Siemens Digital Industries Software announced Tessent IJTAG Pro software, which will transform IJTAG (IEEE 1687) input/output by enabling parallel operations of the traditionally serial operation and providing read and write access to custom hardware. The new software introduces high-bandwidth internal JTAG (IJTAG) and generic data streaming functionality to help customers reduce test cost and time by accelerating data using the wide bus of Siemens’ Tessent Streaming Scan Network (SSN) software.
The semiconductor industry is facing an unprecedented and accelerated evolution as transistor density expands across multiple dimensions. As semiconductor designs advance from 2D to 2.5D to full 3D IC architectures, design testing challenges have multiplied exponentially. The escalating test pattern counts, longer pattern application times, high ATE (Automatic Test Equipment) costs, and limited number of test pins accessibility mean that optimizing existing infrastructure for test scaling is not just crucial but imperative for maintaining a competitive edge in the design process.
The combination of the features in IJTAG Pro, along with the recent announcement of Siemens’ Tessent AnalogTest software marks a significant expansion of capabilities and bandwidth.
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