Four finalists were announced Friday for the inaugural LEAP Awards’ Test & Measurement Category, comprising a broad array of new advances in instrumentation technology. The competition was scored by a panel of independent technical/engineering judges. This year’s inaugural LEAP Awards competition honored ground-breaking new products that set a new standard for innovation. Judges rated candidates […]
Direct comm between Tessent DFT software and Teradyne testers accelerates silicon bring-up
ATE-Connect technology is now hosted in Tessent SiliconInsight product for IC debug and bring-up. The ATE-Connect technology creates an industry-standard interface to eliminate communication barriers between proprietary, tester-specific software and design-for-test (DFT) platforms. The new technology accelerates debug of IJTAG devices, helps speed up product ramps, and reduces time-to-market for products in 5G wireless communications, […]
A new way to test power electronics modules
by John Isaac, Director of Marketing Programs, Mentor Grahpics Corporation A new method for characteristic measurement and reliability testing of thermally sensitive power electronics modules is more efficient and gets to the problem quicker. With the focus on energy savings, there is a rapidly increasing emphasis on power electronics modules used in reusable energy applications, […]
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