Agilent Technologies Inc. introduced the USB 2.0 signal-quality test option. Design for the InfiniiVision 4000 X-Series oscilloscopes, this option supports low-speed, full-speed and hi-speed USB applications. The USB interface is used extensively for computer applications and for a broad range of embedded connectivity applications.
With the DSOX4USBSQ signal-quality test option on Agilent’s InfiniiVision 4000 X-Series oscilloscopes, engineers can now quickly verify the analog quality of their signals generated by USB hubs, hosts and devices based on USB-IF compliance standards.
With Agilent’s USB 2.0 signal-quality test option, engineers now have a more affordable solution they can use to perform important signal-quality physical-layer tests before running their final product through complete certification testing at a USB-IF workshop.
The USB 2.0 signal-quality test option generates HTML pass/fail reports for eye-diagram mask testing, jitter analysis, end-of-packet bit width, signaling rate, edge monotonicity and rise/fall times—all based on official USB-IF algorithms embedded in the oscilloscope.