• Skip to primary navigation
  • Skip to main content
  • Skip to primary sidebar
  • Skip to footer
  • Advertise
  • Subscribe

Test & Measurement Tips

Oscilloscopes, electronics engineering industry news, how-to EE articles and electronics resources

  • Oscilloscopes
    • Analog Oscilloscope
    • Digital Oscilloscope
    • Handheld Oscilloscope
    • Mixed-signal Oscilloscope
    • PC-based Oscilloscopes – PCO
  • Design
  • Calibration
  • Meters & Testers
  • Test Equipment
  • Learn
    • eBooks/Tech Tips
    • FAQs
    • EE Training Days
    • Learning Center
    • Tech Toolboxes
    • Webinars & Digital Events
  • Video
    • EE Videos
    • Teardown Videos
  • Resources
    • Design Guide Library
    • Digital Issues
    • Engineering Diversity & Inclusion
    • Leap Awards
    • White Papers
  • Subscribe
You are here: Home / Calibration / DAQ Modules With Integrated Signal Conditioning On NI’s PXI Express

DAQ Modules With Integrated Signal Conditioning On NI’s PXI Express

May 26, 2010 By Test and Measurement Editor Leave a Comment

SC Express – New High-Performance Sensor Measurements on the PXI Platform for National InstrumentsNational Instruments announced the company’s first data acquisition (DAQ) modules with integrated signal conditioning for scalable, high-performance measurements on PXI Express. The new NI SC Express family delivers increased accuracy, high data throughput and best-in-class synchronization for measuring strain gauges, bridge-based transducers, thermocouples and high-voltage analog inputs. PXI Express provides 250 MB/s of dedicated bandwidth for each SC Express module in the chassis, which helps engineers increase channel count without compromising sampling rates or data throughput. With a smaller footprint, simplified cable management and new software features for automatic synchronization, the SC Express modules make it easy for engineers to set up and program high-channel-count sensor measurement systems.

The NI PXIe-4330 24-bit simultaneous bridge input module offers 0.02 percent accuracy and 25 kS/s per channel sample rate for high-performance strain, load, force and torque measurements. The bridge input module achieves high accuracy with a ratiometric design where the ADC references the excitation voltage. This approach removes the measurement’s dependence on the stability and accuracy of the excitation voltage. In addition, unique delta-sigma ADCs provide both excellent AC performance as well as DC accuracy, while traditional delta-sigma ADCs only offer AC performance.

SC Express with mother boardThe NI PXIe-4330 bridge input module can perform quarter, half and full bridge-based measurements with automatic synchronization features. The included driver software ensures tight synchronization across multiple modules and chassis with inter-channel skews as low as 5 ppb. The 8-channel bridge input module can scale to a 136-channel system in a single chassis and thousands of channels when synchronizing across multiple chassis. The high-accuracy, simultaneity and synchronization features make the NI PXIe-4330 module ideal for high-channel-count structural test applications, such as wind tunnels, bridge monitoring and crash tests.

With the NI PXIe-4353 thermocouple module, engineers can measure temperatures with 0.30 degrees C accuracy on 32 channels. The isothermal terminal block minimizes error with a unique design that optimizes thermal conductivity, making it possible for the nearby cold-junction compensation (CJC) thermistors to accurately measure at the thermocouple junctions. The 32-channel thermocouple module can scale to a 544-channel system in a single chassis and thousands of channels when synchronizing across multiple chassis. The increased accuracy and scalable platform make the NI PXIe-4353 module well-suited for precision measurements from a single channel to large systems for applications such as fuel cell testing and monitoring thermal chambers.

SC express next to a desktop computer monitorThe NI PXIe-4300 high-voltage isolated analog input module is the first analog input module from National Instruments that can measure up to 300 V with simultaneous sampling. With a 16-bit ADC per channel and a 250 kS/s per channel sampling rate, the NI PXIe-4300 module can stream 4 MB/s per module and 68 MB/s in a single chassis. This 8-channel analog input module can scale to a 136-channel system in a single chassis and thousands of channels when synchronizing across multiple chassis. The ability to measure 300 V with CAT II channel-to-channel isolation makes the NI PXIe-4300 module ideal for automotive testing, such as fuel cell and battery tests.

The new SC Express modules include NI-DAQmx driver software and support for multi-device tasks, a new feature of NI-DAQmx that helps engineers easily synchronize multiple modules. The same code that acquires data from one module can synchronize up to 17 modules in a chassis. The modules work with a variety of NI hardware including NI X Series, dynamic signal acquisition (DSA) and NI SCXI products, and more than 1,500 types of I/O available on the PXI platform. The new modules also integrate with NI software including NI LabVIEW and the LabVIEW Real-Time Module, NI-Sync and NI DIAdem.

www.ni.com

Filed Under: Calibration, data acquisition Tagged With: National Instruments

Reader Interactions

Leave a Reply Cancel reply

You must be logged in to post a comment.

Primary Sidebar

Featured Contributions

Why engineers need IC ESD and TLP data

Verify, test, and troubleshoot 5G Wi-Fi FWA gateways

How to build and manage a top-notch test team

How to use remote sensing for DC programmable power supplies

The factors of accurate measurements

More Featured Contributions

EE TECH TOOLBOX

“ee
Tech Toolbox: Connectivity
AI and high-performance computing demand interconnects that can handle massive data throughput without bottlenecks. This Tech Toolbox explores the connector technologies enabling ML systems, from high-speed board-to-board and PCIe interfaces to in-package optical interconnects and twin-axial assemblies.

EE TRAINING CENTER

EE Learning Center
“test
EXPAND YOUR KNOWLEDGE AND STAY CONNECTED
Get the latest info on technologies, tools and strategies for EE professionals.
bills blog

RSS Current Electro-Tech-Online.com Discussions

  • analog logic of shmidt trigger bjt circuit
  • Sine wave distortion
  • Expensive hobby
  • renewed interest in old project I call it WICKED 8
  • Unable To Get Advertised Op-Amp Slew Rate

Footer

EE World Online Network

  • 5G Technology World
  • EE World Online
  • Engineers Garage
  • Analog IC Tips
  • Battery Power Tips
  • Connector Tips
  • EDA Board Forums
  • Electro Tech Online Forums
  • EV Engineering
  • Microcontroller Tips
  • Power Electronic Tips
  • Sensor Tips

Test & Measurement Tips

  • Subscribe to our newsletter
  • Advertise with us
  • Contact us
  • About us

Copyright © 2026 · WTWH Media LLC and its licensors. All rights reserved.
The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media.

Privacy Policy