Keithley Instruments announces the first benchtop Source Measure Unit (SMU) instrument with a capacitive touchscreen graphical user interface. The Model 2450 SourceMeter SMU Instrument combines the intuitive touchscreen and icon-based control that novice SMU users can appreciate with the exceptional versatility that experienced users need to learn faster, work smarter, and invent easier. This new […]
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Keithley Adds High Power Wafer-Level Testing to Automated Characterization Suite Software
Keithley Instruments announces enhancements to its Automated Characterization Suite (ACS) software that support its expanding family of high power semiconductor characterization solutions. The ACS package is optimized for automated wafer-level parameter test applications, including automated characterization, reliability analysis, and known good die testing. The ACS V5.0 update specifically leverages the high power capabilities of Keithley’s […]
Keithley’s SourceMeter® named one of EDN’s 2012 Hot 100 Products
Keithley Instruments, Inc. announced that the editors of EDN Magazine have named the Model 2657A High Power System SourceMeter instrument as one of the “100 Hot Products of 2012.” The 2012 EDN Hot 100 highlights the electronics industry’s most significant products of the year based on innovation, significance, usefulness, and popularity as determined by the […]
Mouser and Keithley Instruments Announce Distributor Partnership
Mouser Electronics, Inc. has added Keithley Instruments, Inc. to its line-up of precision test instruments. Keithley’s products include electrical test instruments and data acquisition products that measure low levels of voltage, resistance, current, capacitance, and charge. Keithley also offers complete system solutions for high volume production and assembly testing. Mouser is stocking a wide range […]