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PC-based Test Equipment

Hexagon Metrology rolls out PC-DMIS 2014.1

December 2, 2014 By WTWH Editor Leave a Comment

Hexagon-MetrologyTH

Hexagon Metrology launched PC-DMIS 2014.1, a significant update of the world’s most popular measurement software used for the collection, evaluation, management and presentation of manufacturing data. The new mid-term software release introduces tools and technologies to help laser and optical measurement devices perform better than ever. PC-DMIS 2014.1 delivers overall performance improvements and major enhancements […]

Filed Under: PC-based Test Equipment, Test and Measurement News Tagged With: hexagonmetrology

Triple-channel supply hosts 30-V and 5-V sources

October 30, 2014 By WTWH Editor Leave a Comment

KeithleyTH

Keithley Instruments announced the addition of an economical triple-channel power supply to the company’s Series 2200 line of programmable DC power supplies. The Model 2231A-30-3 195W Triple-Channel DC Power Supply combines the advantage of greater output accuracy than competitive power supplies, with features that enhance its ease of use in circuit design and university student […]

Filed Under: PC-based Test Equipment, Sensing, Test Equipment Tagged With: keithley

Android app works with sourcemeters

October 24, 2014 By WTWH Editor Leave a Comment

KeithleyTH

Keithley Instruments has developed a free app for Android™-based smartphones and tablets that interacts with a Keithley Series 2600B SourceMeter SMU instrument via its front panel USB interface. IVy, which is the industry’s first app developed for SMU instruments, extends Keithley’s Touch, Test, Invent® design philosophy to offer benchtop Series 2600B instrument users a fast, […]

Filed Under: PC-based Test Equipment, Test Equipment Tagged With: keithley

H-P, Agilent, Keysight: New name, same reputation

August 1, 2014 By Lee Teschler Leave a Comment

Those of us who have been around electronic instrumentation for a while can remember the days when Hewlett-Packard instruments were considered the cream of the crop. Where I worked, we always tried to get to the lab early on the days we had tests to run so we could get our hands on the highly […]

Filed Under: Analog Oscilloscope, Analog Sampling Oscilloscope, Analog Storage Oscilloscope, Communication Test, data acquisition, Digital Oscilloscope, digital phosphor oscilloscope, Digital Sampling Oscilloscope, Digital Storage Oscilloscope, Handheld Oscilloscope, Meters & Testers, Mixed-signal Oscilloscope, Oscilloscopes, PC-based Oscilloscopes - PCO, PC-based Test Equipment, Test and Measurement News, Test Equipment

The Evolution of User Interfaces

December 3, 2013 By Test and Measurement Editor Leave a Comment

Keithley-Model-2450-SMU-icon-menu-structure

by Jonathan Tucker, Senior Marketing and Product Manager, Keithley Instruments, Inc., Solon, Oh. Changing user expectations are shaping test instrument graphical user interface (GUI) design. User expectations for new instrument interfaces are changing. For instrumentation vendors, successfully designing new instruments means understanding that although users still need accurate measurements, they rarely have unlimited time to […]

Filed Under: Automation, Communication Test, PC-based Test Equipment, Test and Measurement News, Test Equipment Tagged With: keithleyinstruments

Tektronix Brings 165 MHz Real-Time Bandwidth to Mid-Range Spectrum Analyzers

November 19, 2013 By Test and Measurement Editor Leave a Comment

Tektronix-Brings-165-MHz-Real-Time-Bandwidth-to-Mid-Range-Spectrum-AnalyzersTH

Tektronix, Inc., a worldwide provider of test, measurement and monitoring instrumentation, announced that its real-time spectrum analyzers (RTSAs) now offer up to 165 MHz acquisition bandwidth, the widest available in this price range. This bandwidth supports demanding applications such as high-margin, high accuracy WLAN 802.11ac characterization and troubleshooting. In addition to increased bandwidth, Tektronix has […]

Filed Under: PC-based Test Equipment, Test and Measurement News, Test Equipment Tagged With: Tektronix

Box Eliminates Need for PC Card with Inspection Stations

November 13, 2013 By Test and Measurement Editor Leave a Comment

Box-Eliminates-Need-for-PC-Card-with-Inspection-StationsTH

HEIDENHAIN now offers a new EIB 742 external interface box for precise position measurement. It is a network-capable measuring solution that removes the requirement of a PC interface card that is usually necessary when connecting measurement apparatus to an industrial PC or laptop. The EIB 742 is ideal for inspection stations and multipoint inspection apparatuses […]

Filed Under: PC-based Oscilloscopes - PCO, PC-based Test Equipment, Test Equipment Tagged With: HEIDENHAIN

Instrument Measures Device Characteristics to 1500 A/10 kV

May 2, 2012 By Test and Measurement Editor Leave a Comment

The B1505A Power Device Analyzer/Curve Tracer significantly increases its voltage and current range to cover all devices in today’s fast-growing power-device market. These enhancements make it an evaluation solution to accurately and efficiently measure a device’s characteristics from sub-pA up to 10 kV/1500 A, with a fast pulse down to 10 microseconds. The B1505AP, a […]

Filed Under: Communication Test, New Articles, PC-based Test Equipment, Test Equipment Tagged With: Agilent Technologies

Agilent Announces Test Software for Altair Semiconductor Chipset

March 12, 2012 By Test and Measurement Editor Leave a Comment

agilent-software-platform

Agilent Technologies Inc. (NYSE: A) announced a new application based on its N7300 series chipset software platform. The Agilent N7304A-2, used with the company’s EXT wireless communications test set, was created in collaboration with Altair Semiconductor and optimized for high-volume manufacturing test for equipment based on Altair’s FourGee 3100/6200 TDD/FDD LTE chipset. The N7304A-2, a […]

Filed Under: Communication Test, New Articles, PC-based Test Equipment, Test Equipment Tagged With: Agilent, altair semiconductor, LTE, test software

Multichannel Analyzer for LTE, LTE-Advanced on Next-Gen Antennas, Base Stations, Handsets

February 14, 2012 By Test and Measurement Editor Leave a Comment

Agilent Technologies Inc. (NYSE: A) today introduced industry-leading enhancements to its N7109A multi-channel signal analyzer for emerging multichannel LTE, LTE-Advanced and MIMO RF measurement requirements, including LTE antenna beamforming and LTE-Advanced carrier aggregation. Building on the N7109A’s strengths for WiMAXTM and LTE MIMO measurements, these new enhancements enable designers to stay one step ahead of […]

Filed Under: Communication Test, New Articles, PC-based Test Equipment, Test Equipment Tagged With: Agilent, Agilent Technologies, LTE, LTE-advanced, multichannel, RF, Signal Analyzer, Signal Tester

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