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Test and Measurement News

Economical 7.5-GHz spectrum/VNA targets signal distortion, modulation, spectrum purity, frequency stability, crosstalk distortion parameters

November 4, 2020 By Lee Teschler Leave a Comment

siglent vna

The Siglent SVA1075X Spectrum/Vector Network Analyzer is a powerful tool with reliable automatic measurements for measuring the performance of RF circuits and networks such as amplifiers, filters, attenuators, cables, and antennas. With a wide frequency range from 9 kHz to 7.5 GHz, the SVA1015X analyzer delivers reliable automatic measurements with its built-in tracking generator and […]

Filed Under: Test and Measurement News, Test Equipment, vector network analyzer Tagged With: saeligcompanyinc, Siglent

Testing vulnerabilities in programmable logic controllers

November 4, 2020 By David Herres Leave a Comment

PLCs

Had you examined the controls handling automotive assembly lines before the mid 1970s you would have found cabinets full of relays, cam timers, drum sequencers and hardwired controllers. All these controls had to be swapped out or modified to handle line retooling during a model-year change. To reduce the cost of such changeovers, General Motors […]

Filed Under: FAQ, Featured, New Articles, Test and Measurement News Tagged With: FAQ

Software simplifies design-for-test tasks in IC development

November 3, 2020 By Lee Teschler Leave a Comment

mentor SSN

The Tessent Streaming Scan Network software for the Tessent TestKompress software includes embedded infrastructure and automation that decouples core-level DFT (design for test) requirements from the chip-level test delivery resources. This enables a no-compromise, bottom-up DFT flow that can dramatically simplify DFT planning and implementation, while reducing test time up to 4X. With full support […]

Filed Under: Test and Measurement News Tagged With: mentorgraphics

Debug tookit for DDR5 and LPDDR5 handles 6,400 Mb/sec data rates

November 2, 2020 By Lee Teschler Leave a Comment

teledyne lecroy probes

A DDR5 Debug Toolkit runs on SDA 8 Zi-B and LabMaster 10Zi-A oscilloscopes. The DDR Debug Toolkit now supports DDR5/LPDDR5 for test, analysis and debug of the entire DDR design cycle. Features include automatic Read/Write burst separation, bursted data jitter analysis, eye diagram mask tests, DDR-specific measurement parameters, and seamless integration with the HDA-125 High-Speed […]

Filed Under: scope probes and accessories, Test and Measurement News, Test Equipment Tagged With: teledynelecroy

Bi-phase modulators encode RF carriers via 2PSK

October 27, 2020 By Lee Teschler Leave a Comment

FM-Biphase-Modulators-

A new line of bi-phase modulators covere broad octave frequency bands from 0.5 to 40 GHz. These models use TTL logic to phase-modulate data onto an RF carrier signal using two-phase shift keying (2PSK). Useful applications include military and commercial communications systems, microwave radio, radar, high-data-rate test & measurement, serial data transmission and wireless base […]

Filed Under: Communication Test, Test and Measurement News, Test Equipment Tagged With: fairviewmicrowave

New book covers EMC troubleshooting with test instruments

October 22, 2020 By Lee Teschler Leave a Comment

EMC book

A valuable 180-page book called “Create Your Own EMC Troubleshooting Kit: Essential Tools for EMC Troubleshooting” by EMC guru Ken Wyatt is the first volume in Wyatt’s EMC troubleshooting series. It covers the benefits of creating a personal EMC troubleshooting kit and also defines which products to include. Individual chapters name suitable spectrum analyzers, near-field […]

Filed Under: Test and Measurement News Tagged With: saeligcompanyinc

PXI switching modules handle heavy ac and dc loads

October 22, 2020 By Lee Teschler Leave a Comment

pickering

A new high-power relay PXI module provides the industry’s highest switching capacity in the smallest footprint for a solution based on electromechanical relays. Occupying a compact single PXI slot form factor, the model 40-166 is available with SPST, SPDT or SP4T switching configurations. It uses power relays suitable for switching loads up to 20 A […]

Filed Under: Test and Measurement News, Test Equipment Tagged With: pickeringinterfaces

Rugged ATR chassis for VITA 48.4 features liquid flow-through cooling

October 19, 2020 By Lee Teschler Leave a Comment

VITA48_4-LFT-Rugged-ATR-Platform

A new rugged ATR chassis compliant with VITA 48.4 for liquid flow-through (LFT) cooling includes a new backplane designed for data rates up to 10 Gbps and can handle 300 W per slot. This enables the system to accommodate the intense thermal management needed in high-density embedded computing systems. The new chassis offers several other […]

Filed Under: New Articles, Test and Measurement News, Test Equipment Tagged With: elmaelectronic

NI CEO: COVID-19 on day one

October 14, 2020 By Martin Rowe Leave a Comment

NI CEO Eric Starkloff’s first decision was what to do about COVID-19 the night before he took over on February 1, 2020. Since then, he’s seen the opportunities in communications resulting from the pandemic. How would you like to take on a new leadership role just as a pandemic takes hold? That’s what Eric Starkloff […]

Filed Under: Automation, data acquisition, Instrumentation, PC-based Test Equipment, Sensing, Test and Measurement News, wireless Tagged With: National Instruments

Software pack now includes design cloud simulation services

October 13, 2020 By Lee Teschler Leave a Comment

keysight pathwave

The PathWave Software Suite now enables engineers to remove computational limitations across the workflow with cloud processing clusters to improve designs and device reliability while reducing project risk. Keysight is launching five new and enhanced software solutions that leverage the power of cloud processing to address computational limitations throughout the design process. Now equipped with […]

Filed Under: Test and Measurement News Tagged With: keysighttechnologies

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