• Skip to primary navigation
  • Skip to main content
  • Skip to primary sidebar
  • Skip to footer
  • Advertise
  • Subscribe

Test & Measurement Tips

Oscilloscopes, electronics engineering industry news, how-to EE articles and electronics resources

  • Oscilloscopes
    • Analog Oscilloscope
    • Digital Oscilloscope
    • Handheld Oscilloscope
    • Mixed-signal Oscilloscope
    • PC-based Oscilloscopes – PCO
  • Design
  • Calibration
  • Meters & Testers
  • Test Equipment
  • Learn
    • eBooks/Tech Tips
    • FAQs
    • EE Training Days
    • Learning Center
    • Tech Toolboxes
    • Webinars & Digital Events
  • Video
    • EE Videos
    • Teardown Videos
  • Resources
    • Design Guide Library
    • Digital Issues
    • Engineering Diversity & Inclusion
    • Leap Awards
    • White Papers
  • Subscribe
You are here: Home / FAQ / The difference between signal under-sampling, aliasing, and folding

The difference between signal under-sampling, aliasing, and folding

April 15, 2022 By David Herres Leave a Comment

Most engineers today are sensitive to problems that arise when digital measurement instruments try to capture signals containing frequencies that are too high for the sampling circuitry to handle. Nevertheless, there are terms associated with sampling problems that sometimes get confused. Probably the three concepts most likely to cause issues are under-sampling, aliasing, and folding.

To sort out the definitions, we start with a quick review of Nyquist’s theorem, now usually expressed as the Nyquist-Shannon Sampling Theorem. Shannon’s version came much later than Nyquist’s original specification. It states that if a signal X(t) contains no frequencies higher than B hertz, it is completely determined by giving its ordinates at a series of points spaced 1/2B seconds apart. A sufficient sample rate is therefore anything faster than 2B samples/sec. Equivalently, for a given sample rate fs, perfect reconstruction is guaranteed possible for a band-limit B below fs/2. The threshold 2B is the Nyquist rate.

folding and aliasingWhenever the sampling rate is below the Nyquist rate, the signal of interest is said to be undersampled. Aliasing results when undersampling takes place. Specifically, aliasing arises when two signals override each other and become indistinguishable, a reason why they’re called ‘aliases’ of each other. In the case of undersampling, the signal reconstructed from the samples coincides with the original signal only at the sampled points. The resulting signal reconstruction is said to be a low-frequency alias of the original because it has a frequency lower than that of the original.

An interesting case arises when the sampling frequency exactly coincides with the frequency of the sampled waveform. Here, the reconstructed waveform will have the same frequency as the original but with a smaller amplitude. The reason is that the original waveform is sampled at precisely the same point in each cycle. If that sampled point happens to lie below the peak amplitude, the reconstructed waveform takes on the amplitude of the sample.

foldingThe Nyquist frequency is also called the folding frequency. The term arises because reconstructed aliased frequencies are said to “fold” around half the sampling frequency. Folding typically arises in displaying signals on spectrum analyzers. It is common for acquired signals to have a fundamental frequency less than half the sample rate, but their harmonics may exceed half the sample rate. Consequently, they will alias. The aliased frequencies show up on the FFT display as frequencies that are said to fold back into the display.

Tektronix put out a YouTube video about detecting aliased signal displays. The advice in the video works as long as the signal under test doesn’t have frequency components exceeding the oscilloscope bandwidth.

A few tricks can help identify aliases on instrument displays. In the case of spectrum analyzer displays, aliased signals often arise from high-frequency components created by fast-rising edges in the waveform that create many high-frequency harmonics. These harmonics typically drop in amplitude as their frequency rises. So it is wise to be on the lookout for displayed frequency components that exhibit the tell-tale signs of diminishing high-frequency components that have folded around the analyzer sampling frequency.

Of course, an obvious way to identify aliases is to boost the sample rate. This causes the aliased signals to unfold. And if you are lucky enough to have the capability of increasing the input signal’s frequency (as when it’s coming from a signal generator), you have another approach available. As you boost the input frequency, the non-aliased harmonics will move toward the right-hand side of the screen. But the aliased harmonics will move toward the left. When they reach the edge, they will reflect back into the display and begin moving toward the right again.

There are fewer options for detecting aliased signals on oscilloscope displays. The main approach is to change the time/division, peak detect, and record-length settings and watch for changes in the oscilloscope display.

You may also like:

  • music on scopes
    Making pictures from sound on an oscilloscope
  • music synthesizer
    Music synthesis and arbitrary waveform generators
  • Havana syndrome
    Microwaves and the Havana Syndrome
  • 5G
    Will 5G be lethal?
  • rental instruments
    The modern economics of renting test instruments
  • no you can't detect ghosts with a gauss meter
    No, you can’t detect ghosts with a gauss meter

Filed Under: data acquisition, FAQ, Featured, New Articles, Oscilloscopes Tagged With: FAQ, Tektronix

Reader Interactions

Leave a Reply Cancel reply

You must be logged in to post a comment.

Primary Sidebar

Featured Contributions

Why engineers need IC ESD and TLP data

Verify, test, and troubleshoot 5G Wi-Fi FWA gateways

How to build and manage a top-notch test team

How to use remote sensing for DC programmable power supplies

The factors of accurate measurements

More Featured Contributions

EE TECH TOOLBOX

“ee
Tech Toolbox: Connectivity
AI and high-performance computing demand interconnects that can handle massive data throughput without bottlenecks. This Tech Toolbox explores the connector technologies enabling ML systems, from high-speed board-to-board and PCIe interfaces to in-package optical interconnects and twin-axial assemblies.

EE TRAINING CENTER

EE Learning Center
“test
EXPAND YOUR KNOWLEDGE AND STAY CONNECTED
Get the latest info on technologies, tools and strategies for EE professionals.
bills blog

RSS Current Electro-Tech-Online.com Discussions

  • recommendation for a small motor
  • Convenient audio FFT module?
  • factory device from 2017'ish with web ui - too old to function with Microsoft Edge ?
  • Oshonsoft PIC IDE variable watch issue
  • Power supply query

Footer

EE World Online Network

  • 5G Technology World
  • EE World Online
  • Engineers Garage
  • Analog IC Tips
  • Battery Power Tips
  • Connector Tips
  • EDA Board Forums
  • Electro Tech Online Forums
  • EV Engineering
  • Microcontroller Tips
  • Power Electronic Tips
  • Sensor Tips

Test & Measurement Tips

  • Subscribe to our newsletter
  • Advertise with us
  • Contact us
  • About us

Copyright © 2026 · WTWH Media LLC and its licensors. All rights reserved.
The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media.

Privacy Policy