New Semiconductor Test System (STS) software enhancements deliver significant improvements to the programming and debugging experience, test execution speed, parallel test efficiency and overall equipment efficiency for the NI Semiconductor Test System. As market windows constrict, semiconductor production test engineers are trying to accelerate the process of developing, debugging and deploying new test programs to […]
Automation
Design, test software platform integrates simulation, design, test workflows
PathWave from Keysight is the first software platform to integrate design, test, measurement and analysis. The software platform provides engineers and technicians with flexible and immediate access to the design and test tools. The interoperability of the design and test tools and advanced data management significantly speeds the product development cycle, eliminating the need to […]
Real-time MM-wave Radar Simulator for Autonomous Driving
OTSL Inc., a short-distance wireless system and embedded system developer and distributor, announced a real-time millimeter-wave radar simulator for autonomous driving, the Advanced Millimeter Wave Radar Simulator (AMMWR Simulator), at the SystemC AMS & COSIDE User Group Meeting held in Munich, Germany, and hosted by COSEDA Technologies GmbH. AMMWR Simulator is the world’s first sensor […]
Test system components and rack assemblies speed ATE integration
New ATE Core Configurations deliver core mechanical, power and safety infrastructure to help users accelerate the design and build of automated test systems in industries ranging from semiconductor and consumer electronics to aerospace and automotive. Developed by National Instruments Corp., ATE Core Configurations help simplify the design, procurement, assembly, and deployment of smarter test systems […]
First Cat-M1 Test GCF Certification goes to LTE-advanced RF test system
Anritsu Co.’s LTE-Advanced RF Conformance Test System ME7873LA has earned the first GCF certification for the LTE Category M1 (Cat M1) RF Conformance Test, as part of IoT communications technology. With the GCF certification, the ME7873LA has approval for more than 70 test cases across seven bands, including frequency bands in Japan, North America, and […]
Wafer-Level parametric tester targets power SiC, GaN devices up to 3 kV
A fully-automated, 48-pin parametric test system is designed for wafer-level testing of power semiconductor devices and structures up to 3kV. Optimized for use with the latest compound power semiconductor materials including silicon carbide (SiC) and gallium nitride (GaN), the fully integrated Keithley S540 Power Semiconductor Test System is said to perform all high-voltage, low-voltage, and […]
Second-Generation Vector Signal Transceiver Targets Demanding RF Design and Test Applications
A second-generation vector signal transceiver (VST) called the PXIe-5840 is said to be the world’s first 1-GHz bandwidth VST. Developed by National Instruments Corp., the instrument is an update of a VST released in 2012. The newly developed PXIe-5840 combines a 6.5-GHz RF vector signal generator, 6.5-GHz vector signal analyzer, high-performance user-programmable FPGA and high-speed […]
VPC Celebrates the 10th Anniversary of the iCon
Virginia Panel Corporation (VPC) is celebrating its 10th anniversary of the iCon, a rack and panel connector specifically designed for the Test & Measurement industry. VPC thanks all of if its customers who have purchased an iCon since 2006. To celebrate, a commemorative iCon will be on display at this year’s tradeshows. Just over 5½ […]
Liquid tight flexible conduit basics
Liquid-tight flexible metal conduit (Type LFMC) in outward appearance resembles its close relative, liquid-tight flexible nonmetallic conduit (LFNC). Both have smooth gray outer jackets that are liquid tight. Type LFMC has an inner steel armor, which makes it stronger and less vulnerable to kinking. Either of these raceways can be formed in gentle curves to […]
Four lucky engineers get trip to Germany’s Hanover Fair
Rittal Corp. says it has picked the winners of its “Win a Trip to Hanover Fair with Rittal!” contest: The lucky engineers are: Andrew Neeld, Automation Engineer of Sedro Woolley, Wash. Jerry Flynn, Principal Engineer of Albany, Ore. Christopher Relyea, President of Columbus, Ohio Michael DeRosso, Sr. Engineering Technologist of Houston, Tex. “Hanover Fair is […]
