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National Instruments

Functional tester covers bench, production, and service applications

March 9, 2023 By Martin Rowe Leave a Comment

Bloomy Controls midUTS

The midUTS from Bloomy contains a multimeter, data-acquisition, switching, and power supplies for testing boards and systems. Automating tests — whether for bench testing new designs, in production, or for service — increases productivity but comes at a price. If you’re going to build an automated test system all yourself, expect to specify the instrumentation, […]

Filed Under: Automation, Bench Test, data acquisition, Featured, Meters & Testers, Power supplies, Test development software Tagged With: Bloomy Controls, National Instruments

Engineer ambitiously or be acquired?

January 18, 2023 By Martin Rowe 1 Comment

Emerson Electric makes a significant offer to acquire NI, which is fighting back.

Filed Under: Featured, Instrumentation, Machine Vision/Inspection, Test Equipment Tagged With: National Instruments

Our second 5G Handbook is now available

May 18, 2022 By Martin Rowe

Featuring 15 articles, the 2022 5G Handbook looks at private networks, timing, connectivity, latency, mmWaves, test, and other topics.

Filed Under: Digital Edition Back Issue Tagged With: Benetel, CEVAdsp, Green Cubes, imec, keysighttechnologies, microchip, Molex, National Instruments, Parallel Wireless, Rakuten Symphony, rohdeschwarz, SiTime, teradyne

NI CEO: COVID-19 on day one

October 14, 2020 By Martin Rowe Leave a Comment

NI CEO Eric Starkloff’s first decision was what to do about COVID-19 the night before he took over on February 1, 2020. Since then, he’s seen the opportunities in communications resulting from the pandemic. How would you like to take on a new leadership role just as a pandemic takes hold? That’s what Eric Starkloff […]

Filed Under: Automation, data acquisition, Instrumentation, PC-based Test Equipment, Sensing, Test and Measurement News, wireless Tagged With: National Instruments

Multi-gigabit serial protocols demystified

December 6, 2016 By Lee Teschler 2 Comments

Chris Nunn, National Instruments Corp. High-speed serial is a growing technology aimed at reducing device footprint and boosting data communication rates. We have seen a drastic change in digital communication buses shifting from parallel to serial formats starting in the early 2000s. The transition from parallel buses to high-speed serial buses has led to many […]

Filed Under: data acquisition, New Articles Tagged With: National Instruments

End of an era at National Instruments: Dr. James Truchard, CEO and co-founder, to step down

August 30, 2016 By Lee Teschler Leave a Comment

labview

National Instruments, best known for its LabVIEW program and platform-based instrumentation systems, says Alex Davern, age 49, will serve as Chief Executive Officer and President, effective January 1, 2017. Davern will succeed Dr. James Truchard, age 73, who has served as the Chief Executive Officer of NI since the company’s founding in 1976. Dr. Truchard […]

Filed Under: Bench Test, Editor's Blog Tagged With: National Instruments

Clever instrumentation plays a role in
growing new human organs

August 5, 2016 By Lee Teschler Leave a Comment

bioreactor

Patients suffering from esophageal cancer may someday get transplants fashioned from their own stem cells, thanks in part to new controller technology that lets researchers grow new human organs. The technology comes from a company called Biostage Inc. The firm has come up with a way to take mesenchymal stem cells from a cancer patient […]

Filed Under: New Articles Tagged With: biostage, National Instruments

ATS for RF, mixed-signal devices uses PXI-based approach

August 19, 2014 By Test and Measurement Editor Leave a Comment

NI-STS-Series-Breakdown-2

NI (Nasdaq: NATI) announced the NI Semiconductor Test System (STS) series. These PXI-based automated test systems reduce test cost for RF and mixed-signal devices by opening access to NI- and industry-offered PXI modules in semiconductor production test environments. Compared to conventional semiconductor automated test equipment (ATE), STS lead users are experiencing reduced production costs and […]

Filed Under: Test and Measurement News, Test Equipment Tagged With: National Instruments

Mobile technology’s influence on data acquisition trend

May 28, 2013 By Test and Measurement Editor Leave a Comment

If there were an overarching theme – Moore’s Law would be it. As DAQ devices have grown more intelligent, these devices can do more than acquire and save data. They can intelligently adapt to conditions and communicate with devices through standard networks (such as WiFi or Ethernet). Mobile devices have become so prolific in our […]

Filed Under: data acquisition Tagged With: National Instruments

Moore’s Law holds true for DAQs

May 21, 2013 By Test and Measurement Editor Leave a Comment

Forty-five yrs ago, Gordon Moore predicted that the number of transistors on an integrated circuit would double every 18 months or so. The approximation predicted that the amounts of processing power will double every 1.5 – 2 years. He also predicted that this trend would last a decade. It continues to hold true. How does […]

Filed Under: data acquisition Tagged With: National Instruments

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