Test system components and rack assemblies speed ATE integration

New ATE Core Configurations deliver core mechanical, power and safety infrastructure to help users accelerate the design and build of automated test systems in industries ranging from semiconductor and consumer electronics to aerospace and automotive.

Developed by National Instruments Corp., ATE Core Configurations help simplify the design, procurement, assembly, and deployment of smarter test systems at a lower cost and shorter time to market by empowering test organizations with a platform for standardization. The Configurations are designed to let users obtain both instrumentation and enclosure mechanical hardware from NI using one purchase order.

These 19-in., rack-based configurations are available in various rack-unit heights and offer scalable power profiles to match applications and geographies. Test organizations can benefit from highly integrated safety features such as thermal shutoff, emergency power off (EPO), optional uninterruptible power supplies and IEC 61010 certification.

Key benefits include:

• Highly customizable – Choose what is included in the system, and where within the rack, including PXI instrumentation, signal conditioning, kW power supplies, cooling and more
• Streamlined procurement – Simplify bill of materials management with consolidated part numbers and fewer vendor transactions
• Readily deployable – Benefit from IEC 61010 certified systems which are backed by more than 1,500 NI sales, system and support engineers worldwide
• Expansive ecosystem – Work directly with NI Alliance Partners to specify a turn-key system, including mass interconnect and fixturing, test software development, system maintenance, lifecycle support and more

ATE Core Configurations also benefit from NI’s high-performance PXI instrumentation and extensive test software portfolio. This includes more than 600 PXI instruments ranging from DC to mmWave featuring high-throughput data movement using PCI Express Gen 3 bus interfaces and sub-nanosecond synchronization with integrated timing and triggering. ATE Core Configurations can also include TestStand test management software and LabVIEW code module development software, extensive API and example program support for PXI instruments, and more than 13,000 instrument drivers for third-party box instruments.

To design and deploy a smarter test system based on NI’s new ATE Core Configurations, visit www.ni.com/ate-core-configurations.