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Agilent Announces Test Software for Altair Semiconductor Chipset

March 12, 2012 By Test and Measurement Editor Leave a Comment

agilent-software-platform

Agilent Technologies Inc. (NYSE: A) announced a new application based on its N7300 series chipset software platform. The Agilent N7304A-2, used with the company’s EXT wireless communications test set, was created in collaboration with Altair Semiconductor and optimized for high-volume manufacturing test for equipment based on Altair’s FourGee 3100/6200 TDD/FDD LTE chipset. The N7304A-2, a […]

Filed Under: Communication Test, New Articles, PC-based Test Equipment, Test Equipment Tagged With: Agilent, altair semiconductor, LTE, test software

Fast 16-bit digital-to-analog converter at 1.5 GSPS

March 6, 2012 By Test and Measurement Editor Leave a Comment

Texas Instruments Incorporated (TI) (NASDAQ: TXN) introduced a new 16-bit digital-to-analog converter (DAC). The quad DAC34SH84 is 50-percent faster and uses 50-percent less power than the closest 16-bit DAC alternative, clocking in at 1.5 GSPS and consuming just 362 mW per channel. The DAC34SH84 provides an easy, pin-compatible upgrade from the 1.25-GSPS DAC34H84 for customers wanting […]

Filed Under: Design, New Articles Tagged With: 3G, DAC, DAC34SH84, digital-to-analog converter, GSM, LTE, TI

Multichannel Analyzer for LTE, LTE-Advanced on Next-Gen Antennas, Base Stations, Handsets

February 14, 2012 By Test and Measurement Editor Leave a Comment

Agilent Technologies Inc. (NYSE: A) today introduced industry-leading enhancements to its N7109A multi-channel signal analyzer for emerging multichannel LTE, LTE-Advanced and MIMO RF measurement requirements, including LTE antenna beamforming and LTE-Advanced carrier aggregation. Building on the N7109A’s strengths for WiMAXTM and LTE MIMO measurements, these new enhancements enable designers to stay one step ahead of […]

Filed Under: Communication Test, New Articles, PC-based Test Equipment, Test Equipment Tagged With: Agilent, Agilent Technologies, LTE, LTE-advanced, multichannel, RF, Signal Analyzer, Signal Tester

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