Saelig Company, Inc. has introduced LOG Storm 2MS, a new economical high-speed digital data logger for troubleshooting digital system buses.LOG Storm 2MS contains an 8Mbyte/2Msample memory buffer, enabling large bursts of data up to 20bits at 100 MHz to be sampled. A USB connection streams the collected data to an attached PC, enabling gigabytes of […]
Test and Measurement News
Saelig introduces triple output power supply with twelve ranges
Saelig Company, Inc. has announced the availability of Aim-TTi’s MX100T, a 315 watt precision laboratory power supply offering three full performance outputs each with multiple ranges. Unlike other triple output power supplies, all three outputs have a similar power capability and can each provide 0 to 35 volts at 0 to 3 amps. Range switching […]
Keysight Technologies introduces industry’s first 5G exploration library
Keysight Technologies, Inc. today introduced the Keysight EEsof EDA 5G Baseband Exploration Library. Providing ready-to-use reference signal processing intellectual property (IP) for 5G technology research, this industry-first library dramatically increases the productivity for system architects and baseband physical layer (PHY) designers. Keysight’s 5G Baseband Exploration Library supports various 5G candidate waveforms for orthogonal and non-orthogonal […]
R&S ZVAX-TRM extension unit for high-end network analyzers allows full characterization of active components
The new R&S ZVAX-TRM from Rohde & Schwarz will have its debut at this year’s European Microwave Week. It is an extension unit for the high end network analyzers from the Rohde & Schwarz R&S ZVA family. The R&S ZVAX-TRM can be combined with an R&S ZVA to yield a powerful, compact and highly customizable […]
Teledyne LeCroy extends WaveSurfer 3000 Oscilloscope Series with new 750 MHz model
Teledyne LeCroy today introduces the WaveSurfer 3074, extending the bandwidth range of the popular WaveSurfer 3000 series of oscilloscopes to 750 MHz. WaveSurfer 3000 oscilloscopes feature the MAUI advanced user interface, previously available only on higher-end oscilloscopes. This advanced user interface seamlessly integrates a deep measurement toolset and multi-instrument capabilities into a cutting edge user […]
Low cost JEDEC protocol compliance analyzer validation of DDR3 and DDR4 protocol and timing parameters
Teledyne LeCroy, the worldwide leader in high speed I/O analysis and protocol test solutions, today announced its new Kibra 480 Compliance Analyzer. New DDR4 enabled systems are now available in the market. As these DDR4 enabled systems begin to proliferate, compliance testing becomes increasingly important. DDR4 doubles the speed of its predecessor DDR3, making compliance […]
ATS for RF, mixed-signal devices uses PXI-based approach
NI (Nasdaq: NATI) announced the NI Semiconductor Test System (STS) series. These PXI-based automated test systems reduce test cost for RF and mixed-signal devices by opening access to NI- and industry-offered PXI modules in semiconductor production test environments. Compared to conventional semiconductor automated test equipment (ATE), STS lead users are experiencing reduced production costs and […]
Averna and JOT Automation Announce a Technology Partnership
Averna, a developer of test solutions and services for communications and electronics device-makers worldwide, and JOT Automation, a supplier of automated test and production solutions, announced a technology partnership for the Americas. Under the terms of the agreement, Averna will act as a lead distributor and integrator of JOT Automation products for the Americas. The […]
H-P, Agilent, Keysight: New name, same reputation
Those of us who have been around electronic instrumentation for a while can remember the days when Hewlett-Packard instruments were considered the cream of the crop. Where I worked, we always tried to get to the lab early on the days we had tests to run so we could get our hands on the highly […]
MicroSense ships Novel LED Sapphire Wafer Measurement Tools for Process Control
MicroSense, LLC, a developer of non-contact wafer metrology systems, today announced multiple shipments of its new, next-generation automated sapphire wafer metrology tool, the MicroSense UltraMap C200. Designed specifically for high throughput dimensional measurement of sapphire wafers for LED manufacturing, the UltraMap C200 provides throughput of ninety 6″ diameter sapphire wafers per hour with lowest cost […]
