ECT’s SPP-25 probes are designed specifically to support non-destructive electrical contact at various stages of test during the fabrication process of solar photovoltaic (PV) products. ECT’s reliable and effective solution is well suited for high volume production test which is needed as volumes increase due to alternative energies becoming more mainstream. Spring probe technology is […]
Test Equipment
High-speed, 16-channel, PXIe digital stimulus/response module
Keysight Technologies, Inc. has announced an improved, high-speed, 16-channel, PXIe digital stimulus/response (DSR) module with pattern editing development software. The improved DSR synchronizes up to 12 modules or 192 channels, a powerful and unique capability for applications in design validation and production test. The pattern editing development software enables test engineers to quickly create and edit waveform […]
BER contour analysis tool helps perform DDR4, LPDDR4 Jedec compliance measurements
Keysight Technologies, Inc. has introduced a new bit error rate (BER) contour analysis tool that helps memory designers perform DDR4 and LPDDR4 JEDEC compliance measurements. Designers are now able to make data valid window measurement with components of noise and jitter to ensure valid and accurate data transfer. The BER contour analysis tool is a capability […]
VIDEO: Memory Functions in the Fluke 190-502 ScopeMeter
An examination of Memory functions and Recall procedures in the Fluke 190-502 ScopeMeter.
End-To-End HEVC Test Solution Enables Seamless Transition To 4K
Tektronix, has announced the industry’s first end-to-end HEVC test solutions that provide deep insights into 4K workflows and will enable broadcasters, cable operators and other service providers to make a seamless transition to 4K. The new test and diagnostic tools will be demonstrated in Booth #SU5006 at the NAB Show, taking place April 18-21 inLas Vegas. […]
VIDEO: Scope, Meter and Record Functions in the Fluke 190-502 ScopeMeter
An overview of the Fluke 190-502 ScopeMeter, including an examination of Scope, Meter and Record functions.
Keysight to offer trade-in deals for used test equipment
Keysight Technologies, Inc. has announced its new portfolio of technology extension and migration services that focuses on maximizing customers’ test asset value and consequent utilization. Keysight’s Technology Refresh Services program is making it easier to get the latest technologies while utilizing limited funding. Technology advances across all industries are rapidly changing, while budgets are continuing […]
Analysis platform correlates SDI/IP media signals
Tektronix, an industry-leading innovator of video quality monitoring solutions, today unveiled an industry-first hybrid SDI/IP media analysis platform, Prism, that enables a smooth transition from SDI-based to IP-based infrastructure. The new test and diagnostic solution will be demonstrated in Booth #SU5006 at the NAB Show, taking place April 18-21 in Las Vegas. The new Tektronix […]
Test instrument characterizes current
draws down to picoamp range
A new test instrument is said to be the world’s first analyzer able to make 100-pA level dynamic current measurement. Developed by Keysight Technologies, it has a maximum 200 MHz bandwidth, 1 GSa/sec sampling rate and 14- or 16-bit wide dynamic range. The Keysight CX3300 Series Device Current Waveform Analyzer handles the simultaneous measurement of […]
Basics of cloud chambers
A tabletop cloud chamber is a simple home project that can be built, and can detect and display condensation trails that develop in the presence of ionizing radiation. It was invented by Charles Wilson, who perfected a working model in 1911. For many decades it was used by researchers and it played an important role […]