The IT2705 mainframe and modules let you configure up to eight channels with modules that provide loads, sources, and SMUs. Test power supplies, batteries, IoT devices, medical devices, and so on. As powering circuits and systems get more … [Read More...] about Modular DC analyzer sources, sinks, and measures
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FROM THE EDITORS
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Aimee Kalnoskas
Emerson adds AI-assisted code generation and workflow support to NI test platform -

Martin Rowe
Design test cables with this free online tool -

Rick Nelson
Defining and measuring strain: part 2 -

Emma Lutjen
Design World presents the 2025 LEAP Awards Winners: Test & Measurement -

Kenneth Wyatt
R&S MXO3 Oscilloscope for EMC measurements: part 2
Today on Test & Measurement Tips
- New AWG mode restarts sequences on trigger
- Emerson adds AI-assisted code generation and workflow support to NI test platform
- Emerson introduces AI capabilities for test automation at NI Connect 2026
- R&S MXO3 Oscilloscope for EMC measurements: part 2
- New LEO signal simulation speeds receiver validation
- Defining and measuring strain: part 2
FAQs

R&S MXO3 Oscilloscope for EMC measurements: part 2
Rohde & Schwarz recently announced their MXO3 1 GHz bandwidth 12-bit oscilloscope [1], and I managed to get one to review. The R&S MXO38 is ideal for EMC troubleshooting and characterizing design issues early. The 1 mV low noise vertical sensitivity, 12-bits, 500 Mpts memory depth, and 21 ns … [Read More...] about R&S MXO3 Oscilloscope for EMC measurements: part 2

Defining and measuring strain: part 2
In part 1 of this series, we looked at the strain gauge, which can be used to quantify how a test specimen deforms as a function of applied stress. We developed a Wheatstone-bridge circuit that makes use of strain-gauge elements in two of the bridge’s legs, as shown in Figure 1, a version of Figure … [Read More...] about Defining and measuring strain: part 2

Defining and measuring strain: part 1
A metallic foil strain gauge can detect how a test specimen responds when subjected to axial stress. In a previous series, we investigated the Wheatstone-bridge circuit topology and described how strain-gauge elements could be used in the bridge legs. Q: At that point, I asked the question, … [Read More...] about Defining and measuring strain: part 1

How physics relates signal integrity, power integrity, and EMC
There came a time when high-speed electronic circuits reached speeds that required engineers to analyze the design for signal integrity (SI), power integrity (PI), and electromagnetic compatibility (EMC). Prior to that time, dedicated experts in separate teams focused primarily on their main … [Read More...] about How physics relates signal integrity, power integrity, and EMC

R&S MXO3 Oscilloscope for EMC measurements: part 1
Rohde & Schwarz recently announced the MXO3, a 1 GHz, 12-bit oscilloscope. The company sent a review unit. In this part, I found that it has some nice features for making EMC measurements, though it could use another. R&S sent me a model MXO38, the eight-channel version with built-in 50 … [Read More...] about R&S MXO3 Oscilloscope for EMC measurements: part 1

Making sense of test circuits with Kirchhoff’s laws: part 4
We can use a Wheatstone bridge voltage measurement to determine an unknown resistance value. In part 3 of this series, we used Kirchhoff’s voltage law to derive the branch currents and node voltages for an unbalanced Wheatstone bridge with five known, fixed resistors (Figure 1). Now, we propose … [Read More...] about Making sense of test circuits with Kirchhoff’s laws: part 4

Making sense of test circuits with Kirchhoff’s laws: part 3
Kirchhoff’s voltage law gives us three equations with three unknowns to solve for loop currents in an unbalanced Wheatstone bridge. We concluded part 2 of this series by starting to write node and loop equations for a five-resistor Wheatstone bridge circuit, to calculate the currents through each … [Read More...] about Making sense of test circuits with Kirchhoff’s laws: part 3

Making sense of test circuits with Kirchhoff’s laws: part 2
In part 1 of this series, we looked at ways to simplify resistor networks by identifying series and parallel combinations of resistors. We closed with a look at a version of the Wheatstone bridge, such as the one in Figure 1. Although it has only five resistors, not one of them is in series or … [Read More...] about Making sense of test circuits with Kirchhoff’s laws: part 2

Noise generator substitutes for tracking generator
When your spectrum analyzer lacks a tracking generator, you can use a low-cost noise generator to characterize RF components. Here's how. Low-cost spectrum analyzers often lack tracking generators, preventing you from having a signal source that tracks the analyzer's frequency sweep. Not having a … [Read More...] about Noise generator substitutes for tracking generator

Making sense of test circuits with Kirchhoff’s laws: part 1
You can avoid solving simultaneous equations in multiple unknowns by identifying series and parallel combinations of resistors. When you buy test instruments, you hope they’ll have the flexibility to provide the necessary stimulus to the device under test (DUT) and acquire and process the … [Read More...] about Making sense of test circuits with Kirchhoff’s laws: part 1
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What is the importance of resolution in an oscilloscope?
When looking at the oscilloscope feature of a multi-instrument device or when comparing two benchtop oscilloscopes, the first specifications that we look at are the bandwidth and sample rate. While these are incredibly important specs, often most design work is done well within the limits of most products and the more critical specification to consider is resolution. Did you know that while most […]






