An automated USB 3.1 Type-C transmitter test solution for Gen1 and Gen 2 combines full SigTest support with DPOJET debug and analysis tools. Developed by instrument maker Tektronix, the new setup delivers 100% compliance test coverage as well as full support for the new Type-C connector, fixtures and associated channel tests.
The official tool for SuperSpeed USB 3.1 electrical compliance testing, SigTest, 
“With this release of our SuperSpeed USB software, we are making it easy for the ecosystem to get certified with USB-IF for their end devices and products using Tektronix oscilloscopes,” said Brian Reich, general manager, Performance Oscilloscopes, Tektronix. “With the integration of DPOJET we’re giving our customers powerful debugging and analysis tools so they can quickly find the root cause of problems and build better margins into their products.”
Designed for use with Tektronix MSO/DPO/70000DX/SX series oscilloscopes, the Option USBSSP-TX tool offers single-button test automation and saves time by ensuring that test equipment is configured properly. This allows testing to be accurately run by those who may not have an in-depth knowledge of the USB specification. After the tests complete, a detailed pass/fail test report highlights any measurement deviations from compliance and provides data on measurement margin. Unlike alternative solutions, engineers can re-run the measurements in offline mode to analyze and debug.
For deeper analysis, DPOJET offers user-defined control of analysis parameters, speeding up troubleshooting and making design characterization much easier. For example, BER eye contours in the DPOJET plugin can be used for horizontal and vertical decomposition of jitter and noise to help design engineers characterize devices.
The Tektronix Option USBSSP-TX solution for USB 3.1 Gen1 and Gen 2 with support for SigTest 4.0.23 is priced at $18,000 US MSRP.
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