Tektronix, Inc. announced that it has made a sizeable donation of more than $22,000 of equipment to the Fariborz Maseeh College of Engineering and Computer Science at Portland State University (PSU). The donated equipment included oscilloscopes, probes, an arbitrary/function generator, a digital multimeter and laboratory grade power supplies. The tools provided through this donation will […]
Test Equipment
Agilent Technologies Introduces Wireless Communications Test Set
Agilent Technologies Inc. introduced its new E6607C EXT wireless communications test set, featuring an integrated multiport adapter for cost-effective, high-volume wireless device manufacturing test. Optimized for testing multiple devices simultaneously, the EXT-C with integrated multiport adapter enables up to 3x gain in effective test throughput (vs. the EXT-B) for less than 1.3x the price. Smartphone and tablet […]
DAQ Series: Podcast: miniSystems for Engineering Excellence
In this DAQ Series, we discuss how DAQs are scaled down for educational purposes. National Instruments is dedicated to teaching engineering fundamentals beyond theory and mathematical applications. Its target is to teach students engineering concepts as a whole. The idea of teaching students hands-on, visual applications came from the suggestions of professors and teachers at […]
Cincinnati Test Systems Showcased Precision Leak Tester at MD&M West
The Sentinel C28-DP is a compact leak test instrument built for maximum performance utilizing Differential Pressure Decay technology. Designed by Cincinnati Test Systems, the instrument utilizes advanced algorithms to produce fast and accurate results required by the most demanding customers. The C28 has earned a top notch name in the marketplace and now CTS is […]
Compliance Testing for Energy-Efficient Ethernet Standards from Agilent
Agilent Technologies Inc. (NYSE: A) introduces compliance testing support for Energy-Efficient Ethernet (EEE) standards used in networking applications. Agilent’s solution for transmitter tests includes 10BASE-T, 100BASE-T and 1000BASE-T EEE test standards as described in the IEEE 802.3az-2010 specification. Growing consumer demand for energy-saving network devices has driven the need for more network testing. EEE technology […]
Hexagon Metrology Releases PC-DMIS Gear 2.5
Hexagon Metrology announces the release of PC-DMIS Gear 2.5, a sophisticated software module designed for basic and advanced gear measurement applications. The new version simplifies measurement routines by using a parameter-driven graphical interface to speed inspections of helical spur, bevel gears and pinions. PC-DMIS Gear 2.5 software is compatible with standard CMMs, eliminating the need […]
Bodkin Design Receives SBIR Funding from NASA
Bodkin Design & Engineering, LLC (BD&E) has been awarded a $125,000 SBIR contract by NASA to develop a surface temperature mapping system for re-entry vehicle heat shields. The unique system will provide unprecedented temperature accuracy during ground tests. Unlike simple thermal imaging, BD&E’s design uses hyperspectral imaging to greatly increase accuracy. BD&E has previously developed […]
Sensoray Introduces PCI Express Analog and Digital I/O
Sensoray announces the newest member of their extensive line of OEM data acquisition cards with the release of the Model 826, a PCI Express Analog and Digital I/O board with multistage watchdog timer. Featuring 6 encoder/timer/counter interfaces, 16 differential analog inputs (16-bit, 300 kS/s), 8 analog outputs (16-bit, 900 kS/s), 48 bi-directional digital I/Os with […]
Keithley’s SourceMeter® named one of EDN’s 2012 Hot 100 Products
Keithley Instruments, Inc. announced that the editors of EDN Magazine have named the Model 2657A High Power System SourceMeter instrument as one of the “100 Hot Products of 2012.” The 2012 EDN Hot 100 highlights the electronics industry’s most significant products of the year based on innovation, significance, usefulness, and popularity as determined by the […]
Agilent Technologies to Demonstrate Solutions Tests at IPC APEX EXPO
Agilent Technologies Inc. will demonstrate its latest boundary scan analyzer, plus inline in-circuit and functional test systems at the IPC APEX EXPO, Feb. 19-21, at the San Diego Convention Center (Booth 2827) in San Diego, Calif. These latest innovations provide greater flexibility, allowing users to re-use tests and hardware investments all the way from design validation […]