ZTEC Instruments (www.ztecinstruments.com) has unveiled a series of 300 MHz oscilloscopes that comes in PCI, VXI and PXI form factors — the ZT4210 Series.

These modular oscilloscopes offer the same powerful acquisition, triggering, analysis and math functions that are normally featured in today’s benchtop instruments as well as in other M-Class oscilloscopes from ZTEC. In fact, the series has been specifically developed to replace benchtop oscilloscopes in various ATE, defense and aerospace, and portable test applications.

Offered with four channels (in ZT4212 VXI) and two channels (in ZT4211 PXI, PCI, and VXI), these powerful oscilloscopes also feature up to one GS/s real-time sampling rate and a record length of up to 256 Msamples. Its on-board processing allows the oscilloscopes to calculate more than 40 waveform parameters associated to a waveform’s time, frequency and voltage characteristics. The series also comes with four standard calculation channels for performing advanced and basic math on acquired data. The oscilloscopes’ math functions include subtract, add, integration, multiply, differentiation, histogram, FFT, parameter trending and more.

Accepting a vast array of voltage levels, the ZT4210 oscilloscopes can also handle up to +/-300 V CAT II direct inputs. The oscilloscopes feature input ranges between 1.25 mV/div and 40 V/div (10 vertical divisions), allowing them to cover a wide range of voltage levels without requiring for added signal conditioning (probes, attenuators and others). This is vital in remote and automated test applications where it is hard or impossible to easily add/remove external conditioning. The oscilloscopes also come with complimentary instrument drivers that help users integrate the ZT4210 series easily into embedded test systems and ATE.