• Skip to primary navigation
  • Skip to main content
  • Skip to primary sidebar
  • Skip to footer
  • Advertise
  • Subscribe

Test & Measurement Tips

Oscilloscopes, electronics engineering industry news, how-to EE articles and electronics resources

  • Oscilloscopes
    • Analog Oscilloscope
    • Digital Oscilloscope
    • Handheld Oscilloscope
    • Mixed-signal Oscilloscope
    • PC-based Oscilloscopes – PCO
  • Design
  • Calibration
  • Meters & Testers
  • Test Equipment
  • Learn
    • eBooks/Tech Tips
    • FAQs
    • EE Training Days
    • Learning Center
    • Tech Toolboxes
    • Webinars & Digital Events
  • Video
    • EE Videos
    • Teardown Videos
  • Resources
    • Design Guide Library
    • Digital Issues
    • Engineering Diversity & Inclusion
    • Leap Awards
    • White Papers
  • Subscribe

KEYENCE

Keyence to release next-generation coordinate measuring machine

August 26, 2015 By Test and Measurement Editor 1 Comment

KEYENCE will release the XM Series handheld probe coordinate measuring machine on September 1st, 2015. Conventional coordinate measuring machines require difficult installation, a controlled environment, and dedicated programmers. The XM Series is easily installed in any environment and allows any operator to perform intuitive 3D measurements with high accuracy. To overcome various challenges with conventional […]

Filed Under: Coordinate Measuring Machine, New Articles Tagged With: KEYENCE

New Digital Microscope Eliminates Need for Focus Adjustment

May 7, 2014 By WTWH Editor Leave a Comment

By integrating the most recent advancements in optical and digital technologies, the VHX-5000 Digital Microscope is able to instantly capture any area in complete focus – without the need for the user to adjust focus. The VHX Series was designed to overcome the limitations of traditional optical microscopes by providing high-resolution, large depth-of-field imaging and […]

Filed Under: Instrumentation, Machine Vision/Inspection Tagged With: cmoscamera, highresolution, KEYENCE, microscope

Keyence America, Analyzing Metal Polymer Bearings

October 2, 2013 By Test and Measurement Editor Leave a Comment

Keyence-America,-Analyzing-metal-polymer-bearingsTH

GGB continually strives to offer the best solutions for its customers. To support its product development, its R&D departments in France, Germany and the US have each invested in a VHX-1000 to obtain better 3D visualizations of their product under high magnification. The Keyence VHX-1000 digital microscope enables us to do things we were unable […]

Filed Under: Test Equipment Tagged With: KEYENCE

Keyence VR 3000 series includes one-shot 3D measuring macroscope

June 13, 2013 By Test and Measurement Editor Leave a Comment

Keyence has combined the optical design of their digital microscopes with the high-speed, high-accuracy measurement and 3D technology of their displacement gauges, to develop a macroscope that completes instant 3D measurements. The VR-3000 Series, One-Shot 3D Measuring Macroscope enables users to instantly perform accurate and repeatable non-contact profiles and measurements over a wide area. The […]

Filed Under: Coordinate Measuring Machine, Test Equipment Tagged With: KEYENCE

All-in-One Microscope for Advanced Imaging, Recording and Measurement

June 11, 2013 By Test and Measurement Editor Leave a Comment

Building on its extensive microscope lineup, KEYENCE Corporation has released a new multipurpose microscope.  The VHX-700F allows users to leverage some of the advanced functions of the VHX Series, such as Depth Composition and 3D Display, while offering the same image quality and primary measurement capabilities at a lower price point. The VHX-700F incorporates observation, […]

Filed Under: Machine Vision/Inspection Tagged With: KEYENCE

KEYENCE’s High-Speed 3D Laser Scanner

December 20, 2012 By Test and Measurement Editor Leave a Comment

LJ-V7000-1

The LJ-V7000 Series, High-Speed Laser Scanner, sets a new standard for speed and precision in 3D laser measurement. In addition to a wide range of heads that provide scan areas as wide as 9.45 inches (240 mm) and Z-axis repeatability as high as 20 millionths of an inch (0.4 µm), the LJ-V7000 Series provides an […]

Filed Under: Test Equipment Tagged With: KEYENCE

Primary Sidebar

Featured Contributions

Why engineers need IC ESD and TLP data

Verify, test, and troubleshoot 5G Wi-Fi FWA gateways

How to build and manage a top-notch test team

How to use remote sensing for DC programmable power supplies

The factors of accurate measurements

More Featured Contributions

EE TECH TOOLBOX

“ee
Tech Toolbox: Power Efficiency
Discover proven strategies for power conversion, wide bandgap devices, and motor control — balancing performance, cost, and sustainability across industrial, automotive, and IoT systems.

EE TRAINING CENTER

EE Learning Center
“test
EXPAND YOUR KNOWLEDGE AND STAY CONNECTED
Get the latest info on technologies, tools and strategies for EE professionals.
bills blog

RSS Current Electro-Tech-Online.com Discussions

  • Measuring controller current output with a meter
  • KiCad custom symbol definition correct approach
  • restarting this Christmas project
  • Anyone In The US Ordered From AliExpress Recently?
  • My Advanced Realistic Humanoid Robots Project

Footer

EE World Online Network

  • 5G Technology World
  • EE World Online
  • Engineers Garage
  • Analog IC Tips
  • Battery Power Tips
  • Connector Tips
  • EDA Board Forums
  • Electro Tech Online Forums
  • EV Engineering
  • Microcontroller Tips
  • Power Electronic Tips
  • Sensor Tips

Test & Measurement Tips

  • Subscribe to our newsletter
  • Advertise with us
  • Contact us
  • About us

Copyright © 2025 · WTWH Media LLC and its licensors. All rights reserved.
The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media.

Privacy Policy