Tektronix, Inc. has unveiled a new 45 GHz optical modulation analyzer (OMA) capable of supporting the latest 100G and next-gen 400G communications standards. With support for single-carrier or multi-carrier systems, the analyzer is tightly integrated with Tektronix’s new DPO70000SX 70 GHz ATI Performance Oscilloscope to provide multi-channel, high sample rate, low noise digitization of complex […]
Communication Test
H-P, Agilent, Keysight: New name, same reputation
Those of us who have been around electronic instrumentation for a while can remember the days when Hewlett-Packard instruments were considered the cream of the crop. Where I worked, we always tried to get to the lab early on the days we had tests to run so we could get our hands on the highly […]
Renishaw acquires U.S. metrology specialist
Renishaw, an engineering technologies company, has purchased the business of Advanced Consulting & Engineering, Inc. (ACE), a US-based supplier of dimensional measurement products and services focused on the automotive industry. The acquisition of family-owned ACE, based in Rochester Hills, Michigan, provides Renishaw further specialized programming capabilities using leading industry packages, and will help to support […]
The Evolution of User Interfaces
by Jonathan Tucker, Senior Marketing and Product Manager, Keithley Instruments, Inc., Solon, Oh. Changing user expectations are shaping test instrument graphical user interface (GUI) design. User expectations for new instrument interfaces are changing. For instrumentation vendors, successfully designing new instruments means understanding that although users still need accurate measurements, they rarely have unlimited time to […]
Tektronix Adds Critical Support for 100G Communications Test
Tektronix, Inc. announced a significant expansion of its BERTScope Bit Error Rate Tester Series to meet growing 100G testing requirements. The new BERTScope, with its industry leading sub 300 femtoseconds intrinsic jitter noise floor, brings extremely accurate BER test and root-cause PHY layer analysis to the growing portfolio of Optical Communications Test products from Tektronix. The Tektronix […]
Wireless Communications Test Set that Accelerate Manufacturing Test
The E6607B EXT wireless communications test set and companion E6617A multiport adapter is optimized for non-signaling testing. The EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies. The EXT is an integrated one-box tester that includes a […]
Instrument Measures Device Characteristics to 1500 A/10 kV
The B1505A Power Device Analyzer/Curve Tracer significantly increases its voltage and current range to cover all devices in today’s fast-growing power-device market. These enhancements make it an evaluation solution to accurately and efficiently measure a device’s characteristics from sub-pA up to 10 kV/1500 A, with a fast pulse down to 10 microseconds. The B1505AP, a […]
NXP’s 5-MHz UFm Bus Controllers Optimized for Complex Data Transfers
NXP Semiconductors has created the industry’s first high-performance I2C-bus controllers capable of handling both Fast-mode Plus (Fm+) and the new Ultra Fast-mode (UFm) specification, which has transmit-only data transfer rates up to 5 Mbit/s. By providing one very large 4.25-kB data buffer per channel and significantly reducing interrupts to the host processor, the PCx966x product […]
Agilent Announces Test Software for Altair Semiconductor Chipset
Agilent Technologies Inc. (NYSE: A) announced a new application based on its N7300 series chipset software platform. The Agilent N7304A-2, used with the company’s EXT wireless communications test set, was created in collaboration with Altair Semiconductor and optimized for high-volume manufacturing test for equipment based on Altair’s FourGee 3100/6200 TDD/FDD LTE chipset. The N7304A-2, a […]
Agilent Introduces Comprehensive LPDDR3 Compliance Test App
Agilent Technologies Inc. (NYSE: A) introduced a comprehensive compliance test application for systems using low-power double-data-rate 3 memory. In addition to accelerating the turn-on and debug of LPDDR3-based systems, the tool offers great flexibility to engineers working with nonstandard operating speeds and voltages, giving them an efficient way to characterize their LPDDR3 designs. The Agilent U7231B […]
