Omega introduces the OM-WLS-TEMP series of wireless USB 2.0 full-speed temperature input module (fully compatible with both USB 1.1 and 2.0). This CE compliant product features 8 temperature input channels and supports thermocouple types J, K, T, E,R,S,B,N, RTDs, thermistors and semiconductor temperature sensors. The OM-WLS-TEMP can be operated as a standalone plug-and-play USB device […]
Test Equipment
Parametric curve tracer simplifies high-voltage C-V tests
For test engineers responsible for configuring high power semiconductor test systems, the new Keithley Model 8020 High Power Interface Panel improves connectivity and simplifies complex measurements like high voltage capacitance-voltage (C-V) measurements. The Model 8020 reduces set-up times, minimizes opportunities for connection errors, improves operator and test hardware protection, and increases users’ confidence in the […]
Galil DMC-4020 moves unique instrument for leaf analysis
Custom Lab Software Systems Inc., a developer of precision instrumentation, used a Galil DMC-4020 to build the Micron Level 3-D Confocal Profiling and Thickness Measurement System. This is an instrument for optical measurement requested by Dr. Dan Chitwood, Assistant Member at Donald Danforth Plant Science Center. Chitwood is currently researching how to engineer crops to […]
DDR bus simulator generates BER contours
Keysight Technologies, Inc. introduced the DDR Bus Simulator; the industry’s first tool to generate accurate Bit-Error-Rate (BER) contours for the JEDEC DDR memory bus specification. The software product, which is available as a new option for Advanced Design System (ADS) 2014.11 from Keysight EEsof EDA, quickly and accurately calculates DQ and DQS eye probability density […]
Kelvin probes for low-resistance measurements
TEGAM, Inc, a supplier of innovative microohmmeters, has just introduced five new Kelvin probes. When used with TEGAM’s R1L bond meters or the 1740 or 1750 microohmeters, they enable engineers and technicians to more easily make four-wire bonding and other low-resistance measurements: The BKP-10 Kelvin probes are designed for heavy-duty applications where you must make […]
Lucky kids get Keysight scopes
Keysight Technologies, Inc. announced it has donated an MSOX4154A oscilloscope to each of the universities supporting the company’s student internship program. The universities include: University of Colorado Boulder – Boulder, Colorado Rensselaer Polytechnic Institute – Troy, New York Rochester Institute of Technology – Rochester, New York As part of the program, interns from each of […]
New Verisurf software automates quality inspection
Verisurf Software, Inc. is pleased to announce Verisurf X8 with many new enhancements that make stationery coordinate measuring machines (CMMs), portable CMMs and 3D scanners more productive for automated inspection, guided assembly and reverse engineering. Built on a powerful CAD platform, Verisurf X8 provides a variety of manufacturing measurement solutions to meet the needs of […]
Keysight Announces Best-in-Class Femto/Picoammeters and Electrometers
Keysight Technologies, Inc. introduced the B2980A Series of femto/picoammeters and electrometers, the first graphical picoammeters and electrometers to confidently measure down to 0.01 fA which is 0.01 x 10-15 A, and up to 10 petaohms (PΩ) which is 10 x 1015 ohms. In recent years, research and development into new materials, such as nanomaterial, graphene, […]
ATS for RF, mixed-signal devices uses PXI-based approach
NI (Nasdaq: NATI) announced the NI Semiconductor Test System (STS) series. These PXI-based automated test systems reduce test cost for RF and mixed-signal devices by opening access to NI- and industry-offered PXI modules in semiconductor production test environments. Compared to conventional semiconductor automated test equipment (ATE), STS lead users are experiencing reduced production costs and […]
H-P, Agilent, Keysight: New name, same reputation
Those of us who have been around electronic instrumentation for a while can remember the days when Hewlett-Packard instruments were considered the cream of the crop. Where I worked, we always tried to get to the lab early on the days we had tests to run so we could get our hands on the highly […]