This year’s OFC in San Francisco featured one thing, or so it seemed: 1.6T. Every company making optical modules was showing them lest they be left behind in the always accelerating data rate race. As with any emerging technology, test equipment must lead the way. After all, how do you know if anything works unless […]
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How to determine noise figure: part 4
Two incompatible definitions of noise factor can lead to confusion, which you can alleviate by understanding where the differences lie.
IMS 2024 roundup: test equipment
Washington, DC — The 2024 International Microwave Symposium took place here in June at the Walter E. Washington Convention Center. As always, RF/microwave/mmWave test equipment was all over the exhibit hall. Frequency-domain test equipment — spectrum analyzers, vector network analyzers, power meters, and signal generators — were, of course, dominant. Other equipment, such as oscilloscopes […]
OFC 2024: Test equipment
Before those 800G links can operate, they need testing. San Diego — The 2024 Optical Fiber Communications Conference (OFC) took place here from March 25 to 28. While companies highlighting their optical transceiver modules, semiconductors, and network equipment all touted how they support AI and data centers, none of that happens without test equipment. Optical […]
AOC 2023: Exhibits show the latest in military wireless
Washington — The Association of Old Crows (AOC) held its 60th annual convention in Washington during the week of December 11, 2023. EE World was there on December 12. Here is some of what we saw in the exhibit hall. AOC is a defense-oriented conference that focuses on military wireless communications. In addition to product […]
IMS 2023 roundup: test equipment
Test equipment plays a major role in product development and production, which was apparent at IMS 2023. In the photos and videos below, you’ll get a taste of test developments at RF, mmWave, and sub-THz frequencies. This year, D-band (110 GHz to 170 GHz) seized a larger portion of the exhibit hall than in past […]
What is jitter and what can I do about it (part 2 of 2)?
Operations on acquired jitter data help quantify jitter values. Part 1 of this article described the oscilloscope eye diagram and unit interval (UI) and focused on a single ideal rising edge with 28 additional edges representing some degree of jitter (Figure 1). We determined the peak-to-peak jitter to be 15 ps, based on the edges […]
What is de-embedding and how do I perform it (part 2)?
When testing a device in a fixture, you can use transfer scattering parameters (T-parameters) to help remove the fixture’s contribution from your measurement result.
5G radios increase emphasis on compliance testing
Compared to 4G and previous generations, 5G’s mmWave frequencies and tight integration increase the complexity of both performance and regulator compliance testing.
Test software helps evaluate C-V2X PC5 communications technology
The LTE C-V2X PC5 Communications Software MX725000A provides engineers with a cost-efficient tool to evaluate products and systems utilizing PC5 of Cellular V2X (C-V2X) technology. The software links a communications reference module, V2X emulator software, and GNSS simulator to support evaluation of vehicle-to-everything (V2X) PC5 communications used in emerging vehicle-to-vehicle (V2V) and vehicle-to-infrastructure (V2I) designs. […]
