Oscilloscope manufacturer Tektronix (www.tek.com) has unveiled a series of extensions and enhancements to its SFF 8431 SFP+ debug and compliance offering, including the latest support for the Transmitter Waveform Distortion Penalty for Copper (TWDPc) measurement that can only be performed on fast sampling rates oscilloscope, such as the Tektronix DPO/DSA/MSO70000D Series.
The enhancements offer the most complete debug and automation solution for Ethernet-based SFF-8431 SFP+ PHY layer testing. The solution also includes a SFP-WDP option that allows automated execution and setup of significant TWDPc measurements, together with a new Module Compliance (MCB) and Host Compliance Boards (HCB), which speed test setup of connector designs utilized in high speed Ethernet as well as Fiber Channel-based systems.
“Our emphasis for SFF 8431 SFP+ testing has been to build upon a comprehensive test solution for Ethernet designers that save them time while providing the deep, accurate insight needed for validation and debug requirements,” remarked Roy Siegel, General Manager, Oscilloscopes, Tektronix.
“For example, we enhance WDP test support by automating the complex compliance test sequence to improve test time and provide extremely reliable results with the 100 GS/second DPO70000 Oscilloscope.”
The new SFP-TX comes with an integrated de-embedding feature. As SFP+ technology increases data rates, the eye closes and several components such as SMA cables have to de-embedded for optimized test results. Using .FLT files, designers can easily de-embed signals.
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