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Bench Test

T&M gear supports PCI Express 5.0 physical-layer testing

January 31, 2019 By Lee Teschler Leave a Comment

Teledyne LeCroy PCI Express 5.0 Physical-Layer Testing

The new Teledyne LeCroy QPHY-PCIE5-TX-RX physical-layer software option for LabMaster 10Zi-A series oscilloscopes provides: Automated receiver-test calibration for jitter-tolerance testing at the full 32 GT/sec PCIe 5.0 rate. While existing solutions can take up to a full day to calibrate before even starting the test, the Teledyne LeCroy calibration will be completed in a fraction […]

Filed Under: Bench Test, Meters & Testers, Test and Measurement News, Test Equipment Tagged With: teledynelecroy

2×2 MIMO software helps measure IEEE802.11ac WLAN equipment in real-world settings

May 24, 2018 By Lee Teschler Leave a Comment

mt8862a

Anritsu Co. has come out with 2×2 MIMO Measurement Software MX886200A-010 that extends the measurement capability of its Wireless Connectivity Test Set MT8862A. With the software installed, the MT8862A is said to be the world’s first solution that supports output signal quality, transmit power, receiver sensitivity, and 2×2 MIMO measurements on IEEE802.11ac WLAN equipment under […]

Filed Under: Bench Test, Meters & Testers, Test Equipment, wireless Tagged With: Anritsu Company

Measuring clock and oscillator frequency

March 1, 2018 By David Herres 1 Comment

frequency counter measurement

A clock may refer to an oscillator that has been designed to provide a timing signal to facilitate operation of one or more synchronous processors. In contrast, asynchronous operation does not require a clock because each step initiates upon completion of a prior step. It is potentially faster than synchronous operation because there is not […]

Filed Under: Bench Test, FAQ, Featured, Meters & Testers, New Articles, Test Equipment Tagged With: ECSinc, Tektronix

Handy test equipment for troubleshooting

July 21, 2017 By David Herres Leave a Comment

Not all test equipment needs to be expensive. Here are a few helpful tools that won’t break the bank. Electricians doing residential, commercial or industrial work need to know with absolute certainty whether a wire or terminal is live and whether a given piece of electrical equipment is energized at the power input terminals. Usually, […]

Filed Under: Bench Test, Meters & Testers, New Articles, Oscilloscopes, spectrum analyzer Tagged With: Amprobe, Fluke, flukecorporation

How to measure electrolytic capacitors

June 9, 2017 By David Herres Leave a Comment

electrolytic capacitors

Electrolytic capacitors are often used because they deliver relatively large capacitance values in a physically small package. The compact packaging is possible because they use a thin dielectric layer in conjunction with an etching or sintering process that vastly increases the area of the plates and the capacitance associated with them. Most capacitors have two […]

Filed Under: Bench Test, FAQ, Meters & Testers, New Articles, Test Equipment Tagged With: basics, FAQ

Budget-priced vector network analyzer handles 6 GHz with 122 dB dynamic range

April 25, 2017 By Lee Teschler 1 Comment

Tektronix-TTR506A

The TTR500 Series USB Vector Network Analyzer is said to cost 40% less than alternatives capable of 122 dB dynamic range and 6 GHz frequency range. Developed by Tektronix, it also includes advanced features such as VectorVu-PC analysis software and a built-in bias tee for testing active devices. The TTR500 Series features an easy-to-use user […]

Filed Under: Bench Test, Design, Meters & Testers Tagged With: Tektronix

Why does simultaneous sourcing/measurement matter?

February 2, 2017 By Lee Teschler Leave a Comment

SMU family

Engineers whose test bench already comes equipped with power supplies, meters, and electronic loads might wonder what good a source measure unit might be. Here’s the rationale for this type of instrument. Qing D. Starks • Tektronix Inc. Most engineers have a power supply and a DMM on their benches. So it’s logical to ask […]

Filed Under: Bench Test, Meters & Testers, New Articles Tagged With: source measurement unit, Tektronix

End of an era at National Instruments: Dr. James Truchard, CEO and co-founder, to step down

August 30, 2016 By Lee Teschler Leave a Comment

labview

National Instruments, best known for its LabVIEW program and platform-based instrumentation systems, says Alex Davern, age 49, will serve as Chief Executive Officer and President, effective January 1, 2017. Davern will succeed Dr. James Truchard, age 73, who has served as the Chief Executive Officer of NI since the company’s founding in 1976. Dr. Truchard […]

Filed Under: Bench Test, Editor's Blog Tagged With: National Instruments

Keithley Introduces World’s First Source Measure Unit Instrument

August 15, 2013 By Test and Measurement Editor Leave a Comment

2450-SourceMeter

Keithley Instruments announces the first benchtop Source Measure Unit (SMU) instrument with a capacitive touchscreen graphical user interface. The Model 2450 SourceMeter SMU Instrument combines the intuitive touchscreen and icon-based control that novice SMU users can appreciate with the exceptional versatility that experienced users need to learn faster, work smarter, and invent easier. This new […]

Filed Under: Bench Test Tagged With: keithleyinstruments

Agilent Technologies Launches Versatile Benchtop Boundary Scan Analyzer

February 22, 2013 By Test and Measurement Editor Leave a Comment

agilent-bench-test

Agilent Technologies Inc. (NYSE: A) announced the launch of the Agilent x1149 boundary scan analyzer. Boundary scan has become an indispensable technology as engineers face increasing test access challenges. The x1149 boundary scan analyzer is a versatile yet easy to use board test tool designed to help users through board design and validation, and re-using the same x1149 […]

Filed Under: Bench Test Tagged With: Agilent

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