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FAQ

Working with the PicoScope PC-based oscilloscope

September 10, 2018 By David Herres Leave a Comment

A PC-based oscilloscope, or USB oscilloscope as it is also known, has a lot going for it. For one thing, it costs substantially less than a bench model with equivalent specifications, given that most users already own the major component. The PC or Mac provides the processing and display parts of the equation. (The computer, […]

Filed Under: FAQ, Featured, Oscilloscope Descriptions, oscilloscope measurements, PC-based Oscilloscopes - PCO Tagged With: FAQ, picotech

Working with waveforms in mixed-domain oscilloscopes

September 4, 2018 By David Herres Leave a Comment

Sin(X)

Waveform generators generally contain a library of common waveforms, which can be individually accessed and displayed by running a BNC cable to an active analog channel input in an oscilloscope. Most oscilloscopes have, available as an option, an internal arbitrary function generator (AFG), which permits the user to create an endless variety of waveforms and […]

Filed Under: FAQ, Featured, oscilloscope measurements Tagged With: FAQ, Tektronix

Digital phosphor oscilloscopes, persistence, and eye patterns

August 28, 2018 By David Herres Leave a Comment

The digital phosphor oscilloscope takes its name from the old analog phosphor scope, but the resemblance is superficial. It was difficult to see the trace on the CRT screen in an analog scope because the electron beam dissipated instantly. To solve this problem, early engineers came up with the idea of coating the inner surface […]

Filed Under: FAQ, Featured, Oscilloscope Descriptions Tagged With: FAQ, Tektronix

The basics of simulating radar signals with AWGs

August 24, 2018 By David Herres Leave a Comment

Radar is quite simple in concept, but it becomes highly complex in actual implementation. Many decades passed between the time it was first envisioned and when useful working models emerged, which happened just in time to save England from total defeat in the 1940s. When it comes to testing radar, the situation has become easier […]

Filed Under: arbitrary waveform generators, FAQ, Featured, New Articles, Test Equipment Tagged With: FAQ

A test setup that simulates automotive radar

August 21, 2018 By Lee Teschler Leave a Comment

Jungik Suh from Keysight recently took us through a simulation of an automotive radar system, a hot topic these days thanks to work being done in autonomous vehicles. The point of simulating a radar signal is to provide a test signal for downstream electronics that will act on what shows up in the radar return. […]

Filed Under: Automotive and Aerospace, FAQ, Featured, Test Equipment Tagged With: FAQ, keysighttechnologies

Test bed demo: Getting ready for emerging millimeter wave applications

August 21, 2018 By Lee Teschler Leave a Comment

We recently talked with Greg Jue from Keysight who took us through a demo of an R&D test bed for emerging millimeter wave applications. Specifically, as an application example, Jue set up an example 802.11ay system. The 802.11ay spec is designed as an improvement of the 802.11ad WLAN definition that will have a frequency of […]

Filed Under: Analyzer, arbitrary waveform generators, FAQ, Featured, Test Equipment, wireless, wireless test equipment Tagged With: FAQ, keysighttechnologies

Making noise figure measurements with handheld analyzers

August 21, 2018 By Lee Teschler Leave a Comment

We recently were able to get with Roland Zhang from Keysight who took us through a noise figure measurement system that really comes in handy if you’re doing 5G measurements in the field. Zhang explains that in the 5G arena there will be a lot of amplifiers or up and down converters to convert signals […]

Filed Under: FAQ, Featured, New Articles, Test Equipment, wireless, wireless test equipment Tagged With: FAQ, keysighttechnologies

Instrumentation that measures differential noise in real time

August 20, 2018 By Lee Teschler Leave a Comment

We were recently able to speak with Pat Murray from Anritsu who demonstrated instrumentation that computes differential noise figure. Though noise figure is a well-known parameter, differential noise figure isn’t as commonly used. But it is becoming important for the verification of low-noise amplifiers (LNAs) and other devices used in the front-end of 5G and […]

Filed Under: Analyzer, FAQ, Featured, Test Equipment Tagged With: anritsu, FAQ

The instrumentation of nanotechnology

August 17, 2018 By David Herres Leave a Comment

Nano- as a prefix refers to the order of magnitude involved in a specific discussion. A nanometer is one billionth of a meter. Comparing a nanometer to a meter is like comparing the size of a marble to the size of the earth. At 100 nanometers and less, quantum effects become pronounced, and this is […]

Filed Under: FAQ, Featured, New Articles Tagged With: FAQ, IBM

Basics of oscilloscope controls

August 6, 2018 By David Herres 1 Comment

Early analog oscilloscopes had a vast number of front panel controls, mostly knobs that had to be endlessly twirled and tweaked to obtain and maintain stable waveforms on the screen. In the modern digital instrument with a flat screen, there is no focus knob, as required for the CRT with its beam of electrons traveling […]

Filed Under: FAQ, Featured, Oscilloscope Descriptions Tagged With: Tektronix

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