• Skip to primary navigation
  • Skip to main content
  • Skip to primary sidebar
  • Skip to footer

Test & Measurement Tips

Oscilloscopes, electronics engineering industry news, how-to EE articles and electronics resources

  • Oscilloscopes
    • Analog Oscilloscope
    • Digital Oscilloscope
    • Handheld Oscilloscope
    • Mixed-signal Oscilloscope
    • PC-based Oscilloscopes – PCO
  • Design
  • Calibration
  • Meters & Testers
  • Test Equipment
  • Suppliers
  • Video
  • EE Learning Center
  • FAQs
You are here: Home / Calibration / data acquisition / Source Measure Unit from Agilent Technologies, Inc.

Source Measure Unit from Agilent Technologies, Inc.

September 2, 2009 By Test and Measurement Editor Leave a Comment

SANTA CLARA, CA – Agilent Technologies Inc. introduced a three-channel source
measure unit (SMU) that can simultaneously provide power and perform
measurements in applications such as parametric testing of diodes, LEDs, CMOS
integrated circuits and other semiconductor devices. The U2723A USB modular
SMU`s compact size saves benchtop space, and its improved throughput saves time.
It is the latest addition to Agilent`s family of paperback-sized USB modular
instruments.

Agilent SMU

The compact U2723A, which supplies voltage (± 20 V) and current (120 mA) on all
three channels, can operate in four-quadrant mode and also provides accurate
current measurements down to nanoamp levels. With 15 ms rise time, the SMU
improves throughput, especially during mass testing of semiconductor devices. It
also simplifies automated testing with up to two embedded test scripts per
channel.

The Agilent U2723A can be used as a standalone instrument or as a module plugged
into the compact U2781A USB modular-products chassis. For standalone use, the
U2723A can be connected to a PC via USB, and testing can be performed with the
bundled Agilent Measurement Manager (AMM) software. To simplify integration into
new or existing test systems, AMM includes a code-conversion capability that
translates commands into forms compatible with popular programming languages
such as C#, C++, Agilent VEE and Microsoft® Visual Basic.

Filed Under: data acquisition, Featured, New Articles, PC-based Test Equipment Tagged With: Agilent Technologies

Reader Interactions

Leave a Reply Cancel reply

You must be logged in to post a comment.

Primary Sidebar

Test & Measurement Handbook


Oscilloscopes Finder

Search Millions of Parts from Thousands of Suppliers.

Search Now!
design fast globle

Subscribe to our Newsletter

Subscribe to test and measurement industry news, new oscilloscope product innovations and more.

Subscribe Today

EE TRAINING CENTER CLASSROOMS

EE Classrooms

RSS Current EDABoard.com discussions

  • kt/c noise of sample and hold
  • PS4 chip replacement not going to plan
  • What is the function of the long stub?
  • How to use of GaN Transistor gates instead of IGBT in this circuit ?
  • Help with Verilog replicate operator

RSS Current Electro-Tech-Online.com Discussions

  • Audio equalizer
  • Background of Members Here
  • Adding Current Limit Feature to a Buck Converter
  • Passthrough charging-simple but impossible to achieve?
  • Opamp ciruit

Footer

EE World Online Network

  • DesignFast
  • EE World Online
  • EDABoard
  • Electro-Tech Online
  • Analog IC Tips
  • Microcontroller Tips
  • Power Electronic Tips
  • Sensor Tips
  • Connector Tips
  • Wire and Cable Tips
  • 5G Technology World

Test & Measurement Tips

  • Subscribe to our newsletter
  • Advertise with us
  • Contact us
  • About us
Follow us on TwitterAdd us on FacebookFollow us on YouTube Follow us on Instagram

Copyright © 2022 · WTWH Media LLC and its licensors. All rights reserved.
The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media.

Privacy Policy