Picoscope 7.2 makes troubleshooting easier by highlighting decision points on waveforms. New features include: Waveform overlays, which let you see differences in captured signals, helping you identify glitches on other intermittent occurrences; Measurement Indicators: the software places visual markers on waveforms, which highlight the points where it measures parameters such as rise time and frequency; […]
data recorders
Detection system finds manufacturing faults from photos and videos
TDK Corporation unveiled the latest TDK SensEI product line, edgeRX Vision. edgeRX Vision is a high-speed defect detection system that analyzes customer product images or movies and is capable of identifying even the smallest components—down to 1 mm by 0.5 mm—with exceptional precision. Powered by advanced AI, the system delivers real-time, highly accurate defect detection […]
FieldDAQ captures physical data close to the sensor
FieldDAQ modules accept sensors directly and send data over Ethernet. Collecting data such as temperature, strain, and other physical parameters often requires long sensor wires or rugged equipment close to the measurement source. Long wires can add errors due to losses in analog wiring or from outside interference. Field installations often add environmental and power […]
Understanding ADC specs and architectures: part 4
The AC performance of an analog-to-digital converter depends on its architecture. In part 3 of this series, we discussed the integral nonlinearity (INL) error of an analog-to-digital converter (ADC), noting that gain, offset, and INL error all contribute to the total unadjusted error. This metric provides an overall view of an ADC’s DC performance. Q: What about the AC […]
Understanding ADC specs and architectures: part 3
Integral nonlinearity tracks the cumulative effects of an ADC’s differential nonlinearity. In part 2 of this series, we discussed several sources of error in an analog-to-digital converter (ADC), including gain, offset, missing-code error, and differential nonlinearity (DNL). We concluded with an illustration of a waveform with varying levels of DNL superimposed on the staircase representing […]
Automotive data logger syncs timestamps below 100 ns
TTTech Auto announces the launch of the PM-350, the latest addition to its Automotive Data Logger family, designed specifically for Software-Defined Vehicle (SDV) verification and validation. Optimized as a new addition to the Automotive Data Logger family for SDVs, advancing the latest evolution of PM-200, the PM-350 represents the latest innovation in capturing high-speed automotive […]
Modular system combines DMM with DAQ
The DAQ3120 from B+K Precision lets you install up to three measurement modules to create a custom system for your bench. Most engineers have a digital multimeter (DMM) for basic measurements such as voltage, current, and resistance. Sometimes, however, you need the flexibility to add channels and log measurements without or without a computer. That’s […]
USB DAQ system reaches 20-bit resolution
The mioDAQ from NI has two 20-bit and two 16-bit flavors. Analog outputs come with two or four, with 16-bit DIO and counters. USB data-acquisition (DAQ) devices have been on the market for many years and come in many varieties. What makes the mioDAQ series from NI different is its 20-bit vertical resolution on two […]
Optimize AI network design at 800 Gbps
Keysight Technologies, Inc. has entered the artificial intelligence (AI) and machine learning (ML) infrastructure ecosystem with the introduction of the Keysight AI Data Center Test Platform, designed to accelerate innovation in AI / ML network validation and optimization. The solution significantly improves the benchmarking of new AI infrastructures with unprecedented scale and efficiency. The deployment and […]
High-speed digitizer cards perform on-board summation averaging
A new firmware option has been created by Spectrum Instrumentation that allows the company’s high-speed M5i.33xx series of PCIe high-speed digitizers cards to perform on-board summation averaging. Averaging is a useful tool for reducing unwanted signal noise, while at the same time improving measurement resolution, dynamic range and signal-to-noise ratio (SNR). The new option enables […]
