• Skip to primary navigation
  • Skip to main content
  • Skip to primary sidebar
  • Skip to footer
  • Advertise
  • Subscribe

Test & Measurement Tips

Oscilloscopes, electronics engineering industry news, how-to EE articles and electronics resources

  • Oscilloscopes
    • Analog Oscilloscope
    • Digital Oscilloscope
    • Handheld Oscilloscope
    • Mixed-signal Oscilloscope
    • PC-based Oscilloscopes – PCO
  • Design
  • Calibration
  • Meters & Testers
  • Test Equipment
  • Learn
    • eBooks/Tech Tips
    • FAQs
    • EE Training Days
    • Learning Center
    • Tech Toolboxes
    • Webinars & Digital Events
  • Video
    • EE Videos
    • Teardown Videos
  • Resources
    • Design Guide Library
    • Digital Issues
    • Engineering Diversity & Inclusion
    • Leap Awards
    • White Papers
  • Subscribe

NI

USB DAQ system reaches 20-bit resolution

September 18, 2024 By Martin Rowe Leave a Comment

NI mioDAQ

The mioDAQ from NI has two 20-bit and two 16-bit flavors. Analog outputs come with two or four, with 16-bit DIO and counters. USB data-acquisition (DAQ) devices have been on the market for many years and come in many varieties. What makes the mioDAQ series from NI different is its 20-bit vertical resolution on two […]

Filed Under: data acquisition, data recorders Tagged With: nationalinstruments, NI

What is de-embedding and how do I perform it (part 1)?

April 4, 2023 By Rick Nelson Leave a Comment

It’s a tenet of the test-and-measurement industry that you should concentrate on looking for defects in your device under test (DUT) — not in your test equipment. Figure 1 illustrates a common problem. An instrument presents an incorrect reading; in this case, an LRC meter or multimeter presents a resistance reading that’s about 5% low. […]

Filed Under: Bench Test, FAQ, Featured, Meters & Testers, vector network analyzers Tagged With: Ansys, CST, keysight, mathworks, NI

UWB automated tester receives FiRa certification

February 6, 2023 By Emma Lutjen Leave a Comment

NI announces validation by the FiRa Consortium of its UWB PHY test solution. Device manufacturers can now use NI’s solution and chip designers to test the conformance of their ultra-wideband (UWB) automatically enabled products against version 1.3 of FiRa’s PHY specifications. UWB is useful for devices requiring low power, operating over a short range that can coexist with […]

Filed Under: Featured, Test and Measurement News Tagged With: FiRa, MaxEye, NI

Software bundle helps engineers optimize test systems

March 8, 2022 By Lee Teschler Leave a Comment

NI

The Test Workflow subscription bundle for automating test systems expands engineers’ access to the software needed to design and automate a test or measurement system through a single software license. With engineers firmly planted at the center of digital transformation, they need to build better, higher performing products faster than ever before. To help them […]

Filed Under: Test and Measurement News Tagged With: NI

Digi-Key Electronics to distribute NI test and measurement products

September 17, 2020 By Lee Teschler Leave a Comment

NI USB DAQ

Digi-Key Electronics now handles certain NI software-connected test and measurement products. This initiative greatly expands Digi-Key’s overall offerings in automated test. Companies continue to face the challenge of getting quality products to market with shorter timelines. Engineers using Digi-Key’s global distribution channel and next day shipping will now have quick access to tools they can […]

Filed Under: Test and Measurement News Tagged With: Digi-Key, NI

Software handles test operations, data management at the enterprise level

August 13, 2020 By Lee Teschler Leave a Comment

NI systemlink

The enterprise version of NI SystemLink software standardizes the way data is shared and analyzed to enable increased visibility and control of test systems across an entire organization. In this way, SystemLink software serves as an important bridge between engineering and manufacturing departments in their efforts to improve overall operational efficiencies and drive digital transformation […]

Filed Under: Test and Measurement News Tagged With: NI

High-rez digitizers, co-processors come in PXI format

October 27, 2017 By Test and Measurement Editor Leave a Comment

NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced today a new PXI FlexRIO architecture that integrates mezzanine I/O modules with Xilinx Kintex UltraScale FPGAs. The first wave of products based on this new architecture includes two high-resolution PXI FlexRIO Digitizers, three dedicated PXI FlexRIO […]

Filed Under: data acquisition Tagged With: NI

Vector Signal Transceiver sports 1 GHz bandwidth, LabView-programmable FPGA

August 3, 2016 By WTWH Editor Leave a Comment

NI-vector-signal-transceiverTH

NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges announced a second-generation vector signal transceiver (VST). The NI PXIe-5840 module is the world’s first 1 GHz bandwidth VST and is designed to solve the most challenging RF design and test applications. “NI redefined instrumentation […]

Filed Under: Test Equipment Tagged With: nationalinstruments, NI

DAQ Series: Podcast: miniSystems for Engineering Excellence

February 25, 2013 By Test and Measurement Editor 2 Comments

In this DAQ Series, we discuss how DAQs are scaled down for educational purposes. National Instruments is dedicated to teaching engineering fundamentals beyond theory and mathematical applications. Its target is to teach students engineering concepts as a whole. The idea of teaching students hands-on, visual applications came from the suggestions of professors and teachers at […]

Filed Under: data acquisition, Editor's Blog, Featured, Test Equipment Tagged With: National Instruments, NI, podcast

Primary Sidebar

Featured Contributions

Why engineers need IC ESD and TLP data

Verify, test, and troubleshoot 5G Wi-Fi FWA gateways

How to build and manage a top-notch test team

How to use remote sensing for DC programmable power supplies

The factors of accurate measurements

More Featured Contributions

EE TECH TOOLBOX

“ee
Tech Toolbox: Power Efficiency
Discover proven strategies for power conversion, wide bandgap devices, and motor control — balancing performance, cost, and sustainability across industrial, automotive, and IoT systems.

EE TRAINING CENTER

EE Learning Center
“test
EXPAND YOUR KNOWLEDGE AND STAY CONNECTED
Get the latest info on technologies, tools and strategies for EE professionals.
bills blog

RSS Current Electro-Tech-Online.com Discussions

  • KiCad custom symbol definition correct approach
  • Measuring controller current output with a meter
  • restarting this Christmas project
  • Anyone In The US Ordered From AliExpress Recently?
  • My Advanced Realistic Humanoid Robots Project

Footer

EE World Online Network

  • 5G Technology World
  • EE World Online
  • Engineers Garage
  • Analog IC Tips
  • Battery Power Tips
  • Connector Tips
  • EDA Board Forums
  • Electro Tech Online Forums
  • EV Engineering
  • Microcontroller Tips
  • Power Electronic Tips
  • Sensor Tips

Test & Measurement Tips

  • Subscribe to our newsletter
  • Advertise with us
  • Contact us
  • About us

Copyright © 2025 · WTWH Media LLC and its licensors. All rights reserved.
The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media.

Privacy Policy