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Featured

Teardown: HP 8112A pulse generator

May 13, 2025 By Martin Rowe 1 Comment

This 50 MHz pulse generator was built as solid as a rock. It’s almost all metal. We take the unit completely apart and look at it from a system and board level. On a visit to the MIT swapfest in 2024, I came across an HP 8112A 50 MHz pulse generator. For $20, I brought […]

Filed Under: Bench Test, Featured, Instrumentation, New Articles, signal generator, signal generators, Video Tagged With: analogdevices, Hewlett-Packard, keysighttechnologies, NXP Semiconductors, texasinstruments

Understanding ADC specs and architectures: part 2

May 7, 2025 By Rick Nelson Leave a Comment

Specifications such as gain error, offset error, and differential nonlinearity help define an analog-to-digital converter’s performance. In part 1 of this series, we discussed an ideal analog-to-digital converter (ADC), noting that it would have infinite resolution and bandwidth. Then we looked at the real world of practical inverters and how their resolution, expressed in a […]

Filed Under: FAQ, Featured Tagged With: FAQ

Understanding ADC specs and architectures: part 1

April 30, 2025 By Rick Nelson Leave a Comment

Analog-to-digital converters are the heart of most test equipment, setting the stage for the digital processing of analog signals. Several posts over the past year or so have involved digital signal processing. For example, we have covered the fast Fourier transform (FFT), the inverse FFT, and discrete convolution. To perform these operations on real-world signals, […]

Filed Under: FAQ, Featured Tagged With: FAQ

OFC 2025: Test equipment

April 21, 2025 By Martin Rowe Leave a Comment

This year’s OFC in San Francisco featured one thing, or so it seemed: 1.6T. Every company making optical modules was showing them lest they be left behind in the always accelerating data rate race. As with any emerging technology, test equipment must lead the way. After all, how do you know if anything works unless […]

Filed Under: Communication Test, Featured, Optical, vector network analyzers, Video Tagged With: anritsu, bristolinstruments, EXFO Electro-Optical Engineering Inc., keysighttechnologies, spirentcommunications, viavisolutions

Phone chargers produce EMI: We compared four

April 15, 2025 By Martin Rowe Leave a Comment

Four chargers USB

The switching power supplies that regulate output voltage produce radiated emissions. Our tests compare waveforms that give clues as to how the chargers operate.

Filed Under: EMI/EMC/RFI, FAQ, Featured, oscilloscope measurements, Power supplies Tagged With: Anker, Apple, JBL, UNI-Trend

Characterize EMI from dc-dc converter ringing

April 7, 2025 By Kenneth Wyatt Leave a Comment

Switching power supplies produce radiated and conducted emissions caused by ringing. Oscilloscope and spectrum-analyzer measurements let you see them. DC-DC converters are ubiquitous in most electronic products. While more efficient than linear regulators, they can also produce considerable amounts of interference that can affect nearby circuits. The measurements in this article show how ringing occurs […]

Filed Under: Analyzer, EV Engineering, FAQ, Featured, oscilloscope measurements, spectrum analyzer Tagged With: micsig, siglenttechnologies, TekboxDigitalSolutions

Review: Micsig TO3004 tablet oscilloscope

March 26, 2025 By Kenneth Wyatt Leave a Comment

If you’re looking for a portable oscilloscope for field troubleshooting or for demonstrations, look at the Micsig TO series. Here’s my take on the four-channel 300 MHz variant, TO3004. The Micsig TO3004 oscilloscope (Figure 1) is an 8-bit, four-channel, tablet-sized portable oscilloscope that’s also available with 100 MHz and 200 MHz varieties with two or […]

Filed Under: Digital Oscilloscope, Digital Storage Oscilloscope, FAQ, Featured, Oscilloscopes, scope probes and accessories Tagged With: FAQ, micsig, Saelig

APEC 2025 test equipment: power sources and loads

March 26, 2025 By Martin Rowe Leave a Comment

DAQ3120

Powering electronic devices requires the testing of power supply and charging circuits, battery management systems (BMSs), and battery cells. Many of these circuits require voltage, current, and power measurements, plus numerous others. Oscilloscopes and probes let you see the waveforms in power-delivery circuits, but the circuits themselves may need simulated batteries and simulated loads. That’s […]

Filed Under: data acquisition, Electronic loads, Featured, instrumentation power supplies, New Articles, Power supplies, Video Tagged With: ametekprogrammablepower, b&kprecision, chromaate, Hioki, ITECHElectronic, Picotest

APEC 2025 test equipment: oscilloscopes and probes

March 24, 2025 By Martin Rowe Leave a Comment

oscilloscope and probes in power electronics

Oscilloscopes and probes play a vital role for engineers designing and testing power electronics. Delivering electrical power to analog and digital circuits and systems is more than just DC measurements. That’s because nearly all power-converter circuits use switching techniques to maximize efficiency. Silicon carbide (SiC and gallium nitride (GaN) transistors, with their higher voltage and […]

Filed Under: Digital Oscilloscope, EMI/EMC/RFI, Featured, Meters & Testers, Power supplies, Video Tagged With: cleverscope, keysighttechnologies, rohdeschwarz, Tektronix, teledynelecroy, Yokogawa

How to use convolution to implement filters: part 4

March 19, 2025 By Rick Nelson Leave a Comment

A windowed sinc function can implement a low-pass filter, and a two-dimensional convolutional filter can blur or sharpen images. In part 3 of this series, we introduced a low-pass filter based on the Sinc function and described the need for windowing to compensate for sampling and truncation. Q: How can we apply this filter? A: […]

Filed Under: FAQ, Featured Tagged With: FAQ

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