In measuring or displaying weak signals, noise places the ultimate limit on detectability. It usually appears as a fluctuating horizontal line known as the noise floor in a spectrum analyzer of oscilloscope in FFT or RF mode. In the time domain, it appears as a thickening of the trace and in severe instances, causes a […]
Setting input parameters in the Tektronix MDO3000 oscilloscope
Input parameters in the Tektronix MDO3000 Series Oscilloscope are determined by the user. This is done by pressing one or more of the channel menu buttons, causing the horizontal channel menu to appear. Menu items are: • Scale – Fine, Offset, Position, Probe setup and Deskew • Coupling – ac or dc • Termination – […]
Displaying digital data in the MDO3000 Series oscilloscope
An application module lets the Tektronix MDO3000 Series oscilloscope decode and trigger on any of the principal serial bus types. For a parallel bus, the MDO3MSO option is required. Serial bus types include Audio, CAN, LIN, FlexRay, I2C, SPI, MIL-STD-1553, RS-232, RS-422, RS-485 and UART. Digital data, serial or parallel, can be entered into B1 […]
More MDO3000 Series scope menus and front panel controls
A previous article covered many of the Tektronix MDO3000 Series Oscilloscope menus and front panel controls. Now we bring the survey closer to completion. Rather than memorizing all the details, you can refer to the user manual, connect to the internal or external AFG for sample waveforms, and start pushing buttons. Don’t worry, the oscilloscope […]
Source measurement unit software simulates classic curve tracer functions
Keithley I-V Tracer software brings many of the features loved in classic curve tracers to Keithley SourceMeter Source Measure Units (SMU). Because an SMU can source voltage or current while measuring voltage and current, it has similar hardware qualities to a curve tracer. The new software leverages the touchscreen interface of 2400 Series Graphical SMUs […]
The system of menus in the Tektronix MDO3000 Series oscilloscope
New users are invariably challenged by the large number of front-panel controls and extensive menu trees found on modern scopes. Many menu items have single-word designations, which only begin to describe their extensive functions. In on-screen menus, specific display modes are not always where you expect to find them. Learning the layout of this architecture […]
Displaying waveforms and trace data in the Tektronix MDO3000 Series oscilloscope
When you are trying to get an accurate idea of waveform qualities from a scope display, the display settings are quite important. So it can be helpful to review the setup process in widely used scopes such as a Tektronix MDO3000. Display style and persistence in this instrument can be accessed by pressing the Acquire […]
Basic and advanced modes in the Tektronix AFG31000 Series arbitrary function generator
Early signal generators, dependent upon vacuum-tube technology and subject to failure, were ancestors of today’s far more precise and durable arbitrary function generators. These instruments have advanced modes and functions that figure prominently in research and product development as well as troubleshooting and repair. Here the word “arbitrary” means the instrument is capable of generating […]
Tektronix signal separation software earns 2019 Leap Award
The votes are in. Business-to-Business publisher WTWH Media, LLC, has announced the winners of the second-year Leadership in Engineering Achievement Program (LEAP) Awards, a design engineering product competition honoring the most exciting new products in a host of technology areas: Additive Manufacturing, Advanced Materials, Analog Electronics, Connectivity, Embedded Computing, Fastener Technology, Hydraulics, Industrial Automation, Mechanical, […]
SMU modules handle tests involving low current, high capacitance
Two new source measure unit (SMU) modules for the Keithley 4200A-SCS Parameter Analyzer can perform low-current measurements even in the presence of high load capacitance due to long cables and complex test setups. Among the notable test applications facing this challenge are LCD display manufacturing and nano FET device testing on a chuck. The new […]
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