SemiProbe (www.semiprobe.com) has expanded its modular Probe System for Life (PS4L) portfolio to include a two stage wafer drive system, the M-12 configuration. The new design allows users to move rapidly across huge wafers to effectively position the device by locking down the coarse stage and making fine micrometers adjustment. Its theta and precision Z mechanisms enable users to effortlessly use large pin count probe cards.
“The new design allows unique 300 mm capabilities as well as economical field upgrades to 450 mm, manual or semiautomatic, when the industry moves to the new size wafers. No other manual 300 mm system in the world has this field upgrade capability,” said Mostafa Daoudi, VP of Engineering at SemiProbe.
The company also offers manual probers another pioneering option, the wafer map system. Developed in response to the industries continuous drive to save time and money, the new design allows users to easily locate a particular device on large scale wafers. The new option enhances the functionality of the system, as it enables users to record the results of the test to the wafer map and export them to other systems downstream.
The company also offers semiautomatic and manual probe systems for various test applications such as electrical and non-electrical characterization of devices utilizing unique measurement and simulation capabilities. With the PS4L platform’s flexibility, users can modify their systems to meet the varying needs of their test procedures and test structures. SemiProbe’s ability to deliver custom configurations with innovative capabilities distinguishes itself from comparable companies requiring custom designs as well as the associated NRE. Its patented PS4L system continuously gain widespread acceptance in bridging the gap to production test while meeting the flexibility needs of research and development.
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