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Instrumentation

Galil DMC-4020 moves unique instrument for leaf analysis

September 30, 2014 By WTWH Editor Leave a Comment

GalilTH

Custom Lab Software Systems Inc., a developer of precision instrumentation, used a Galil DMC-4020 to build the Micron Level 3-D Confocal Profiling and Thickness Measurement System. This is an instrument for optical measurement requested by Dr. Dan Chitwood, Assistant Member at Donald Danforth Plant Science Center. Chitwood is currently researching how to engineer crops to […]

Filed Under: Instrumentation, Meters & Testers, Test Equipment Tagged With: galil

New Digital Microscope Eliminates Need for Focus Adjustment

May 7, 2014 By WTWH Editor Leave a Comment

By integrating the most recent advancements in optical and digital technologies, the VHX-5000 Digital Microscope is able to instantly capture any area in complete focus – without the need for the user to adjust focus. The VHX Series was designed to overcome the limitations of traditional optical microscopes by providing high-resolution, large depth-of-field imaging and […]

Filed Under: Instrumentation, Machine Vision/Inspection Tagged With: cmoscamera, highresolution, KEYENCE, microscope

New Handheld TDR Locates Faults on Mixed Paired Metallic Cables

April 25, 2014 By WTWH Editor Leave a Comment

Megger

Megger, a world manufacturer and supplier of test equipment and measuring instruments for electrical power applications, now offers a handheld time domain reflectometer (TDR) that locates faults on mixed paired metallic cables. The CFL535G can test the capabilities of connections and locate faults for up to 12 miles (20 km). This high resolution, compact TDR […]

Filed Under: Handheld Oscilloscope, Instrumentation, Test Equipment Tagged With: megger

Yokogawa Obtains ISASecure® EDSA Certification

January 27, 2014 By Test and Measurement Editor Leave a Comment

Yokogawa

Yokogawa Electric Corporation announces that its ProSafe®-RS safety instrumented system has obtained the ISASecure®* Embedded Device Security Assurance (EDSA) certification. Cyber crime and cyber warfare are on the rise worldwide, and are growing ever more sophisticated. Recent prominent cases of industrial sabotage and espionage have escalated these concerns. Companies in the oil, petrochemical, power, and […]

Filed Under: Automation, Instrumentation Tagged With: Yokogawa

Cincinnati Test Systems Showcased Precision Leak Tester at MD&M West

February 22, 2013 By Test and Measurement Editor Leave a Comment

c28

The Sentinel C28-DP is a compact leak test instrument built for maximum performance utilizing Differential Pressure Decay technology. Designed by Cincinnati Test Systems, the instrument utilizes advanced algorithms to produce fast and accurate results required by the most demanding customers. The C28 has earned a top notch name in the marketplace and now CTS is […]

Filed Under: Instrumentation, Test Equipment Tagged With: cincinnatitestsystems

Multi-Measurement Signal Analysis for Wireless Test

December 21, 2012 By Test and Measurement Editor Leave a Comment

With wireless devices and systems now handling multiple carriers and signal formats at the same time, so must the solutions that test them. The innovative, new multi-measurement feature for the Agilent 89600 VSA software delivers the power of multiple signal analyzers with the convenience of a single user interface. The software’s advanced architecture allows multiple measurements to be configured simultaneously, and, because all measurements reside in memory, any or all of them can be called upon for immediate and coordinated execution. The result is more efficient testing with deeper insight about subtle signal interactions. With multi-measurement capability, 89600 VSA software users can: • Simultaneously verify all carriers in a multi-carrier power amplifier (MCPA) • Simultaneously verify all signal formats in a multi-standard device • Explore interactions between multiple transmitters in the same device • Analyze uplink and downlink signals within a single frame, for either TDD or FDD systems • Compute transfer functions between different test points in the same signal path • Perform several diverse measurements at once, such as measuring in-channel modulation quality while testing for spurious or harmonic emissions The 89600 VSA software offers flexible execution modes to address a variety of test scenarios. When all test signals lie within the bandwidth of the analyzer hardware—up to 160 MHz with the Agilent PXA signal analyzer or 13 GHz with Agilent oscilloscopes—all measurement results can be derived simultaneously from a single acquisition. When signals are spaced too widely to be captured in a single acquisition, the software allows measurements to be executed in rapid sequence or run independently using separate hardware front ends. In all cases, results are shown together on one analyzer display, where tools such as trace overlays and user-defined math equations can be used to perform in-depth interpretation and comparisons. The industry’s most flexible multi-measurement test solution, the 89600 VSA software is compatible with more than 30 Agilent signal analyzers, scopes and logic analyzers, and runs on Windows-based PCs or in PC-based instruments. Availability Agilent’s new multi-measurement capability is now available as a standard feature in the 89600 VSA software. Current users can obtain this functionality by upgrading their software to release 15.0.

With wireless devices and systems now handling multiple carriers and signal formats at the same time, so must the solutions that test them. The innovative, new multi-measurement feature for the Agilent 89600 VSA software delivers the power of multiple signal analyzers with the convenience of a single user interface. The software’s advanced architecture allows multiple […]

Filed Under: Instrumentation, Sensing, Test Equipment Tagged With: Agilent Technologies

NI Releases NI 5791 RF transceiver adapter module for NI FlexRIO

October 31, 2012 By Test and Measurement Editor Leave a Comment

NI-5791-FAM-Receiver2

National Instruments commercially released the NI 5791 RF transceiver adapter module for NI FlexRIO, which is currently being used in multiple cutting-edge research projects on 5G technologies. The module forms a powerful SDR solution when paired with an NI FlexRIO FPGA module for real-time, user-designed processing. Through triggering mechanisms provided by the PXI platform, users […]

Filed Under: data acquisition, Instrumentation, Meters & Testers Tagged With: National Instruments

Keithley Introduces Dual-Channel Picoammeter/Voltage Source with Ultra-Low Current Resolution

October 16, 2012 By Test and Measurement Editor Leave a Comment

Keithley

Keithley Instruments, Inc. expands its low level measurement leadership by introducing a dual-channel picoammeter with dual ±30V independent, non-floating bias sources and 1fA measurement resolution. The Model 6482 Picoammeter, the latest addition to Keithley’s popular line of sensitive instrumentation, provides two independent picoammeter/source channels in a 2U, half-rack enclosure, allowing simultaneous 6-1/2-digit measurements across both channels. […]

Filed Under: Instrumentation, Sensing Tagged With: Keithley Instruments

Expanded Bandwidth Options on Arbitrary Waveform Generator

February 27, 2012 By Test and Measurement Editor Leave a Comment

Agilent Technologies Inc. (NYSE: A) announced enhancements to its industry-leading, high-resolution, wide-bandwidth M8190A arbitrary waveform generator. The enhancements allow engineers to create signal scenarios using the 5- to 7-GHz spectrum. The Agilent M8190A is a source of high fidelity because it simultaneously delivers wide bandwidth and high resolution with up to 80 dBc of spurious-free […]

Filed Under: Instrumentation, New Articles Tagged With: Agilent, arbitrary waveform generator, high frequency

Saelig Debuts Unique Circuit Track Current Probe

February 27, 2012 By Test and Measurement Editor Leave a Comment

Saelig Company, Inc. announces the Aim-TTi I-Prober 520, a unique, compact hand-held current probe for use with any oscilloscope, unlike any other current measurement device available. The current flowing in a pcb track can be observed and measured, allowing measurements by merely placing the insulated tip of the probe on to the track. Calibrated measurement […]

Filed Under: Instrumentation, New Articles, Sensing Tagged With: Current Probe, Saelig

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