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Featured

Defining and measuring strain: part 2

April 15, 2026 By Rick Nelson Leave a Comment

In part 1 of this series, we looked at the strain gauge, which can be used to quantify how a test specimen deforms as a function of applied stress. We developed a Wheatstone-bridge circuit that makes use of strain-gauge elements in two of the bridge’s legs, as shown in Figure 1, a version of Figure […]

Filed Under: FAQ, Featured Tagged With: FAQ, strain, strain-gauge

Editorial Webinar April 16: Beyond bandwidth: how engineers should really choose an oscilloscope

April 10, 2026 By Aimee Kalnoskas Leave a Comment

Bandwidth is usually the first number engineers look at when evaluating an oscilloscope. It shouldn’t be the last. Today’s designs are more complex than ever. Signal frequencies are climbing, package sizes are shrinking, and the range of bus types and standards that engineers need to support continues to expand. A scope that checks the bandwidth […]

Filed Under: Featured, oscilloscope measurements, Oscilloscopes, Webinars Tagged With: oscilloscopes, webinar

Defining and measuring strain: part 1

April 8, 2026 By Rick Nelson Leave a Comment

A metallic foil strain gauge can detect how a test specimen responds when subjected to axial stress. In a previous series, we investigated the Wheatstone-bridge circuit topology and described how strain-gauge elements could be used in the bridge legs. Q: At that point, I asked the question, what is strain, and what are its units? […]

Filed Under: FAQ, Featured Tagged With: FAQ, strain, strain-gauge

How physics relates signal integrity, power integrity, and EMC

March 25, 2026 By Istvan Novak, Samtec Leave a Comment

impedance plot

There came a time when high-speed electronic circuits reached speeds that required engineers to analyze the design for signal integrity (SI), power integrity (PI), and electromagnetic compatibility (EMC). Prior to that time, dedicated experts in separate teams focused primarily on their main specialty. The result: lengthy product review cycles when subsequent teams from these disciplines […]

Filed Under: EMI/EMC/RFI, FAQ, Featured, Featured Contributions, Power supplies Tagged With: EMC, powerintegrity, samtec, signal integrity, signalintegrity

R&S MXO3 Oscilloscope for EMC measurements: part 1

March 18, 2026 By Kenneth Wyatt Leave a Comment

Rohde & Schwarz recently announced the MXO3, a 1 GHz, 12-bit oscilloscope. The company sent a review unit. In this part, I found that it has some nice features for making EMC measurements, though it could use another. R&S sent me a model MXO38, the eight-channel version with built-in 50 MHz single-channel AWG and two […]

Filed Under: Digital Oscilloscope, EMI/EMC/RFI, FAQ, Featured, Mixed-signal Oscilloscope Tagged With: digital oscilloscope, EMC, EMC measurements, rohdeschwarz

Making sense of test circuits with Kirchhoff’s laws: part 4

March 11, 2026 By Rick Nelson Leave a Comment

We can use a Wheatstone bridge voltage measurement to determine an unknown resistance value. In part 3 of this series, we used Kirchhoff’s voltage law to derive the branch currents and node voltages for an unbalanced Wheatstone bridge with five known, fixed resistors (Figure 1). Now, we propose to replace R5 with a digital multimeter […]

Filed Under: Bench Test, FAQ, Featured, Meters & Testers Tagged With: digital multimeter, FAQ, Kirchhoff’s laws

Making sense of test circuits with Kirchhoff’s laws: part 3

March 4, 2026 By Rick Nelson Leave a Comment

Kirchhoff’s voltage law gives us three equations with three unknowns to solve for loop currents in an unbalanced Wheatstone bridge.

Filed Under: Bench Test, FAQ, Featured, Meters & Testers Tagged With: current, resistors, voltage

Making sense of test circuits with Kirchhoff’s laws: part 2

February 18, 2026 By Rick Nelson Leave a Comment

In part 1 of this series, we looked at ways to simplify resistor networks by identifying series and parallel combinations of resistors. We closed with a look at a version of the Wheatstone bridge, such as the one in Figure 1. Although it has only five resistors, not one of them is in series or […]

Filed Under: Bench Test, FAQ, Featured, Instrumentation, Meters & Testers, New Articles, Sensing, Temperature Measurement, Test Equipment

Noise generator substitutes for tracking generator

February 9, 2026 By Kenneth Wyatt Leave a Comment

When your spectrum analyzer lacks a tracking generator, you can use a low-cost noise generator to characterize RF components. Here’s how. Low-cost spectrum analyzers often lack tracking generators, preventing you from having a signal source that tracks the analyzer’s frequency sweep. Not having a tracking generator can make some measurements difficult. You can, however, use […]

Filed Under: Analyzer, EMI/EMC/RFI, FAQ, Featured, Oscilloscopes, spectrum analyzer, vector network analyzer Tagged With: FAQ, noise generator, rohdeschwarz, siglenttechnologies, tracking generator

Making sense of test circuits with Kirchhoff’s laws: part 1

February 4, 2026 By Rick Nelson Leave a Comment

You can avoid solving simultaneous equations in multiple unknowns by identifying series and parallel combinations of resistors. When you buy test instruments, you hope they’ll have the flexibility to provide the necessary stimulus to the device under test (DUT) and acquire and process the response. Occasionally, however, you’ll need to design an external network to […]

Filed Under: FAQ, Featured Tagged With: FAQ, Kirchhoff’s laws, resistors, test circuits

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