Rohde & Schwarz (www.rohde-schwarz.com), one of the leading independent manufacturers of test and measurement equipment of mobile radios and radio communications, was given the opportunity to present to the US audience of the Embedded System Conference (ESC) Silicon Valley the digital-triggering capability of its R&S RTO oscilloscopes lineup.
Introduced in June 2010, the company’s family of oscilloscopes optimizes product performance and productivity when debugging embedded systems, according Mike Schnecker, Business Development Manager at Rohde & Schwarz.
He noted that the scope’s digital trigger utilizes a common signal path for both the acquired and triggered data, which effectively eliminates amplitude and time offset between signal and trigger, displaying signals with minimal trigger jitter.
“Triggering in the digital domain has significant benefits,” Mr. Schnecker said.
“For example, analog triggers have significant trigger jitter because the analog trigger and signal-acquisition paths run in parallel. As each path has different characteristics, the signal is displayed with time and amplitude offset relative to the actual trigger point. Even the most sophisticated post-processing can only partially compensate for the inevitable resulting measurement inaccuracy of this approach.”
Analog triggers usually have a long re-arm cycle, during which a device cannot react to trigger events, said Mr. Schnecker.
He added that R&S RTO oscilloscopes provide an integrated decode and trigger feature that enable users to trigger on protocol-specific features and view the waveforms captured in ASCII, binary or HEX formats. The scope’s decode and trigger feature supports I2C, SPI, LIN, CAN and RS-232 interfaces.
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