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Multi-gigabit serial protocols demystified

December 6, 2016 By Lee Teschler Leave a Comment

Chris Nunn, National Instruments Corp. High-speed serial is a growing technology aimed at reducing device footprint and boosting data communication rates. We have seen a drastic change in digital communication buses shifting from parallel to serial formats starting in the early 2000s. The transition from parallel buses to high-speed serial buses has led to many […]

Filed Under: data acquisition, New Articles Tagged With: National Instruments

End of an era at National Instruments: Dr. James Truchard, CEO and co-founder, to step down

August 30, 2016 By Lee Teschler Leave a Comment

labview

National Instruments, best known for its LabVIEW program and platform-based instrumentation systems, says Alex Davern, age 49, will serve as Chief Executive Officer and President, effective January 1, 2017. Davern will succeed Dr. James Truchard, age 73, who has served as the Chief Executive Officer of NI since the company’s founding in 1976. Dr. Truchard […]

Filed Under: Bench Test, Editor's Blog Tagged With: National Instruments

Clever instrumentation plays a role in
growing new human organs

August 5, 2016 By Lee Teschler Leave a Comment

bioreactor

Patients suffering from esophageal cancer may someday get transplants fashioned from their own stem cells, thanks in part to new controller technology that lets researchers grow new human organs. The technology comes from a company called Biostage Inc. The firm has come up with a way to take mesenchymal stem cells from a cancer patient […]

Filed Under: New Articles Tagged With: biostage, National Instruments

ATS for RF, mixed-signal devices uses PXI-based approach

August 19, 2014 By Test and Measurement Editor Leave a Comment

NI-STS-Series-Breakdown-2

NI (Nasdaq: NATI) announced the NI Semiconductor Test System (STS) series. These PXI-based automated test systems reduce test cost for RF and mixed-signal devices by opening access to NI- and industry-offered PXI modules in semiconductor production test environments. Compared to conventional semiconductor automated test equipment (ATE), STS lead users are experiencing reduced production costs and […]

Filed Under: Test and Measurement News, Test Equipment Tagged With: National Instruments

Mobile technology’s influence on data acquisition trend

May 28, 2013 By Test and Measurement Editor Leave a Comment

If there were an overarching theme – Moore’s Law would be it. As DAQ devices have grown more intelligent, these devices can do more than acquire and save data. They can intelligently adapt to conditions and communicate with devices through standard networks (such as WiFi or Ethernet). Mobile devices have become so prolific in our […]

Filed Under: data acquisition Tagged With: National Instruments

Moore’s Law holds true for DAQs

May 21, 2013 By Test and Measurement Editor Leave a Comment

Forty-five yrs ago, Gordon Moore predicted that the number of transistors on an integrated circuit would double every 18 months or so. The approximation predicted that the amounts of processing power will double every 1.5 – 2 years. He also predicted that this trend would last a decade. It continues to hold true. How does […]

Filed Under: data acquisition Tagged With: National Instruments

DAQ Series: Podcast: miniSystems for Engineering Excellence

February 25, 2013 By Test and Measurement Editor 2 Comments

In this DAQ Series, we discuss how DAQs are scaled down for educational purposes. National Instruments is dedicated to teaching engineering fundamentals beyond theory and mathematical applications. Its target is to teach students engineering concepts as a whole. The idea of teaching students hands-on, visual applications came from the suggestions of professors and teachers at […]

Filed Under: data acquisition, Editor's Blog, Featured, Test Equipment Tagged With: National Instruments, NI, podcast

NI PXIe-5667 Receiver Delivers Measurement Performance Challenges

October 31, 2012 By Test and Measurement Editor Leave a Comment

NI-PXIe-5667-spectrum-monitoring-receiver1

National Instruments announced the NI PXIe-5667 spectrum monitoring receiver to address radio monitoring, interference detection, spectrum regulation and related applications in line with ITU recommendations. Coupled with NI FlexRIO and the NI LabVIEW FPGA Module, the NI PXIe-5667 can perform real-time analysis of RF signals such as continuous spectrum monitoring, spectrogram and advanced signal processing […]

Filed Under: Test Equipment Tagged With: National Instruments

NI Releases NI 5791 RF transceiver adapter module for NI FlexRIO

October 31, 2012 By Test and Measurement Editor Leave a Comment

NI-5791-FAM-Receiver2

National Instruments commercially released the NI 5791 RF transceiver adapter module for NI FlexRIO, which is currently being used in multiple cutting-edge research projects on 5G technologies. The module forms a powerful SDR solution when paired with an NI FlexRIO FPGA module for real-time, user-designed processing. Through triggering mechanisms provided by the PXI platform, users […]

Filed Under: data acquisition, Instrumentation, Meters & Testers Tagged With: National Instruments

National Instruments is big on global citizenship

September 18, 2012 By Test and Measurement Editor Leave a Comment

The National Instruments Co. (NI) provides integrated software and hardware to scientists and engineers. Founded in 1976, three college students (James Truchard, PhD, Jeff Kodosky, and Bill Nowlin) developed this technology-based enterprise. The company’s instrumentation hardware and graphical system design software convert standard PCs into industrial automation and test and measurement systems. These “virtual instruments” can […]

Filed Under: Editor's Blog Tagged With: National Instruments

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