Near-field probes let you find the sources of near-field and far-field EMI that ruin your design, and your day. You don’t need to know Maxwell’s Equations to troubleshoot your designs.
For 2023, the digital version features 11 technical articles that cover test from signal integrity on the bench to automated test on the production floor.
It’s a tenet of the test-and-measurement industry that you should concentrate on looking for defects in your device under test (DUT) — not in your test equipment. Figure 1 illustrates a common problem. An instrument presents an incorrect reading; in this case, an LRC meter or multimeter presents a resistance reading that’s about 5% low. […]
The midUTS from Bloomy contains a multimeter, data-acquisition, switching, and power supplies for testing boards and systems. Automating tests — whether for bench testing new designs, in production, or for service — increases productivity but comes at a price. If you’re going to build an automated test system all yourself, expect to specify the instrumentation, […]
Back from a three-year hiatus, I’m covering test and measurement again. This time, it’s for EE World.
The 5560A from Fluke Calibration lets you calibrate DMMs to 6½. Other models handle fewer digits.
The ABI Multiple Instrument Station MIS4 Test Station is an all-in-one testing tool that combines in a compact case all commonly required test instruments in one compact and programmable hardware module. Controlled by ABI’s sophisticated SYSTEM 8 Ultimate PC software with a simple yet programmable operator interface, the MIS4 combines eight laboratory instruments: a three-channel […]
MTI Instruments, Albany, N.Y., has won a siliver medal in the 2022 Leap Awards competition. The LEAP Awards celebrates the most innovative and forward-thinking products serving the design engineering space. MTI won in the test and measurement category, for test and measurement equipment as typically used by design and development engineers engaged in product design […]
A 12-slot, 3U Development Platform is aligned to SOSA 1.0 and CMOSS and features high-speed RF and optical I/O connectivity on a number of key SOSA profiles while supporting both I/O-intensive and compute-intensive processor slots, two switch slots and one PNT slot as part of the test solution. Prior to its official release, the development […]
New enhancements for Moku:Go, a complete, portable and accessible lab solution platform designed for engineers and students to actively test designs and projects, feature a full range of connectivity, optional programmable power supplies and an intuitive user interface. These enhancements include the addition of new instruments for Moku:Go: Digital Filter Box: A tool to design […]