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Editor's Blog

Microwaves and the Havana Syndrome

June 14, 2021 By Lee Teschler 4 Comments

Havana syndrome

Leland Teschler • Executive editor The National Academy of Sciences recently released its conclusions about what sickened dozens of American Embassy diplomats in Cuba, a phenomenon dubbed the Havana Syndrome. Though the panel reached no definitive conclusion, it found pulsed RF (a.k.a. directed microwave energy) was the most likely cause. Panel members could not rule […]

Filed Under: Editor's Blog, FAQ, Featured Tagged With: FAQ

Will your Good Samaritanism in the pandemic buy you a lawsuit?

June 3, 2020 By Lee Teschler Leave a Comment

Leland Teschler | Executive Editor If you are one of the individuals voluntarily spending your time on technology to help abate the COVID 19 pandemic, consider the experience of the vacuum cleaner company Dyson in the U.K. Company founder James Dyson estimates his firm spent about $25 million and about 10 days to develop a […]

Filed Under: Editor's Blog, Featured, Test and Measurement News Tagged With: covidengineering

Will high test instrument costs keep the next Steve Wozniak out of the tech business?

June 18, 2018 By Lee Teschler Leave a Comment

LEE TESCHLER EXECUTIVE EDITOR Back in the heyday of personal computing, it was possible to do state-of-the-art work without making a big investment in test equipment. To see what I mean, consider the development of the first 5.25-in. floppy disk drive for the Apple II PC. Introduced at the Consumer Electronics Show in early 1978, […]

Filed Under: Editor's Blog, Featured, New Articles Tagged With: apple computer, Tektronix

No, you can’t detect ghosts with a gauss meter

June 15, 2017 By Lee Teschler 19 Comments

no you can't detect ghosts with a gauss meter

Leland Teschler – Executive Editor lteschler@wtwhmedia.com On Twitter @DW_LeeTeschler WE’D like to think that the average viewer who tunes into a TV show on the SciFy channel called Ghost Hunters might get a laugh out watching investigators prowl around places that are reported to be haunted. But the show participants seem to be completely serious […]

Filed Under: Editor's Blog, Meters & Testers

End of an era at National Instruments: Dr. James Truchard, CEO and co-founder, to step down

August 30, 2016 By Lee Teschler Leave a Comment

labview

National Instruments, best known for its LabVIEW program and platform-based instrumentation systems, says Alex Davern, age 49, will serve as Chief Executive Officer and President, effective January 1, 2017. Davern will succeed Dr. James Truchard, age 73, who has served as the Chief Executive Officer of NI since the company’s founding in 1976. Dr. Truchard […]

Filed Under: Bench Test, Editor's Blog Tagged With: National Instruments

Student Loan forgiveness petition

April 8, 2013 By Test and Measurement Editor Leave a Comment

As promised in my blog, I have an update on student loans. There is an online petition to reconstruct the current student loan repayment system. These changes entitled,”The Student Loan Fairness Act (H.R. 1330)” would create a new “10-10” standard for student loan repayment, in which an individual would be required to make ten years […]

Filed Under: Editor's Blog, Featured Tagged With: commentary

DAQ Series: Podcast: miniSystems for Engineering Excellence

February 25, 2013 By Test and Measurement Editor 2 Comments

In this DAQ Series, we discuss how DAQs are scaled down for educational purposes. National Instruments is dedicated to teaching engineering fundamentals beyond theory and mathematical applications. Its target is to teach students engineering concepts as a whole. The idea of teaching students hands-on, visual applications came from the suggestions of professors and teachers at […]

Filed Under: data acquisition, Editor's Blog, Featured, Test Equipment Tagged With: National Instruments, NI, podcast

DAQ Series: Methodology associated with data acquisition

February 19, 2013 By Test and Measurement Editor Leave a Comment

In the previous DAQ series, What is a Data Acquisition (DAQ), and How DAQs Work at a High Level, terminology that is analogous with DAQs was mentioned. To delve further, this series will discuss the some of the methodology associated with data acquisition. Transducers, Sensors, Actuators: As we know, data acquisition begins with a physical […]

Filed Under: Calibration, data acquisition, Editor's Blog, Featured Tagged With: commentary

DAQ Series: How DAQs work at a high level

February 12, 2013 By Test and Measurement Editor 1 Comment

As Daniel Carnes (Facebook reader) said, “As more and more data acquisition systems make their way into our lives it is good to know how they work at least at a high level.” Taking a cue from Mr. Carnes, engineers are no longer stereotyped as the person wearing the white coat in a lab. We […]

Filed Under: Calibration, data acquisition, Editor's Blog, Featured Tagged With: commentary

DAQ Series: What is a Data Acquisition System (DAQ)?

February 5, 2013 By Test and Measurement Editor 3 Comments

Data acquisition systems (DAQ) are getting a lot of engineers’ attention lately. Pondering minds would like to know what is a DAQ? To clarify, it is simpler to explain what a DAQ “does” than to answer, “What it is”. The DAQ was invented circa 1964, with the purpose of doing something with software. Initially, DAQ’s […]

Filed Under: data acquisition, Editor's Blog, Featured Tagged With: commentary

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