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Automation

NI CEO: COVID-19 on day one

October 14, 2020 By Martin Rowe Leave a Comment

NI CEO Eric Starkloff’s first decision was what to do about COVID-19 the night before he took over on February 1, 2020. Since then, he’s seen the opportunities in communications resulting from the pandemic. How would you like to take on a new leadership role just as a pandemic takes hold? That’s what Eric Starkloff […]

Filed Under: Automation, data acquisition, Instrumentation, PC-based Test Equipment, Sensing, Test and Measurement News, wireless Tagged With: National Instruments

Integrated test package for industrial devices aligned with Avnu Alliance Qvb test plan

September 20, 2019 By Lee Teschler Leave a Comment

ixia-ixnetwork

A new set of industrial time-sensitive networking (TSN) conformance test cases in IxNetwork from Ixia enable device manufacturers to ensure their devices are in compliance with the Avnu Alliance industrial test plan for 802.1Qbv-2015. In the industrial market, the evolution of the industrial internet of things (IIoT) will increase the amount of data harvested through […]

Filed Under: Automation, Test and Measurement News Tagged With: keysighttechnologies

Test system software enhancements help improve semiconductor production test efficiency

September 13, 2019 By Lee Teschler Leave a Comment

NI STS

New Semiconductor Test System (STS) software enhancements deliver significant improvements to the programming and debugging experience, test execution speed, parallel test efficiency and overall equipment efficiency for the NI Semiconductor Test System. As market windows constrict, semiconductor production test engineers are trying to accelerate the process of developing, debugging and deploying new test programs to […]

Filed Under: Automation, Test Equipment Tagged With: nationalinstruments

Design, test software platform integrates simulation, design, test workflows

January 31, 2018 By Lee Teschler Leave a Comment

keysight pathways

PathWave from Keysight is the first software platform to integrate design, test, measurement and analysis. The software platform provides engineers and technicians with flexible and immediate access to the design and test tools. The interoperability of the design and test tools and advanced data management significantly speeds the product development cycle, eliminating the need to […]

Filed Under: Automation, Test Equipment Tagged With: keysighttechnologies

Real-time MM-wave Radar Simulator for Autonomous Driving

October 20, 2017 By Test and Measurement Editor Leave a Comment

OTSL Inc., a short-distance wireless system and embedded system developer and distributor, announced a real-time millimeter-wave radar simulator for autonomous driving, the Advanced Millimeter Wave Radar Simulator (AMMWR Simulator), at the SystemC AMS & COSIDE User Group Meeting held in Munich, Germany, and hosted by COSEDA Technologies GmbH. AMMWR Simulator is the world’s first sensor […]

Filed Under: Automation Tagged With: otsl

Test system components and rack assemblies speed ATE integration

May 26, 2017 By Lee Teschler Leave a Comment

ATE Core Configurations

New ATE Core Configurations deliver core mechanical, power and safety infrastructure to help users accelerate the design and build of automated test systems in industries ranging from semiconductor and consumer electronics to aerospace and automotive. Developed by National Instruments Corp., ATE Core Configurations help simplify the design, procurement, assembly, and deployment of smarter test systems […]

Filed Under: Automation, Automotive and Aerospace Tagged With: nationalinstruments

First Cat-M1 Test GCF Certification goes to LTE-advanced RF test system

May 11, 2017 By Lee Teschler Leave a Comment

anritsu test system

Anritsu Co.’s LTE-Advanced RF Conformance Test System ME7873LA has earned the first GCF certification for the LTE Category M1 (Cat M1) RF Conformance Test, as part of IoT communications technology. With the GCF certification, the ME7873LA has approval for more than 70 test cases across seven bands, including frequency bands in Japan, North America, and […]

Filed Under: Automation, Communication Test, Test Equipment Tagged With: anritsu

Wafer-Level parametric tester targets power SiC, GaN devices up to 3 kV

October 25, 2016 By Lee Teschler Leave a Comment

S540 keithley test system

A fully-automated, 48-pin parametric test system is designed for wafer-level testing of power semiconductor devices and structures up to 3kV. Optimized for use with the latest compound power semiconductor materials including silicon carbide (SiC) and gallium nitride (GaN), the fully integrated Keithley S540 Power Semiconductor Test System is said to perform all high-voltage, low-voltage, and […]

Filed Under: Automation Tagged With: Keithley Instruments, Tektronix

Second-Generation Vector Signal Transceiver Targets Demanding RF Design and Test Applications

July 12, 2016 By Lee Teschler Leave a Comment

VST

A second-generation vector signal transceiver (VST) called the PXIe-5840 is said to be the world’s first 1-GHz bandwidth VST. Developed by National Instruments Corp., the instrument is an update of a VST released in 2012. The newly developed PXIe-5840 combines a 6.5-GHz RF vector signal generator, 6.5-GHz vector signal analyzer, high-performance user-programmable FPGA and high-speed […]

Filed Under: Automation Tagged With: national instrument

VPC Celebrates the 10th Anniversary of the iCon

May 6, 2016 By WTWH Editor Leave a Comment

Virginia Panel Corporation (VPC) is celebrating its 10th anniversary of the iCon, a rack and panel connector specifically designed for the Test & Measurement industry. VPC thanks all of if its customers who have purchased an iCon since 2006. To celebrate, a commemorative iCon will be on display at this year’s tradeshows. Just over 5½ […]

Filed Under: Automation Tagged With: vpc

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