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Test Equipment

What are the critical measurements in satellite uplinks and downlinks?

May 8, 2023 By Bob Buxton, Wireless Telecom Group Leave a Comment

Noise measurement, LO substitution, receiver stress testing, power measurement, CCDF and PAPR characterization, and antenna-pattern measurement play critical roles in link budget, bit-error rate, and SNR requirements.

Filed Under: Communication Test, FAQ, Featured, Featured Contributions, power sensing Tagged With: boonton

Test methods for mmWave AiP designs bring tradeoffs

April 18, 2023 By Su-Wei Chang, Ethan Lin, Andrew Wu, and Jackrose Kuo, TMYTEK

Engineers have several mmWave over-the-air test methods available for evaluating phased-array antennas used in antenna-in-package designs. Each has pros and cons.

Filed Under: 5G, Digital Edition Back Issue, FAQ, Featured, Featured Contributions, wireless, wireless test equipment Tagged With: TMYTEK

IoT devices in private 5G networks bring new verification tests

March 18, 2023 By By Adnan Khan, Anritsu

With private networks connecting to many IoT devices, testing the device’s user interface requires updating test processes. Many IoT use cases rely on private 5G networks because they offer greater network control, better security, more reliable performance, and dedicated coverage and capacity as opposed to using a public network. With these advantages, private networks play…

Filed Under: Communication Test, Featured Contributions

Water-cooled probe injects disturbances onto power rails

February 7, 2023 By Martin Rowe Leave a Comment

The P2124 from Picotest let’s you inject modulation signals onto your board’s power rails for noise immunity testing.

Filed Under: Communication Test, Featured, scope probes and accessories Tagged With: Picotest

I’ve got the measurement blues again

January 24, 2023 By Martin Rowe Leave a Comment

EMC Band

Back from a three-year hiatus, I’m covering test and measurement again. This time, it’s for EE World.

Filed Under: Automation, Bench Test, Editor's Blog, Featured, Instrumentation, Meters & Testers, New Articles, Oscilloscopes, PC-based Test Equipment

What is a Smith chart and why do I need one? (Part 1)

January 23, 2023 By Rick Nelson Leave a Comment

A Smith chart provides insight into RF/microwave designs. Even if you work primarily with low-speed analog and mixed-signal designs, you could benefit from familiarity with the Smith chart as wireless products proliferate and as high-speed-serial data signals exhibit microwave-like effects. When a signal’s wavelength (λ) approaches the lengths of the conductors carrying it, you can […]

Filed Under: Analyzer, Communication Test, FAQ, Featured, spectrum analyzer, wireless test equipment Tagged With: FAQ

Calibrators ease the DMM workload

January 19, 2023 By Martin Rowe Leave a Comment

Fluke 5560A calibrator

The 5560A from Fluke Calibration lets you calibrate DMMs to 6½. Other models handle fewer digits.

Filed Under: Bench Test, Calibration, Featured, Temperature Measurement Tagged With: flukecalibration

Engineer ambitiously or be acquired?

January 18, 2023 By Martin Rowe 1 Comment

Emerson Electric makes a significant offer to acquire NI, which is fighting back.

Filed Under: Featured, Instrumentation, Machine Vision/Inspection, Test Equipment Tagged With: National Instruments

Development chassis sports mix of VME64x, OpenVPX backplanes

December 19, 2022 By Lee Teschler Leave a Comment

pixus technologies

An open-frame enclosure contains multiple configuration options utilizing VME and OpenVPX backplanes. With a vast array of standard VITA 65 profile and power and ground only (unrouted) OpenVPX backplanes available, Pixus can offer a wide range of solutions. Coupled with various standard VME/VME64x backplanes, the company can provide a mix of slot options in both […]

Filed Under: Test Equipment Tagged With: pixustechnologies

Source measure unit combines four-quadrant voltage/current source with 6.5-digit meter

December 15, 2022 By Lee Teschler Leave a Comment

saelig

The AIM-TTi SMU4000 Source Measure Unit Series integrates a fast and agile high-power, four-quadrant voltage/current source with advanced precise voltage/current meters as an all-in-one test solution. Precisely supplying positive and negative voltages, sourcing or sinking power, while simultaneously measuring both current and voltage, makes these instruments candidates for rapid I-V characterization. The PowerFlex autoranging design […]

Filed Under: New Articles, Test Equipment Tagged With: aim-TTi, saeligcompanyinc

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Why engineers need IC ESD and TLP data

Verify, test, and troubleshoot 5G Wi-Fi FWA gateways

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How to use remote sensing for DC programmable power supplies

The factors of accurate measurements

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