• Skip to primary navigation
  • Skip to main content
  • Skip to primary sidebar
  • Skip to footer
  • Advertise
  • Subscribe

Test & Measurement Tips

Oscilloscopes, electronics engineering industry news, how-to EE articles and electronics resources

  • Oscilloscopes
    • Analog Oscilloscope
    • Digital Oscilloscope
    • Handheld Oscilloscope
    • Mixed-signal Oscilloscope
    • PC-based Oscilloscopes – PCO
  • Design
  • Calibration
  • Meters & Testers
  • Test Equipment
  • Learn
    • eBooks/Tech Tips
    • FAQs
    • EE Training Days
    • Learning Center
    • Tech Toolboxes
    • Webinars & Digital Events
  • Video
    • EE Videos
    • Teardown Videos
  • Resources
    • Design Guide Library
    • Digital Issues
    • Engineering Diversity & Inclusion
    • Leap Awards
    • White Papers
  • Subscribe
You are here: Home / Analyzer / vector network analyzer / How to determine noise figure: part 3

How to determine noise figure: part 3

November 21, 2024 By Rick Nelson Leave a Comment

Noise factor and noise figure as defined in an IEEE standard can be derived from a two-port device’s equivalent noise temperature.

In part 1 and part 2 of this series we discussed several ways to indicate the noise performance of a device under test (DUT). We first introduced the concept of noise factor based on the work of Danish-American radio engineer Harald Friis. We’ll call this noise factor FSNR, because it equals a DUT’s input signal-to-noise ratio (SNR) divided by the output SNR:

where SIN, SOUT, NIN, and NOUT are the input and output signal levels and the input and output noise levels, respectively.

We also noted that noise figure (NF) is generally expressed in decibels:

where SIN(dB) , SOUT(dB) , NIN(dB) , and NOUT(dB) are the input and output signal and noise levels in decibels.

Then we introduced a noise factor based on temperature. We’ll call that one FSTD because it’s defined in a standard developed by the IRE, a precursor to the IEEE:

Here, NADD is the noise added by the DUT, G is the DUT gain, k is Boltzmann’s constant, and B is the measurement bandwidth. The corresponding noise figure is commonly expressed in dB:

Finally, we introduced a parameter called equivalent noise temperature:

So that’s basically three parameters for describing noise performance, two of which can be expressed in either linear or decibel terms. Why so many, and can we convert between them?
Before answering that question, let’s take a closer look at noise temperature. We described it in terms of mimicking the power output of a noise source (Figure 1a) using a resistor held at a fixed temperature TE (Figure 1b), as shown in Eq. 5.

Figure 1. A noise source generates a noise power NADD (a), which equals the same noise power a resistor would generate when maintained at the equivalent noise temperature TE (b).

By the way, what might be a typical value for TE?
Let’s say our noise source in Figure 1a is adding a modest -160 dBm of noise in a 1-Hz bandwidth, which is equivalent to NADD equaling 100 × 10-21 W. We know that Boltzmann’s constant is 1.38 × 10-23 Joules/Kelvin, or 1.38 × 10-23 watt-seconds/Kelvin, so we can calculate TE as follows:

So we are pretty close to 6,000°C, and you can see why we might buy a commercial noise source rather than just using a resistor we have lying around. But to get back to your earlier question, can we convert between TE and noise factor? The short answer, based on Eq. 5, is no. After all, noise factors and noise figures are based on gains or input and output SNRs. Since the noise source in Figure 1a is a single-port network, the concept of a ratio of input to output SNRs makes no sense.

Can we extend the noise-temperature concept to two-port networks?
Yes. Figure 2a shows a resistor maintained at reference temperature T0= 290 K driving a power amplifier with gain G. The resistor generates a noise power of kT0B. The amplifier amplifies kT0B byG and adds its own noise contributionNAD, with the total amplifier output equaling NADD + kT0BG, as shown by the ideal power sensor and meter #1. Figure 2b shows a similar setup but with an ideal amplifier that contributes no noise of its own. To compensate, we increase the temperature of resistor R by TE, resulting in the power-meter reading for power meter #2 in Figure 2b of k(T0 + TE)BG, where TE represents the equivalent noise temperature of the two-port real-world amplifier in Figure 2a.

Figure 2. A real-world amplifier contributes a noise power NADD, (a), which can be mimicked by raising the temperature of resistor R by TE (b).

We want the numerical readings to be the same for both power meters, so we equate the algebraic expressions for each and then solve for TE:

We can now relate noise temperature and the standard noise factor by substituting Eq. 6 into Eq. 3:

We can then solve Eq. 7 for TE to obtain TE as a function of FSTD:

What about FSNR?
We’ll take a look at that in part 4, available December 1, 2024.

For further reading
IRE Standards on Methods of Measuring Noise in Linear Two ports, 1959 (IEEEXplore)

Related EE World content
The difference between electronic distortion and noise
Attenuation networks and their measurement
Choosing the right amplifier
Understanding decibels and decibel measurements
The Difference between linear amplitude and decibel amplitude
The difference between amplifier gain and antenna gain

You may also like:


  • How to determine noise figure: part 4

  • How to determine noise figure: part 2

  • How to determine noise figure: part 1

  • How can I quantify a device’s nonlinearity? part 2

  • The difference between electronic distortion and noise
  • amplifiers
    Choosing the right amplifier
  • attenuators
    Attenuation networks and their measurement

Filed Under: arbitrary waveform generators, FAQ, Featured, vector network analyzer, vector network analyzers Tagged With: FAQ

Reader Interactions

Leave a Reply Cancel reply

You must be logged in to post a comment.

Primary Sidebar

Featured Contributions

Why engineers need IC ESD and TLP data

Verify, test, and troubleshoot 5G Wi-Fi FWA gateways

How to build and manage a top-notch test team

How to use remote sensing for DC programmable power supplies

The factors of accurate measurements

More Featured Contributions

EE TECH TOOLBOX

“ee
Tech Toolbox: Internet of Things
Explore practical strategies for minimizing attack surfaces, managing memory efficiently, and securing firmware. Download now to ensure your IoT implementations remain secure, efficient, and future-ready.

EE TRAINING CENTER

EE Learning Center

EE ENGINEERING TRAINING DAYS

engineering
“test
EXPAND YOUR KNOWLEDGE AND STAY CONNECTED
Get the latest info on technologies, tools and strategies for EE professionals.
“bills

RSS Current EDABoard.com discussions

  • Colpitts oscillator
  • How to best test Electrolytic capacitors for premature failure reduced life?
  • Core loss in output inductor of 500W Two Transistor forward?
  • Disappearing clock
  • GanFet power switch starts burning after 20 sec

RSS Current Electro-Tech-Online.com Discussions

  • Can I use this charger in every country?
  • LED circuit for 1/6 scale diorama
  • Electronic board faulty?!?
  • using a RTC in SF basic
  • An Update On Tarrifs
Search Millions of Parts from Thousands of Suppliers.

Search Now!
design fast globle

Footer

EE World Online Network

  • 5G Technology World
  • EE World Online
  • Engineers Garage
  • Analog IC Tips
  • Battery Power Tips
  • Connector Tips
  • DesignFast
  • EDA Board Forums
  • Electro Tech Online Forums
  • EV Engineering
  • Microcontroller Tips
  • Power Electronic Tips
  • Sensor Tips

Test & Measurement Tips

  • Subscribe to our newsletter
  • Advertise with us
  • Contact us
  • About us

Copyright © 2025 · WTWH Media LLC and its licensors. All rights reserved.
The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media.

Privacy Policy