A vector network analyzer can fully characterize components by deriving their scattering parameters. In earlier parts of this series, we looked at analog spectrum analyzers (part 1 and part 2) and vector signal analyzers (part 3), both of which monitor unknown signals, whether emanating from a system, device under test (DUT), or an enemy’s transmitter […]
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How to separate differential and common-mode harmonic noise currents
Differential-mode and common-mode currents can cause your product to produce radiated and conducted emissions. These three techniques can help you measure them.
How to locate EMI emissions with near-field probes: Part 3
Part 3 of a series on using near-field probes for detecting EMI sources shows you how to set up a spectrum analyzer and how to detect emissions problems. Now that we’ve discussed the theory of measuring near-field emissions (Part 1) and how to use near-field probes (Part 2) to make the measurements let’s discuss how to […]
IMS 2023 roundup: test equipment
Test equipment plays a major role in product development and production, which was apparent at IMS 2023. In the photos and videos below, you’ll get a taste of test developments at RF, mmWave, and sub-THz frequencies. This year, D-band (110 GHz to 170 GHz) seized a larger portion of the exhibit hall than in past […]
Handheld two-channel 100/200-MHz scopes combine multimeter, recorder, trend plot functions
The new and improved Siglent SHS-X Handheld Two-channel Digital Oscilloscopes are available in 100 MHz and 200 MHz analog bandwidths and isolated or non-isolated versions, with 1 GSa/sec sample rate and 12 Mpts memory depth. The SHS800X versions have two non-isolated scope channels and one isolated multimeter channel, while the SHS1000X models feature full isolation: […]
