The T3VNA1500 Vector Network Analyzer enhances the existing T3 test equipment portfolio, adding to the affordable selection of test equipment that engineers, developers and schools can use to assemble a well-equipped test bench efficiently, reliably and within budget. “The introduction of the T3VNA1500 Vector Network Analyzer is an exciting development as it expands on the […]
Open-source tool addresses signal integrity problems
An open-source software tool called SignalIntegrity handles signal integrity problems for design and test engineers. More than 1,500 users have downloaded the free Python-based software since it has been made available. The new SignalIntegrity software is now available from Teledyne LeCroy and provides extra analysis capabilities to Teledyne LeCroy’s WavePulser 40iX High-Speed Interconnect Analyzer, a […]
Two/four-channel 100-350 MHz scopes feature 200-Mpt memory, 10-in touch-screen, external mouse/keyboard control, 50-MHz waveform generator
The new Siglent SDS2000X Plus Digital Oscilloscope Series consists of four models: one two-channel 100-MHz bandwidth (software upgradeable to 350 MHz) and three four-channel models (100/200/350 MHz.) The 350-MHz models can be upgraded to 500 MHz on two independent channels. A large 10.1-in capacitive touch-screen supports multi-touch gestures. The oscilloscope range also offers a 10-bit […]
Programmable dc loads feature high-speed pulse and transient loading
The DL Series of Digital, Programmable dc Loads, are designed to support the testing requirements for the latest generation of off-line power supplies, dc-dc converters and LED drivers. The DL Series is also equipped to handle a wide range of battery testing requirements. The devices are offered in three power ratings (125 W, 250 W […]
Ethernet switch passes 1000BASE-T1 compliance tests for automotive apps
Rohde & Schwarz and Marvell were the first companies to successfully execute 1000BASE-T1 compliance tests, for the Marvell’s 88Q2112 Ethernet transceiver, using an R&S RTO oscilloscope. The latest improvements to the R&S RTP oscilloscope family include the 16-GHz acquisition bandwidth required to perform signal integrity tests and debugging for SerDes, LVDS, PCIe Gen 3.0, MIPI […]
Five-year tests help reveal why PV modules poop out
Some PV solar panels degrade long before others, a fact that makes it tough to estimate the economics of a given solar panel installation. But researchers in Germany are shedding light on solar panel degradation through life tests being run on panels using different PV technologies. Tests took place on PV panels sitting on the […]
Branch feeder monitors get digital fault monitoring upgrade
A Digital Fault Recording (DFR) feature is now among the capabilities of the Model BFM-II Second-Generation Branch Feeder Monitor. Designed specifically for electrical distribution substation applications, the DFR functionality provides substation engineers with critical information regarding relay tripping and reclosure operations, power disturbances and other system anomalies. The BFM-ll’s unique design allows it to easily […]
Sampling oscilloscopes get built-in 53-Gbaud clock recovery units
A Clock Recovery Unit (CRU) option is now available for the BERTWave MP2110A scope that supports trigger clock generation from a 53-Gbaud PAM4 optical signal. When combined with existing oscilloscope functionality, the new 53-Gbaud CRU allows the MP2110A to serve as an all-in-one solution that can more cost-effectively and efficiently evaluate various PAM4 optical modules […]
IC testers handle Arm eMRAM compiler IP on Samsung 28-nm FDSOI process technology
A new IC test solution is optimized for the eMRAM (embedded Magnetoresistive Random Access Memory) compiler IP from Arm, built on Samsung Foundry’s 28-nm FDSOI process technology. The new eMRAM test solution is the result of a collaboration between Mentor and Arm. Mentor also has a long track record of working closely with Samsung on […]
High-speed differential probes handle DDR5, LPDDR5 memory signals
The MX0023A InfiniiMax RC is a new high-speed differential probing solution for Double Data Rate 5 (DDR5) and Low Power Double Data Rate 5 (LPDDR5) memory. As data rates of mobile bus systems increase, the edge speed of the signal gets faster, thus requiring higher bandwidth probe solutions. At the same time, many systems deploy […]
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