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FAQ

Understanding ADC specs and architectures: part 4

May 28, 2025 By Rick Nelson Leave a Comment

The AC performance of an analog-to-digital converter depends on its architecture. In part 3 of this series, we discussed the integral nonlinearity (INL) error of an analog-to-digital converter (ADC), noting that gain, offset, and INL error all contribute to the total unadjusted error. This metric provides an overall view of an ADC’s DC performance. Q: What about the AC […]

Filed Under: data acquisition, data recorders, FAQ, Featured Tagged With: FAQ

Understanding ADC specs and architectures: part 3

May 21, 2025 By Rick Nelson Leave a Comment

Integral nonlinearity tracks the cumulative effects of an ADC’s differential nonlinearity. In part 2 of this series, we discussed several sources of error in an analog-to-digital converter (ADC), including gain, offset, missing-code error, and differential nonlinearity (DNL). We concluded with an illustration of a waveform with varying levels of DNL superimposed on the staircase representing […]

Filed Under: data recorders, FAQ, Featured Tagged With: FAQ

Understanding ADC specs and architectures: part 2

May 7, 2025 By Rick Nelson Leave a Comment

Specifications such as gain error, offset error, and differential nonlinearity help define an analog-to-digital converter’s performance. In part 1 of this series, we discussed an ideal analog-to-digital converter (ADC), noting that it would have infinite resolution and bandwidth. Then we looked at the real world of practical inverters and how their resolution, expressed in a […]

Filed Under: FAQ, Featured Tagged With: FAQ

Understanding ADC specs and architectures: part 1

April 30, 2025 By Rick Nelson Leave a Comment

Analog-to-digital converters are the heart of most test equipment, setting the stage for the digital processing of analog signals. Several posts over the past year or so have involved digital signal processing. For example, we have covered the fast Fourier transform (FFT), the inverse FFT, and discrete convolution. To perform these operations on real-world signals, […]

Filed Under: FAQ, Featured Tagged With: FAQ

Review: Micsig TO3004 tablet oscilloscope

March 26, 2025 By Kenneth Wyatt Leave a Comment

If you’re looking for a portable oscilloscope for field troubleshooting or for demonstrations, look at the Micsig TO series. Here’s my take on the four-channel 300 MHz variant, TO3004. The Micsig TO3004 oscilloscope (Figure 1) is an 8-bit, four-channel, tablet-sized portable oscilloscope that’s also available with 100 MHz and 200 MHz varieties with two or […]

Filed Under: Digital Oscilloscope, Digital Storage Oscilloscope, FAQ, Featured, Oscilloscopes, scope probes and accessories Tagged With: FAQ, micsig, Saelig

How to use convolution to implement filters: part 4

March 19, 2025 By Rick Nelson Leave a Comment

A windowed sinc function can implement a low-pass filter, and a two-dimensional convolutional filter can blur or sharpen images. In part 3 of this series, we introduced a low-pass filter based on the Sinc function and described the need for windowing to compensate for sampling and truncation. Q: How can we apply this filter? A: […]

Filed Under: FAQ, Featured Tagged With: FAQ

Why engineers need IC ESD and TLP data

March 17, 2025 By Jeffrey C. Dunnihoo, Pragma Design Leave a Comment

Design Engineers need ESD and TLP characterization data to make informed decisions to design robust circuits and systems. Engineers often review semiconductor data among several manufacturers when designing a circuit or system. While two or more ICs may perform satisfactorily under normal operating conditions, they may not perform the same under extreme conditions, such as […]

Filed Under: EMI/EMC/RFI, FAQ, Featured, Featured Contributions, semiconductor test Tagged With: FAQ

What is bit jitter, and what are its component jitters?

January 29, 2025 By Jeff Shepard Leave a Comment

Bit jitter can be a problem. A digital data stream is composed of a series of rapidly changing “ones” and “zeros.” Bit jitter can make it difficult to tell the difference and result in data errors. This article begins by defining jitter, then looks at its component jitters, compares bit jitter with clock jitter, considers […]

Filed Under: FAQ, Featured Tagged With: FAQ

How to calculate and apply the inverse discrete Fourier transform: part 4

January 22, 2025 By Rick Nelson Leave a Comment

In part 3 of this series, we used the inverse fast Fourier transform (IFFT) to create 100-Hz time-domain waveforms of various amplitudes and phases. We can also use the IFFT to create waveforms containing multiple frequencies. If you look closely at Figure 1 in part 1 of this series, you’ll notice that the time-domain waveform […]

Filed Under: Analyzer, FAQ, Featured, oscilloscope measurements, spectrum analyzer Tagged With: FAQ

How to calculate and apply the inverse discrete Fourier transform: part 3

January 15, 2025 By Rick Nelson Leave a Comment

The inverse transform can create a time-domain waveform where no waveform has been before. In part 2 of this series, we used the discrete Fourier transform to convert a waveform from the time domain to the frequency domain, operated on the frequency-domain data, and used the inverse transform to reconstruct the altered time-domain waveform. That’s […]

Filed Under: Analyzer, FAQ, Featured, oscilloscope measurements, spectrum analyzer Tagged With: FAQ

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