ

Understanding ADC specs and architectures: part 1

April 30, 2025 By Rick Nelson Leave a Comment

Analog-to-digital converters are the heart of most test equipment, setting the stage for the digital processing of analog signals. Several posts over the past year or so have involved digital signal processing. For example, we have covered the fast Fourier transform (FFT), the inverse FFT, and discrete convolution. To perform these operations on real-world signals, […]

Filed Under: FAQ, Featured Tagged With: FAQ

How to use convolution to implement filters: part 4

March 19, 2025 By Rick Nelson Leave a Comment

A windowed sinc function can implement a low-pass filter, and a two-dimensional convolutional filter can blur or sharpen images. In part 3 of this series, we introduced a low-pass filter based on the Sinc function and described the need for windowing to compensate for sampling and truncation. Q: How can we apply this filter? A: […]

Filed Under: FAQ, Featured Tagged With: FAQ

How to use convolution to implement filters: part 3

March 12, 2025 By Rick Nelson Leave a Comment

A windowed sinc filter outperforms a moving-average filter in the frequency domain. In part 2 of this series, we described a type of convolution filter called the moving-average filter, and we demonstrated that it is effective at removing Gaussian white noise in the time domain but performs poorly in the frequency domain. Q: Do all […]

Filed Under: FAQ, Featured

How to use convolution to implement filters: part 2

March 5, 2025 By Rick Nelson Leave a Comment

A moving-average filter can address white noise in the time domain but performs poorly in the frequency domain. In part 1 of this series, we defined convolution, denoted by the * symbol, and looked at a simple geometrical example of how it operates to produce a new function y(t) from two given functions, f(t) and […]

Filed Under: FAQ, Featured

How to use convolution to implement filters: part 1

February 26, 2025 By Rick Nelson Leave a Comment

Convolution is used in a variety of signal-processing applications, including time-domain-waveform filtering. In a recent series on the inverse fast Fourier transform (FFT), we concluded with a mention of convolution and its application to filtering. Convolution Q: What is convolution? A: Convolution, denoted by * symbol, combines two functions to form a third function in […]

Filed Under: Digital Oscilloscope, FAQ, Featured, Oscilloscopes

How to calculate and apply the inverse discrete Fourier transform: part 4

January 22, 2025 By Rick Nelson Leave a Comment

In part 3 of this series, we used the inverse fast Fourier transform (IFFT) to create 100-Hz time-domain waveforms of various amplitudes and phases. We can also use the IFFT to create waveforms containing multiple frequencies. If you look closely at Figure 1 in part 1 of this series, you’ll notice that the time-domain waveform […]

Filed Under: Analyzer, FAQ, Featured, oscilloscope measurements, spectrum analyzer Tagged With: FAQ

How to calculate and apply the inverse discrete Fourier transform: part 3

January 15, 2025 By Rick Nelson Leave a Comment

The inverse transform can create a time-domain waveform where no waveform has been before. In part 2 of this series, we used the discrete Fourier transform to convert a waveform from the time domain to the frequency domain, operated on the frequency-domain data, and used the inverse transform to reconstruct the altered time-domain waveform. That’s […]

Filed Under: Analyzer, FAQ, Featured, oscilloscope measurements, spectrum analyzer Tagged With: FAQ

  • « Go to Previous Page
  • Page 1
  • Page 2
  • Page 3
  • Page 4
  • Page 5
  • Interim pages omitted …
  • Page 8
  • Go to Next Page »

Primary Sidebar

Featured Contributions

antenna array

Verifying 5G with OTA testing

You passed: Getting products through EMC/EMI compliance tests

screen-shot-display--Chroma-63200A

How to test dc-dc converters

More Featured Contributions

EE TECH TOOLBOX

“ee
Tech Toolbox: Sensors
In this Tech Toolbox, we cover some of those technologies driving the next generation of connected systems, including ultra-low-power sensing strategies that extend node battery life, and 60 GHz CMOS radar for contactless health and presence detection.

EE TRAINING CENTER

EE Learning Center
“test
EXPAND YOUR KNOWLEDGE AND STAY CONNECTED
Get the latest info on technologies, tools and strategies for EE professionals.
bills blog

RSS Current Electro-Tech-Online.com Discussions

  • reviving old swordfish program but?
  • Assistance locating a 'trail' camera gadget, please ?
  • Analog multiplexer has gone obselete
  • Difference between TTL, RS232 and RS485
  • Smart Buoy project

Footer

EE World Online Network

  • 5G Technology World
  • EE World Online
  • Engineers Garage
  • Analog IC Tips
  • Battery Power Tips
  • Connector Tips
  • EDA Board Forums
  • Electro Tech Online Forums
  • EV Engineering
  • Microcontroller Tips
  • Power Electronic Tips
  • Sensor Tips

Test & Measurement Tips

  • Subscribe to our newsletter
  • Advertise with us
  • Contact us
  • About us

Copyright © 2026 · WTWH Media LLC and its licensors. All rights reserved.
The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media.

Privacy Policy