Here are the most popular threads on EDAboard this week pertaining to test and measurement topics: Measuring an RF transceiver: I have a low-noise mixer IF amplifier and IF filter on the PCB. I want to measure signal power, return loss, insertion loss on the PCB. What is the best solution for this? Should I […]
Video: Tektronix MDO 3104 Oscilloscope Demo Board Introduction
Powering up the Tektronix MDO 3104 Oscilloscope demo board and acquiring signals from it.
Video: Tektronix MDO 3104 Oscilloscope Arbitrary Function Generator
How to record a waveform from an outside source.
Top test & measurement posts on EDAboard this week
Here are some of the most viewed posts on test and measurement topics from our EDAboard.com sister site this week: Measuring capacitance: “I am going to make a circuit for measuring capacitance….I want to convert a differential capacitance to voltage. I have found many designs which use a timer. Is a timer mandatory? The circuit […]
New DC source targets high-current device testing
A new DC-source benchtop instrument aims to integrate the capabilities of I‑V systems, curve tracers, and semiconductor analyzers as used for characterizing wide bandgap power semiconductors such as SiC and GaN. The Model 2460 SourceMeter Source Measure Unit (SMU) Instrument incorporates a capacitive touchscreen graphical user interface and can source up to 105-V, 7-A DC/7-A […]
Top five T&M threads on EDAboard
Our sister site EDAboard.com hosts technical discussions on a variety of subjects, including test & measurement themes. Here are the top five recent conversations oriented around making measurements. Impedance using Network analyzer and Agilent ADS — “I have a 1 port network. iI connect it to the network analyzer to measure impedance. It gives me a […]
DDR bus simulator generates BER contours
Keysight Technologies, Inc. introduced the DDR Bus Simulator; the industry’s first tool to generate accurate Bit-Error-Rate (BER) contours for the JEDEC DDR memory bus specification. The software product, which is available as a new option for Advanced Design System (ADS) 2014.11 from Keysight EEsof EDA, quickly and accurately calculates DQ and DQS eye probability density […]
Parametric test systems headed for X-FAB
Keithley Instruments, Inc. announced it had received orders for additional S530 Parametric Test Systems from X-FAB Silicon Foundries. X-FAB, a Germany-based foundry for analog/mixed-signal devices and micro electro-mechanical systems (MEMS), ordered low power versions of the S530 tester for installation on the main production line at its facility in Kuching, Malaysia, where high voltage S530 […]
Video: Tektronix MDO 3104 Oscilloscope Overview
A look at the Tektronix MDO 3104 oscilloscope including some of its basic functions.
DDR4 BGA interposers for infiniium series oscilloscopes
Keysight Technologies, Inc. introduced DDR4 ball-grid array (BGA) probe interposer solutions for Infiniium Series oscilloscopes. Engineers can use the probes and oscilloscopes for debugging and characterizing DDR4 memory designs and testing device compliance with the JEDEC DDR4 standard. With the introduction of DDR4 memory technology, dynamic random access memory (DRAM) data rates can now reach […]